Real-time studies of thin film growth: Measurement and analysis of X-ray growth oscillations beyond the anti-Bragg point (Englisch)
- Neue Suche nach: Kowarik, S.
- Neue Suche nach: Gerlach, A.
- Neue Suche nach: Skoda, M.
- Neue Suche nach: Sellner, S.
- Neue Suche nach: Schreiber, F.
- Neue Suche nach: Kowarik, S.
- Neue Suche nach: Gerlach, A.
- Neue Suche nach: Skoda, M.
- Neue Suche nach: Sellner, S.
- Neue Suche nach: Schreiber, F.
In:
EUROPEAN PHYSICAL JOURNAL SPECIAL TOPICS
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167
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11-18
;
2009
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Real-time studies of thin film growth: Measurement and analysis of X-ray growth oscillations beyond the anti-Bragg point
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Beteiligte:Kowarik, S. ( Autor:in ) / Gerlach, A. ( Autor:in ) / Skoda, M. ( Autor:in ) / Sellner, S. ( Autor:in ) / Schreiber, F. ( Autor:in )
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Erschienen in:EUROPEAN PHYSICAL JOURNAL SPECIAL TOPICS ; 167 ; 11-18
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Verlag:
- Neue Suche nach: SPRINGER
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Erscheinungsdatum:01.01.2009
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Format / Umfang:8 pages
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ISSN:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 530
- Weitere Informationen zu Dewey Decimal Classification
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Klassifikation:
DDC: 530 -
Datenquelle:
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