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Proceedings of the 12th European Congress on Electron Microscopy : held in Brno, Czech Republic, from 9th to 14th July 2000 / ed. by Luděk Frank and Fedor Čiampor ; Vol. 3: Instrumentation and methodology (Englisch)

2000

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Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.

1437
SEM resolution improvement at low voltage with gun monochromator
Barth, J. E. / Nykerk, M. D. / Mook, H. W. / Kruit, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
1439
Construction and characterisation of a TEM specimen holder for in situ application of magnetic in-plane fields
Uhlig, T. / Heumann, M. / Schneider, M. / Hoffmann, H. / Zweck, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
1441
On the enhancement factors for electron field emitters
Edgcombe, C. / Valdre, U. / Czechoslovak Society for Electron Microscopy et al. | 2000
1443
Investigation of an EuS-coated cooled field emitter for application in state on the art electron microscopes
Wittel, H. / Schafer, A. / Hasselbach, F. / Czechoslovak Society for Electron Microscopy et al. | 2000
1445
Test specimens for SEM
Matejka, F. / Ryzi, Z. / Czechoslovak Society for Electron Microscopy et al. | 2000
1447
Field emission SEM with a newly developed FEGUN and a conical strongly excited objective lens
Kazumori, H. / Yamada, A. / Mita, M. / Nokuo, T. / Saito, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
1451
On actual questions in filtering and inelastic interactions
Jouffrey, B. / Schattschneider, P. / Hebert, C. / Nelhiebel, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
1455
Performance of detector elements for electron microscopes
Schauer, P. / Autrata, R. / Czechoslovak Society for Electron Microscopy et al. | 2000
1459
Design of a monochromator for electron sources
Kahl, F. / Rose, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
1461
First development step and test of the SESAM/SATEM
Kujawa, S. / Czechoslovak Society for Electron Microscopy et al. | 2000
1463
Software for the analysis and design of imaging energy filters with homogeneous and inhomogeneous bending magnets
Munro, E. / Rouse, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
1465
Performance data of a new 2048 x 2048 pixel slow-scan CCD camera for TEM
Hiller, S. A. / Kabius, B. / Probst, W. / Troster, H. / Trendelenburg, M. / Crucifix, C. / Trondle, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
1467
Geometric distortion correction for imaging plates using reflected light signal improves gain normalization and DQE
Bele, P. / Ochs, R. / Schroder, R. R. / Czechoslovak Society for Electron Microscopy et al. | 2000
1469
Cryodetectors for high resolution X-Ray spectroscopy
Hohne, J. / Buhler, M. / Hertrich, T. / Hess, U. / Czechoslovak Society for Electron Microscopy et al. | 2000
1471
Scanning electron microscopy of semiconductor multilayers using a converter of backscattered electrons into secondary electrons
Ascarelli, P. / Capelli, E. / Corticelli, F. / Franchi, S. / Merli, P. G. / Migliori, A. / Morandi, V. / Rossi, C. / Salvatori, S. / Valdre, A. et al. | 2000
1473
Simulation of electron trajectories in the 3D field of two coupled hemispherical electrostatic deflectors
Huber, A. / Plies, E. / Czechoslovak Society for Electron Microscopy et al. | 2000
1475
New possibilities of SEBIV mode in SEM
Degel, B. / Kienle, M. / Plies, E. / Rau, E. I. / Zhu, S. / Czechoslovak Society for Electron Microscopy et al. | 2000
1477
Detection of the angular distribution of the signal electrons in VLESEM
Horacek, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
1479
Direct electron exposed silicon detectors in EELS
Orsholm, C. / Scillag, S. / Czechoslovak Society for Electron Microscopy et al. | 2000
1481
Auger microscopy with a parallel acquisition spectrometer
Jacka, M. / Kale, A. / Tyndall, M. / Prutton, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
1483
Elemental mapping using omega filter and imaging plate
Shindo, D. / Ikematsu, Y. / Lee, C.-W. / Murakami, Y. / Sugiyama, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
1485
New frame-transfer wide-angle slow-scan CCD camera allows recording of distortion-free images for digital montages
Hiller, S. A. / Probst, W. / Seybold, V. / Zellmann, E. / Kabius, B. / Trondle, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
1487
Combined TEM and CL of self-assembled CdSe quantum dots
Preis, H. / Muller, P. / Fuchs, K. / Kaiser, S. / Gebhardt, W. / Zweck, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
1491
Recent achievements in multi-keV X-ray microscopy
Susini, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
1495
Amplitude and phase contrast soft X-ray cryo-microscopy of biological samples
