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Correlated ion analysis and the interpretation of atom probe mass spectra (Englisch)

In: Ultramicroscopy   ;  111 ,  6  ;  473-479  ;  2010
  • ISSN:
    0304-3991
  • Aufsatz (Zeitschrift)  /  Elektronische Ressource

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Abstract Several techniques are presented for extracting information from atom probe mass spectra by investigating correlations within multiple-ion detector events. Analyses of this kind can provide insights into the origins of noise, the shape of mass peaks, or unexpected anomalies within the spectrum. Data can often be recovered from within the spectrum noise by considering the time-of-flight differences between ions within a multiple event. Correlated ion detection, particularly when associated with shifts in ion energies, may be used to probe the phenomenon of molecular ion dissociation, including the questions of data loss due to ion pile-up or the generation of neutrals in the dissociation process.

Research Highlights ► Multiple-ion detection events may contain information not seen in the mass spectrum. ► Analysis of multiple events can yield information on molecular ion dissociation. ► Neutral species may be generated by dissociation subsequent to field evaporation.

Inhaltsverzeichnis – Band 111, Ausgabe 6

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375
Preface
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672
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711
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715
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730
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738
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743
In commemoration of Prof. Dr.-Ing. Georg Frommeyer (1943–2010)
| 2011
IFC
IFC (Editorial Board)
| 2011
iii
IFES 2010 proceedings of the 52nd international field Emission symposium
Suchorski, Yuri / Schmitz, Guido et al. | 2011
iv
Contents
| 2011

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Kommerziell Vergütung an den Verlag: 36,00 € Grundgebühr: 4,00 € Gesamtpreis: 40,00 €
Akademisch Vergütung an den Verlag: 36,00 € Grundgebühr: 2,00 € Gesamtpreis: 38,00 €

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