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‘‘Heisenberg microscope’’ decoherence atom interferometry (Englisch)
Nationallizenz
- Neue Suche nach: Clauser, John F.
- Neue Suche nach: Li, Shifang
- Neue Suche nach: Clauser, John F.
- Neue Suche nach: Li, Shifang
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ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:‘‘Heisenberg microscope’’ decoherence atom interferometry
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Beteiligte:Clauser, John F. (Autor:in) / Li, Shifang (Autor:in)
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Erschienen in:Physical Review A ; 50, 3 ; 2430-2433
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Verlag:
- Neue Suche nach: The American Physical Society
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Erscheinungsdatum:01.09.1994
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Format / Umfang:4 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis – Band 50, Ausgabe 3
Zeige alle Jahrgänge und Ausgaben
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
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