Schneider, G. / Czechoslovak Society for Electron Microscopy et al. | 2000
1499
New aspects of coherent hard X-ray imaging
Cloetens, P. / Ludwig, W. / Guigay, J. P. / Schlenker, M. / Baruchel, J. / Van Dyck, D. / Czechoslovak Society for Electron Microscopy et al. | 2000
1503
Synchrotron radiation scanning photoemission microscopy: advances and applications
Barinov, A. / Casalis, L. / Gregoratti, L. / Gunther, S. / Marsi, M. / Kiskinova, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
1507
Quantitative, chemical state mapping of wood composites via scanning X-ray microscopy
Buckley, C. / Phanopoulos, C. / Khaleque, N. / Czechoslovak Society for Electron Microscopy et al. | 2000
1509
Applications of high resolution microcalorimeter type X-Ray spectrometers in material analysis
Hohne, J. / Buhler, M. / Hertrich, T. / Hess, U. / Czechoslovak Society for Electron Microscopy et al. | 2000
1511
One plasma focus device as possible soft X-ray source for microscopy
Antanasijevic, R. / Joksimovic, D. / Vukovic, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
1515
Environmental scanning electron Microscopy - taking SEM into the future
Donald, A. M. / Czechoslovak Society for Electron Microscopy et al. | 2000
1519
Imaging of electronic structure: achievements, competition and challenges
Howie, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
1523
Biomedical EM under change: recent developments and trends
Maunsbach, A. B. / Czechoslovak Society for Electron Microscopy et al. | 2000
1527
EMS in the European framework
Carrascosa, J. L. / Czechoslovak Society for Electron Microscopy et al. | 2000
I1
On the development of electron microscopes in Brno
Delong, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
I7
Electron microscopy at the milleniu
Hawkes, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
I13
Prospects of quantitative high resolution electron microscopy
Van Dyck, D. / Czechoslovak Society for Electron Microscopy et al. | 2000
I19
High-performance electron microscopes of the future
Rose, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
I25
Structural, magnetic and chemical surface electron microscopy with slow electrons
Bauer, E. / Czechoslovak Society for Electron Microscopy et al. | 2000
I33
Membrane protein structure and dynamics observed at high resolution by electron and atomic force crystallography
Engel, A. / Heymann, B. J. / Muller, D. J. / Stahlberg, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
I35
Nanoscale Analysis by Energy Filtering TEM
Mayer, J. / Plitzko, J. M. / Czechoslovak Society for Electron Microscopy et al. | 2000
I43
New experiments in charged particle interferometry and quantum statistics
Hasselbach, F. / Czechoslovak Society for Electron Microscopy et al. | 2000
I47
Off-axis electron holography - the way to use
Lichte, H. / Lehmann, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
I49
Electrons as waves - and what will come next?
Tyc, T. / Lenc, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
I51
An electron antibunching experiment
Kiesel, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
I53
Time-resolved observation in transmission electron microscopy using electron correlation measurement
Osakabe, N. / Czechoslovak Society for Electron Microscopy et al. | 2000
I55
Partial coherence and HREM image simulation
Muller, H. / Schorsch, P. / Rose, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
I57
Assessment of the experimental constraints for phase contrast EM and complex object reconstruction
Majorovits, E. / Nagayama, K. / Schroder, R. R. / Czechoslovak Society for Electron Microscopy et al. | 2000
I59
Correction of the Fresnel diffraction caused by the biprism filament in phase-shifting electron holography
Yamamoto, K. / Tanji, T. / Hirayama, T. / Hibino, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
I61
Complex electron microscopy
Nagayama, K. / Danev, R. / Okawara, H. / Murata, K. / Czechoslovak Society for Electron Microscopy et al. | 2000
I63
Off-axis electron holography of focused ion beam milled transistors
Dunin-Borkowski, R. E. / Newcomb, S. B. / Doyle, D. / Deignan, A. / McCartney, M. R. / Czechoslovak Society for Electron Microscopy et al. | 2000
I65
Miniaturized biprism interferometer for wide separation of the coherent beams
Prochel, H. / Hasselbach, F. / Czechoslovak Society for Electron Microscopy et al. | 2000
I67
Holographic studies of thin manganite films
Lehmann, M. / Walter, T. / Dorr, K. / Czechoslovak Society for Electron Microscopy et al. | 2000
I69
Inelastic electron holography
Lichte, H. / Freitag, B. / Czechoslovak Society for Electron Microscopy et al. | 2000
I71
Comparison of accuracy of electron holography and EELS on thickness measurement of amorphous SiO~2
