High-throughput and full automatic DBC-module screening tester for high power IGBT (Englisch)
- Neue Suche nach: Tsukuda, M.
- Neue Suche nach: Tomonaga, H.
- Neue Suche nach: Okoda, S.
- Neue Suche nach: Noda, R.
- Neue Suche nach: Tashiro, K.
- Neue Suche nach: Omura, I.
- Neue Suche nach: Tsukuda, M.
- Neue Suche nach: Tomonaga, H.
- Neue Suche nach: Okoda, S.
- Neue Suche nach: Noda, R.
- Neue Suche nach: Tashiro, K.
- Neue Suche nach: Omura, I.
In:
Microelectronics and reliability
;
55
, 9
;
1363-1368
;
2015
-
ISSN:
- Aufsatz (Zeitschrift) / Print
-
Titel:High-throughput and full automatic DBC-module screening tester for high power IGBT
-
Beteiligte:Tsukuda, M. ( Autor:in ) / Tomonaga, H. ( Autor:in ) / Okoda, S. ( Autor:in ) / Noda, R. ( Autor:in ) / Tashiro, K. ( Autor:in ) / Omura, I. ( Autor:in )
-
Erschienen in:Microelectronics and reliability ; 55, 9 ; 1363-1368
-
Verlag:
- Neue Suche nach: Elsevier Science B.V., Amsterdam.
-
Erscheinungsdatum:01.01.2015
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Format / Umfang:6 pages
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ISSN:
-
Medientyp:Aufsatz (Zeitschrift)
-
Format:Print
-
Sprache:Englisch
- Neue Suche nach: 621.3815
- Weitere Informationen zu Dewey Decimal Classification
-
Klassifikation:
DDC: 621.3815 -
Datenquelle:
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