Bayard-Alpert ionization gauge sensitivity for C~7F~1~4 (Englisch)
- Neue Suche nach: Kim, S.-H.
- Neue Suche nach: Heinrich, J.R.
- Neue Suche nach: Miller, M.J.
- Neue Suche nach: Merlino, R.L.
- Neue Suche nach: Kim, S.-H.
- Neue Suche nach: Heinrich, J.R.
- Neue Suche nach: Miller, M.J.
- Neue Suche nach: Merlino, R.L.
In:
JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY A VACUUM SURFACES AND FILMS
;
26
, 5
;
1355-1356
;
2008
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Bayard-Alpert ionization gauge sensitivity for C~7F~1~4
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Beteiligte:Kim, S.-H. ( Autor:in ) / Heinrich, J.R. ( Autor:in ) / Miller, M.J. ( Autor:in ) / Merlino, R.L. ( Autor:in )
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Erschienen in:JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY A VACUUM SURFACES AND FILMS ; 26, 5 ; 1355-1356
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Verlag:
- Neue Suche nach: SLACK INCORPORATED
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Erscheinungsdatum:01.01.2008
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Format / Umfang:2 pages
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ISSN:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 621.55
- Weitere Informationen zu Dewey Decimal Classification
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Klassifikation:
DDC: 621.55 -
Datenquelle:
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