Lee, C.-W. / Ikematsu, Y. / Shindo, D. / Czechoslovak Society for Electron Microscopy et al. | 2000
I73
Two-dimensional mapping of electrostatic potential in a SiC MESFET using electron holography
Twitchett, A. C. / Lloyd, S. J. / Lehmann, M. / Midgley, P. A. / Czechoslovak Society for Electron Microscopy et al. | 2000
I77
Recent trends in electron optics
Munro, E. / Czechoslovak Society for Electron Microscopy et al. | 2000
I81
SMART electron optics
Preikszas, D. / Hartel, P. / Spehr, R. / Rose, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
I85
Design and manufacturing of magnetic electron optical systems with midsection symmetry
Spehr, R. / Hartel, P. / Muller, H. / Preikszas, D. / Rose, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
I87
Computations of Wien filter properties and aberrations
Lencova, B. / Vlcek, I. / Czechoslovak Society for Electron Microscopy et al. | 2000
I89
High resolution imaging near zero Cs
Chang, L. Y. / Chen, F. R. / Kai, J. J. / Kirkland, A. I. / Czechoslovak Society for Electron Microscopy et al. | 2000
I91
Electron holography in the diffraction plane
Zhou, F. / Plies, E. / Czechoslovak Society for Electron Microscopy et al. | 2000
I93
An active vibration damping system
Beierlein, R. / Hasselbach, F. / Czechoslovak Society for Electron Microscopy et al. | 2000
I95
Quadrupole projector system with variable magnification for energy filtering transmission electron microscopes
Gerheim, V. / Rose, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
I97
Outline of a variable-axis lens with arbitrary shift of the axis in one direction
Schmid, P. / Janzen, R. / Rose, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
I99
Electron ray-tracing for numerical determination of aberrations
Mynar, M. / Vasina, R. / Kolarik, R. / Lencova, B. / Czechoslovak Society for Electron Microscopy et al. | 2000
I101
New CAD program for the design in electron optics
Lencova, B. / Zlamal, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
I103
Perturbation methods in charged particle optics
Radlicka, T. / Czechoslovak Society for Electron Microscopy et al. | 2000
I107
Advances in atomic structure determination using the focal-series reconstruction technique
Thust, A. / Jia, C. L. / Czechoslovak Society for Electron Microscopy et al. | 2000
I111
Progress in structure analysis of crystal defects by quantitative HRTEM
Schweinfest, R. / Ernst, F. / Czechoslovak Society for Electron Microscopy et al. | 2000
I115
Image formation using incoherent scattering in a CTEM
Anstis, G. R. / Czechoslovak Society for Electron Microscopy et al. | 2000
I117
Extension of HRTEM resolution using Gerchberg-Saxton algorithm: application to grain boundary and interface
Chen, F.-R. / Kai, J. J. / Chang, L. / Czechoslovak Society for Electron Microscopy et al. | 2000
I119
Effect of the objective lens on the measurement of rapidly varying displacement fields from HRTEM images
Hytch, M. / Plamann, T. / Czechoslovak Society for Electron Microscopy et al. | 2000
I121
The effect of strain on chemically sensitive imaging with the (002) reflection in sphalerite type crystals
Rosenauer, A. / Van Dyck, D. / Czechoslovak Society for Electron Microscopy et al. | 2000
I123
Parallel realization of the simulated annealing algorithm and its applications to quantitative electron microscopy
Li, S.-Y. / Wu, M.-Y. / Zhu, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
I125
Quantitative measurement of intensity profiles of equal thickness fringes of Si and MgO crystals and estimation of crystal potential
Nishio, K. / Isshiki, T. / Okunishi, E. / Oikawa, T. / Kawasaki, M. / Endoh, H. / Shiojiri, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
I127
A Fourier space approach for calculating the electron optical phase shift of superconducting fluxons
Beleggia, M. / Pozzi, G. / Tonomura, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
I129
Design aspects for an optimum DF STEM probe
Van Aert, S. / Dekker, A. J. d. / Van Dyck, D. / van den Bos, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
I131
A quantitative evaluation of different STEM imaging modes
Dekker, A. J. d. / Van Aert, S. / Van Dyck, D. / van den Bos, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
I133
Accurate measurements of atomic displacements in La~0~.~9Sr~0~.~1MnO~3 thin films grown on a SrTiO~3 substrate
Geuens, P. / Lebedev, O. I. / Van Dyck, D. / Van Tendeloo, G. / Czechoslovak Society for Electron Microscopy et al. | 2000
I135
Direct object data retrieval: an inversion of electron diffraction
Scheerschmidt, K. / Czechoslovak Society for Electron Microscopy et al. | 2000
I137
Influence of experimental parameters on the accuracy of lattice-distortion measurements directly from high-resolution micrographs
