A new setup for high resolution fast X-ray reflectivity data acquisition (Englisch)

in Review of Scientific Instruments ; 87 , 11, Pt. 1 ; 113904/1-113904/5
Review of Scientific Instruments
; 2016
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A new method for fast x-ray reflectivity data acquisition is presented. The method is based on a fast rotating, slightly tilted sample reflecting to a stationary mounted position sensitive detector and it allows for measurements of reflectivity curves in a quarter of a second. The resolution in q-space mainly depends on the beam properties and the pixel size of the detector. Maximum qz-value of 1 Å-1 can be achieved. The time-temperature depending structure changes of poly(N-isopropylacrylamide) thin films were investigated in situ by applying the fast-reflectivity setup. The results are presented in this paper as illustration of the method and proof of principle.

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