Inhaltsverzeichnis – Band 101, Ausgabe 4

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313
Charge exchange of low energy particles passing through thin carbon foils: Dependence on foil thickness and charge state yields of Mg, Ca, Ti, Cr and Ni
Gonin, M. / Kallenbach, R. / Bochsler, P. / Bürgi, A. | 1995
321
Stopping power for low-velocity heavy ions: (0.01-0.9) MeV-nucleon Si ions in 18 (Z = 13-79) metals
Arstila, K. / Keinonen, J. / Tikkanen, P. | 1995
327
L-subshell ionization studies in Au and Bi by 4.8-8.8 MeV boron ion bombardment
Dhal, B.B. / Nandi, T. / Padhi, H.C. | 1995
327
L-subshell MeV boron ion bombardment
Dhal, B. B. / Nandi, T. / Padhi, H. C. | 1995
335
Isotopic mass effects in low-energy sputtering of copper and molybdenum
Bieck, W. / Gnaser, H. / Oechsner, H. | 1995
343
Electron emission from conducting surfaces impacted by multiply-charged polyatomic ions
Axelsson, J. / Parilis, E.S. / Reimann, C.T. / Sullivan, P. / Sundqvist, B.U.R. | 1995
357
Electron depth dose distributions in water, iron and lead: The GEPTS system
Chibani, O. | 1995
379
On the correction for multiple scattering of linearly polarized X-rays in Compton profile measurements
Bell, F. / Felsteiner, J. | 1995
388
Thermal and ion beam diffusion constants of Sb impurity implanted into <100> Ni single crystal
Belattar, A. / Stephens, G.A. / Cardwell, P.D. | 1995
394
Formation of a CoSi2 layer by Co ion implantation using a metal vapor vacuum arc ion source
Zhu, D.H. / Chen, Y.G. / Liu, B.X. | 1995
400
Improvement of adhesion of TiN coatings on stainless steel substrates by high energy heavy ion irradiation
Srivastav, S. / Jain, A. / Kanjilal, D. | 1995
406
Radiation damage problems in high power spallation neutron sources
Ullmaier, H. / Carsughi, F. | 1995
422
Preparation and analysis of targets with implanted thick Ar layers for in-beam gamma-spectroscopy
Grabowy, U. / Busch, H. / Gohla, A. / Speidel, K.-H. | 1995
422
Preparation and analysis of targets with implanted thick Ar layers for in-beam g-spectroscopy
Grabowy, U. / Busch, H. / Gohla, A. / Speidel, K.-H. / Kremeyer, S. / Jakob, G. / Freitag, K. / Gerber, J. / Assmann, W. | 1995
427
A newly developed chemical bevelling technique used for depth independent high depth resolution SIMS analysis
Hsu, C.M. / McPhail, D.S. | 1995
435
Surface-sensitive X-ray diffraction methods: Physics, applications and related X-ray and SR instrumentation
Kovalchuk, M.V. / Kazimirov, A.Yu / Zheludeva, S.I. | 1995
453
PIXE analysis of plant leaves of domestic use in Mexico
Aspiazu, J. / Policroniades, R. / Vivero, R. / Jiménez, M. | 1995
459
An optimized and simplified compact ECR ion source for gaseous species
Boukari, F. / Wartski, L. / Roy, V. / Coste, Ph / Schwebel, C. / Aubert, J. / Souza, M. | 1995
464
On-line beam monitoring for neutron capture therapy at the MIT Research Reactor
Harling, O.K. / Moulin, D.J. / Chabeuf, J.-M. / Solares, G.R. | 1995
473
14 MeV neutron spectra measurements with 4% energy resolution using a type IIa diamond detector
Pillon, M. / Angelone, M. / Krasilnikov, A.V. | 1995
484
On the shape of the diffraction peaks measured by Fourier reverse time-of-flight spectrometry
Kudryashev, V.A. / Priesmeyer, H.G. / Keuter, J.M. / Schröder, J. / Wagner, R. | 1995
493
A new device for XAFS data collection up to 2000 K (or 3700 K under vacuum)
Farges, F. / Itié, J.-P. / Fiquet, G. / Andrault, D. | 1995
499
A simple model of photon transport
Cullen, D.E. | 1995
511
Studies on an electrostatic ion-collection methodology
Howard, A.J. | 1995