Du, K. / Jin-Phillipp, N. Y. / Phillipp, F. / Czechoslovak Society for Electron Microscopy et al. | 2000
I139
EELS thickness-measurement without spectrum acquisition
Tanaka, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
I141
Contrast modulations in HRTEM images caused by crystal tilt
Waitz, T. / Karnthaler, H. P. / Czechoslovak Society for Electron Microscopy et al. | 2000
I145
Towards sub-Angstrom point resolution by correction of spherical aberration
Haider, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
I149
Advances in Cs-corrected STEM
Krivanek, O. L. / Dellby, N. / Lupini, A. R. / Czechoslovak Society for Electron Microscopy et al. | 2000
I151
Correction of chromatic and spherical aberration using a Wien filter
Steffen, T. / Tiemeijer, P. C. / Krijn, M. P. C. M. / Mentink, S. A. M. / Czechoslovak Society for Electron Microscopy et al. | 2000
I153
Performance of the mirror corrector for an ultrahigh-resolution spectromicroscope
Hartel, P. / Preikszas, D. / Spehr, R. / Rose, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
I155
An electrostatic achromat
Henstra, A. / Krijn, M. P. C. M. / Czechoslovak Society for Electron Microscopy et al. | 2000
I157
Electrostatic correction of the chromatic and spherical aberration of charged particle lenses
Weissbaecker, C. / Rose, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
I159
Super resolution imaging of complex metal oxides
Kirkland, A. I. / Sloan, J. / Meyer, R. / Dunin-Borkowski, R. E. / Hutchison, J. L. / Saxton, W. O. / Sayagues, M. J. / Tilley, R. J. D. / Czechoslovak Society for Electron Microscopy et al. | 2000
I161
Validity of spherical aberration free focus condition
Endoh, H. / Hashimoto, H. / Kumao, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
I163
The Triebenberg laboratory - designed for highest resolution electron microscopy and holography
Lichte, H. / Schulze, D. / Lehmann, M. / Just, H. / Erabi, T. / Furst, P. / Gobel, J. / Hasenpusch, A. / Dietz, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
I165
A new method for the determination of the wave aberration function
Meyer, R. R. / Kirkland, A. I. / Saxton, W. O. / Czechoslovak Society for Electron Microscopy et al. | 2000
I169
Aspects of aberration correction in LVSEM
Zach, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
I173
Scanning low and very low energy electron microscopy
Mullerova, I. / Frank, L. / Czechoslovak Society for Electron Microscopy et al. | 2000
I177
New aspects in LEEM and spectroscopic emission microscopy instrumentation
Lilienkamp, G. / Czechoslovak Society for Electron Microscopy et al. | 2000
I181
X-ray photoemission and low energy electron microscope
Kolarik, V. / Vasina, R. / Mynar, M. / Bejdak, T. / Czechoslovak Society for Electron Microscopy et al. | 2000
I183
Low voltage electron microscope II. - Applications
Coufalova, E. / Delong, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
I185
Low energy electron scattering - Monte Carlo simulation
Fitting, H. J. / Kuhr, J. C. / Czechoslovak Society for Electron Microscopy et al. | 2000
I187
In-depth imaging in S.E.M
Lehuede, P. / Appriou-Marciano, J. / Cazaux, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
I189
Double scintillation detector with a conical retarding lens for SEM
Slowko, W. / Drzazga, W. / Czechoslovak Society for Electron Microscopy et al. | 2000
I191
Quantitative topographic contrast in LV SEM
Slowko, W. / Hejna, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
I193
Energy filtering scanning transmission electron microscopy at low voltage with a `simulated' spherical deflection analyzer
Kramer, K. H. / Kohl, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
I195
Low voltage electron microscope III. - Present and future possibilities
Stepan, P. / Delong, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
I197
Low voltage electron microscope I. - Design
Delong, A. / Hladil, K. / Kolarik, V. / Pavelka, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
I199
Dimension measurement in a cathode lens equipped low-energy SEM
Hutar, O. / Oral, M. / Mullerova, I. / Frank, L. / Czechoslovak Society for Electron Microscopy et al. | 2000
I201
Application of low-energy backscattered electron detection in the inspection of semiconductor devices technology
Hutar, O. / Oral, M. / Mullerova, I. / Romanovsky, V. / Czechoslovak Society for Electron Microscopy et al. | 2000
I203
Signal detection near the critical energy of non-charging illumination in a low-energy SEM equipped with a cathode lens
Kanova, J. / Frank, L. / Czechoslovak Society for Electron Microscopy et al. | 2000
I207
Charging mechanisms in S.E.M.: from the secondary yield to the contrast of images?
Cazaux, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
I211
Scanning electron microscopy at low vacuum in specimen chamber
Autrata, R. / Jirak, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
I217
Possibilities of evaluation of the influence of conditions in the specimen chamber on the quality of imaging in environmental SEM
Michlek, M. / Jirak, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
I219
ESEM as a routine tool for failure analysis in industry
van der Wal, D. / Baken, E. / Czechoslovak Society for Electron Microscopy et al. | 2000
I221
ESEM and TEM investigations on experimentally corroded synthetic zirconolite crystals and their replacing secondary phases
Malmstrom, J. / Reusser, E. / Guggenheim, R. / Duggelin, M. / Mathys, D. / Giere, R. / Lumpkin, G. R. / Blackford, M. G. / Czechoslovak Society for Electron Microscopy et al. | 2000
I223
Structure degradation of austenitic stainless steels as effect of corrosion fatigue
Palka, K. / Surowska, B. / Weronski, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
I225
Absorbed electron imaging of non-conductive samples in low-vacuum SEM
Hellum, B. / Reme, P. / Hansen, L. U. / Johnsen, P. O. / Hjelen, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
I227
SEM analysis of corrosion degradation on tinplate substrates
Zumelzu, E. / Vera, A. / Cabezas, C. / Czechoslovak Society for Electron Microscopy et al. | 2000
I229
Charging effects in S.E.M.: role of the working distance
Grillon, F. / Cazaux, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
I231
Studies of biological specimens by environmental scanning electron microscopy
Autrata, R. / Horky, D. / Ilkovics, L. / Prochazka, V. / Skricka, T. / Czechoslovak Society for Electron Microscopy et al. | 2000
I233
Microstructural and compositional changes at high temperature oxidation of stainless steel in steam environment
Khalid, F. A. / Hussain, N. / Qureshi, A. H. / Czechoslovak Society for Electron Microscopy et al. | 2000
I235
Conditions of study of electrode masses structures in environmental scanning electron microscope
Drnovsky, R. / Jirak, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
I237
An anomalous contrast effect in scanning electron microscopy of insulators: the pseudo-mirror effect
Belhaj, M. / Jbara, O. / Odof, S. / Msellak, K. / Cazaux, J. / Rau, E. I. / Andrianov, M. V. / Czechoslovak Society for Electron Microscopy et al. | 2000
I239
Spectral distribution of backscattered electrons of charged insulators
Jbara, O. / Belhaj, M. / Odof, S. / Rau, E. I. / Andrianov, M. V. / Czechoslovak Society for Electron Microscopy et al. | 2000
I241
Combined scintillation and ionisation detectors for environmental scanning electron microscopes
Romanovsky, V. / Autrata, R. / Czechoslovak Society for Electron Microscopy et al. | 2000
I243
Imaging of semiconductor structures in environmental SEM
Romanovsky, V. / Hutar, O. / Czechoslovak Society for Electron Microscopy et al. | 2000
I245
Effect of the electron beam accelerating voltage and of specimen coating on the image in the microscope operating at higher pressures
Autrata, R. / Jirak, J. / Spinka, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
I249
Near field optical microscopy: theory and applications
Tomanek, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
I255
Spectroscopy on semiconductor surfaces using photoassisted scanning tunneling microscopy and Kelvin probe force microscopy
Lux-Steiner, M. C. / Sommerhalter, C. / Matthes, T. W. / Boneberg, J. / Leiderer, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
I259
Electrochemical applications of SPM
Janda, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
I263
An in situ STM for applications in catalysis
Aires, F. J. C. S. / Deranlot, C. / Czechoslovak Society for Electron Microscopy et al. | 2000
I265
Direct imaging of AFM force interactions using TEM
Erts, D. / Olin, H. / Olsson, L. / Ryen, L. / Tholen, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
I267
Force microscopy experiments in ultrahigh vacuum
Meyer, E. / Guggisberg, M. / Bennewitz, R. / Loppacher, C. / Barwich, V. / Pfeiffer, O. / Schar, S. / Baratoff, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
I269
AFM in the study of primary neurons isolated from rabbit olfactory mucosa
Menevse, A. / Sahin, F. I. / Ergun, M. A. / Tan, E. / Czechoslovak Society for Electron Microscopy et al. | 2000
I271
Electron transport in point contacts studied by TEM-STM
Erts, D. / Lohmus, A. / Lohmus, R. / Olin, H. / Olsson, E. / Ryen, L. / Tholen, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
I275
X-ray microanalysis at low kV
Wendt, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
I279
Standardless microanalysis
Wernisch, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
I283
Automated analysis of submicron particles in SEM?
Poelt, P. / Schmied, M. / Brunner, T. / Czechoslovak Society for Electron Microscopy et al. | 2000
I285
Correction of peak overlap in EDX-maps by digital image processing
von Bradke, M. / Ruckdaeschel, R. / Czechoslovak Society for Electron Microscopy et al. | 2000
I287
Standards for analysis of submicron particles by SEM / EDXS
Schmied, M. / Poelt, P. / Dahl, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
I289
Combined autoradiography and electron microscopy analysis for granulometric measurements of actinide oxide aerosols
Le Naour, H. / Fritsch, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
I291
Quantitative electron microprobe analyses of subsurface micro-inclusions in diamonds
Gutkin, V. / Izraeli, E. / Navon, O. / Czechoslovak Society for Electron Microscopy et al. | 2000
I293
The use of energy dispersive X-ray microanalysis (EDX) in pollution impact studies
Gregory, M. A. / McClurg, T. P. / Connell, A. D. / Moodley, V. E. / Czechoslovak Society for Electron Microscopy et al. | 2000
I295
Characterisation of industrial TiO~2 pigments with low voltage FE-SEM/EDX and FE-TEM/STEM/EDX methods
Tapper, U. / Kauppinen, E. I. / Jalava, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
I299
Understanding EELS and its applications to metallic alloys and semiconductors
Humphreys, C. / Czechoslovak Society for Electron Microscopy et al. | 2000
I303
Energy filtering transmission electron microscopy: fundamentals and applications
Kohl, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
I307
Analysis of the atomic scale oxygen vacancy ordering by EELS and Z- contrast imaging
Ito, Y. / Stemmer, S. / Klie, R. F. / Browning, N. D. / Mazanec, T. J. / Czechoslovak Society for Electron Microscopy et al. | 2000
I309
Extended image-series analysis in the energy-filtered TEM
Thomas, P. J. / Midgley, P. A. / Czechoslovak Society for Electron Microscopy et al. | 2000
I311
Composition and chemical shift analysis of a multilayer using spatially-resolved EELS
Kimoto, K. / Matsui, Y. / Aoyama, T. / Czechoslovak Society for Electron Microscopy et al. | 2000
I313
Electron channeling and monopole transitions in ELNES
Schattschneider, P. / Hebert, C. / Jouffrey, B. / Czechoslovak Society for Electron Microscopy et al. | 2000
I315
Monochromator for high brightness electron guns
Mook, H. W. / Batson, P. E. / Kruit, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
I317
Application of EFTEM for cross-sectional on-product characterization of semiconductor devices
Engelmann, H. J. / Blum, W. / Saage, H. / Worch, M. / Zschech, E. / Czechoslovak Society for Electron Microscopy et al. | 2000
I319
Extraction of three-body distribution in amorphous silicon by wavelet analysis of EXELFS
Muto, S. / Yu, K. M. / Walukiewicz, W. / Jin, H.-C. / Abelson, J. R. / Czechoslovak Society for Electron Microscopy et al. | 2000
I321
Wavelet analysis of extended energy-loss fine structure
Muto, S. / Czechoslovak Society for Electron Microscopy et al. | 2000
I323
Energy-filtering techniques for thick samples
Kabius, B. / Seybold, V. / Hiller, S. / Rilk, A. / Zellmann, E. / Probst, W. / Czechoslovak Society for Electron Microscopy et al. | 2000
I325
EFTEM analysis of the interaction of Co with a fluorinated organic dielectric
Hens, S. / Van Landuyt, J. / Bender, H. / Lanckmans, F. / Maex, K. / Czechoslovak Society for Electron Microscopy et al. | 2000
I327
Quantitative evaluation of short-range order diffuse scattering in Cu~7~2~.~5Pd~2~7~.~5 alloy by energy filter and imaging plate
Ikematsu, Y. / Shindo, D. / Czechoslovak Society for Electron Microscopy et al. | 2000
I329
Cryo-EFTEM elemental mapping of particles in frozen solutions
Bovin, J.-O. / Balmes, O. / Karlsson, G. / Czechoslovak Society for Electron Microscopy et al. | 2000
I331
Electron energy-loss near-edge structures of silicon and silicon carbide
Park, M. Y. / Kruger, P. / Kohl, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
I333
Effect of the excited state lifetime on the near edge structure in EELS or XANES experiments
Hebert, C. / Kostner, M. / Schattschneider, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
I335
EELS study of phase transformation in Cu-Al-Ni alloy
Hanada, T. / Kitao, R. / Nakata, Y. / Hirotsu, Y. / Czechoslovak Society for Electron Microscopy et al. | 2000
I337
Stability performance of an energy filtering TEM
Benner, G. / Zellmann, E. / Harscher, A. / Harle, R. / Kabius, B. / Seybold, V. / Probst, W. / Czechoslovak Society for Electron Microscopy et al. | 2000
I339
Factor analysis of TEM-EEL spectra on nanoscale Fe/Al/Fe layers
Thomas, J. / Bauer, H.-D. / Baunack, S. / Wetzig, K. / Mensch, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
I341
Beam brightness and STEM-EELS performance
Barth, J. E. / Czechoslovak Society for Electron Microscopy et al. | 2000
I343
Factors affecting the performance of EELS energy-filters
Kothleitner, G. / Brink, H. A. / Czechoslovak Society for Electron Microscopy et al. | 2000
I345
Energy-filtered imaging of Fe and Ni nanoparticles in a field emission gun transmission electron microscope
Sayagues, M. J. / Rojas, T. C. / Dunin-Borkowski, R. E. / Hutchison, J. L. / Fernandez, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
I347
Direct atomic scale characterization of interfaces and doping layers in field-effect transistors
Topuria, T. / James, E. / Browning, N. / Ma, Z. / Czechoslovak Society for Electron Microscopy et al. | 2000
I351
Photoemission electron microscopy with high chemical and magnetic sensitivity
Schonhense, G. / Czechoslovak Society for Electron Microscopy et al. | 2000
I355
Auger analysis of sharp topographies: quantification at high spatial resolution
El Gomati, M. M. / Gelthorpe, A. / Dell, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
I359
Quantitative secondary electron emissiometry
Tomashpolsky, Y. Y. / Sadovskaya, N. V. / Czechoslovak Society for Electron Microscopy et al. | 2000
I361
Contrast studies on organic monolayers in FESEM and their correlation with SFM data
Bittermann, A. G. / Reichelt, R. / Czechoslovak Society for Electron Microscopy et al. | 2000
I363
Magneto-optical linear dichroism in threshold photoemission electron microscopy of a polycrystalline Fe-film
Marx, G. K. L. / Elmers, H.-J. / Schonhense, G. / Czechoslovak Society for Electron Microscopy et al. | 2000
I365
Structural and chemical surface analysis with the double-reflection emission electron microscope DREEM
Grzelakowski, K. / Settemeyer, J. / Escher, M. / Merkel, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
I367
Secondary electron field emission microscopy - SEFEM
Fitting, H.-J. / Hingst, T. / Schreiber, E. / Czechoslovak Society for Electron Microscopy et al. | 2000
I369
Possibilities of measurement of magnetic field distributions by photoemission electron microscopy
Nepijko, S. A. / Sedov, N. N. / Marx, G. K. L. / Schonhense, G. / Czechoslovak Society for Electron Microscopy et al. | 2000
I371
Domain imaging and determination of magnetic moments in Co-films using XMCD-PEEM
Marx, G. K. L. / Klais, M. J. / Haibach, P. / Schonhense, G. / Czechoslovak Society for Electron Microscopy et al. | 2000
I375
Towards more quantitative results from three dimensional electron microscopy of macromolecules
Carazo, J. M. / Jimenez-Lozano, N. / Sorzano, C. O. S. / Chagoyen, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
I379
ProcessDiffraction: a computer program to process electron diffraction patterns from polycrystalline or amorphous samples
Labar, J. L. / Czechoslovak Society for Electron Microscopy et al. | 2000
I381
Detection of particles in elemental maps using 2D-histograms
Muller, I. / Kohl, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
I383
Bimodal stereo-based surface reconstruction in SEM
Jan, J. / Janova, D. / Czechoslovak Society for Electron Microscopy et al. | 2000
I385
EMS simulations for STEM and applications
Mobus, G. / Czechoslovak Society for Electron Microscopy et al. | 2000
I387
On the optimum energy for backscattered electron imaging of topographic details in scanning electron microscopy
Merli, P. G. / Morandi, V. / Rosa, R. / Czechoslovak Society for Electron Microscopy et al. | 2000
I389
Genetic algorithms as applied to surface morphology reconstruction in the scanning electron microscope
Li, X. / Kodama, T. / Uchikawa, Y. / Czechoslovak Society for Electron Microscopy et al. | 2000
I391
Influence of the imaginary part of the atomic scattering factor on diffractograms of thin amorphous foils
Knippelmeyer, R. / Thesing, A. / Kohl, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
I393
Backscattered electron stereophotogrammetry based on the BSE-microtomography in the SEM
Rau, E. I. / Sennov, R. A. / Sokolov, V. N. / Yurkovets, D. I. / Melnik, V. N. / Boyde, A. / Howell, P. G. T. / Czechoslovak Society for Electron Microscopy et al. | 2000
I395
Aliasing correction of undersampled crystal images
Koeck, P. J. B. / Czechoslovak Society for Electron Microscopy et al. | 2000
I397
Monte Carlo calculation on 3D distribution of maximum penetration depths of backscattered electrons in the SEM
Hoffmeister, H. / Reimer, L. / Kohl, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
I399
Image analysis of illuvial soil horizons
Kyzlassov, I. / Shoba, S. A. / Sokolov, V. N. / Czechoslovak Society for Electron Microscopy et al. | 2000
I401
Application of 2D-FFT for analysis of vanadium carbonitrides precipitates
Kruk, A. / Osuch, W. / Ciura, F. / Michta, G. / Czechoslovak Society for Electron Microscopy et al. | 2000
I403
An implementation of the coherence function multislice method
Schorsch, P. / Muller, H. / Rose, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
I407
Microscope automation: does the computer replace the operator?
Volkl, E. / Czechoslovak Society for Electron Microscopy et al. | 2000
I411
WebXpertEze: intelligent instruments via the Internet
Caldwell, N. H. M. / Breton, B. C. / Holburn, D. M. / Czechoslovak Society for Electron Microscopy et al. | 2000
I413
Computer-controlled transmission electron microscopy
van der Krift, T. P. / Ziese, U. / Janssen, A. H. / van Maurik, W. A. M. / Koster, A. J. / Czechoslovak Society for Electron Microscopy et al. | 2000
I417
COM technology based modular software for scientific instrumentation control
Vasina, J. / Vasina, R. / Czechoslovak Society for Electron Microscopy et al. | 2000
I419
Computer controlled high-throughput integration system: FasTEM
Fukushima, K. / O Donnell, R. M. / Fujiwara, K. / Kai, H. / Okunishi, E. / Kawasaki, M. / Kersker, M. / Naruse, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
I423
Modern electron optics in SEM and inspection
Plies, E. / Czechoslovak Society for Electron Microscopy et al. | 2000
I427
Advances in TEM instrumentation
Kruit, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
I431
A high resolution add-on lens for scanning electron microscopes
Khursheed, A. / Karuppiah, N. / Koh, S. H. / Czechoslovak Society for Electron Microscopy et al. | 2000
I433
Advances in high-throughput multiple electron-beam lithography
Mankos, M. / Chang, T. H. P. / Czechoslovak Society for Electron Microscopy et al. | 2000
I435
Investigations of an electrostatic duo-hexapole-stigmator
Bartle, J. / Plies, E. / Czechoslovak Society for Electron Microscopy et al. | 2000

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