Book-Software Reviews - A Long Brief Look at Globalization (Englisch)
- Neue Suche nach: Riddle, Alfy
- Neue Suche nach: Riddle, Alfy
In:
IEEE microwave magazine for the microwave & wireless engineer
;
8
, 6
; 104-105
;
2007
-
ISSN:
- Aufsatz (Zeitschrift) / Print
-
Titel:Book-Software Reviews - A Long Brief Look at Globalization
-
Beteiligte:Riddle, Alfy ( Autor:in )
-
Erschienen in:IEEE microwave magazine for the microwave & wireless engineer ; 8, 6 ; 104-105
-
Verlag:
- Neue Suche nach: IEEE
-
Erscheinungsort:Piscataway, NJ
-
Erscheinungsdatum:2007
-
ISSN:
-
ZDBID:
-
Medientyp:Aufsatz (Zeitschrift)
-
Format:Print
-
Sprache:Englisch
- Neue Suche nach: 53.82 / 53.82
- Weitere Informationen zu Basisklassifikation
-
Schlagwörter:
-
Klassifikation:
-
Datenquelle:
Inhaltsverzeichnis – Band 8, Ausgabe 6
Zeige alle Jahrgänge und Ausgaben
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 3
-
Table of contents - Vol 8 No 6| 2007
- 6
-
A Guest Editorial Look at RF-MEMS [From the Editor's Desk]Barker, Scott / Weller, Tom et al. | 2007
- 6
-
From the Editor's Desk - A Guest Editorial Look at RF-MemsBarker, N.Scott et al. | 2007
- 10
-
President's Column - How Does the IEEE Work?Kenney, J.Stevenson et al. | 2007
- 10
-
How Does the IEEE Work? [President's Column]Kenney, J. Stevenson et al. | 2007
- 18
-
Backscatter| 2007
- 20
-
Enigmas, etc.Valenti, Daniele et al. | 2007
- 20
-
What it was [Enigmas, etc.]Valenti, Daniele et al. | 2007
- 22
-
Options Pricing Theoty [Wireless Investor]Blakey, P. et al. | 2007
- 22
-
Wireless Investor - Options Pricing TheoryBlakey, Peter et al. | 2007
- 28
-
Back to Basics [Microwave Surfing]Bansal, Rajeev et al. | 2007
- 28
-
Microwave Surfing - Back to BasicsBansal, Rajeev et al. | 2007
- 30
-
MicroBusiness - RFID Technology -- Are You Ready for It?Boglione, Luciano et al. | 2007
- 30
-
RFID Technologym - Are You Ready for It?Boglione, L. et al. | 2007
- 34
-
Chasing Chebyshev [Microwave Bytes]Cripps, S.C. et al. | 2007
- 34
-
Microwave Bytes - Chasing ChebyshevCripps, Steve C. et al. | 2007
- 46
-
Educator's Corner - Open-Book Examinations for Assessing Higher Cognitive AbilitiesGupta, Madhu S. et al. | 2007
- 46
-
Open-Book Examinations for Assessing Higher Cognitive Abilities [Educator's Corner]Gupta, M.S. et al. | 2007
- 52
-
The Future of N-MEMS - DARPA N-MEMS science and technology centers to expand our understanding of device physicsBarker, N.Scott et al. | 2007
- 52
-
The Future of N/MEMSScott Barker, N. et al. | 2007
- 56
-
Demonstrating Reliability - An update on RF MEMS switch reliabilityGoldsmith, Chuck et al. | 2007
- 56
-
Demonstrating ReliabilityGoldsmith, C. / Maciel, J. / McKillop, J. et al. | 2007
- 61
-
Are Diamonds a MEMS' Best Friend? Science and technology of integrated ultrananocrystalline diamond-multifunctional materials for fabrication of high-performance RF MEMS-NEMS devicesAuciello, Orlando et al. | 2007
- 61
-
Are Diamonds a MEMS' Best Friend?Auciello, O. / Pacheco, S. / Sumant, A.V. / Gudeman, C. / Sampath, S. / Datta, A. / Carpick, R.W. / Adiga, V.P. / Zurcher, P. / Zhenqiang Ma, et al. | 2007
- 76
-
RF MEMS Testing - Beyond the S-ParametersEbel, J.L. / Hyman, D.J. / Newman, H.S. et al. | 2007
- 76
-
RF MEMS Testing -- Beyond the S-Parameters - RF MEMS testing methods with an emphasis on electromechanical, reliability, lifetime, and manufacturing issuesEbel, John L. et al. | 2007
- 89
-
RFIC 2008 Call for Papers| 2007
- 90
-
Application notes - Numerical Simulation of the FDTD Method in LabVIEWAkram, Gasmelseed et al. | 2007
- 90
-
Numerical Simulation of the FDTD Method in LabVIEW [Application Notes]Akram, G. / Jasmy, Y. et al. | 2007
- 90
-
Numerical Simulation of the FDTD Method in LabVIEWAkram, G. / Jasmy, Y. et al. | 2007
- 95
-
IEEE International Conference on RFID 2008 - Preliminary Call for Papers| 2007
- 100
-
Exposure of Pregnant Dairy Heifers to High-Tension Power Lines [Health Effects]Lin, J.C. et al. | 2007
- 100
-
Health Effects - Exposure of Pregnant Dairy Heifers to High-Tension Power LinesLin, James C. et al. | 2007
- 101
-
IEEE MTT-S International Microwave Symposium 2008 (IMS 2008) - Call for Papers| 2007
- 104
-
The World Is Flat A Brief History of the Twenty-First Century [Book Review]Riddle, Alfy / Schindler, Fred et al. | 2007
- 104
-
Book-Software Reviews - A Long Brief Look at GlobalizationRiddle, Alfy et al. | 2007
- 106
-
Education News| 2007
- 106
-
Two Graduate Fellowship Awards Added for Medical Applications / Fall Undergraduate/Pregraduate Scholarships [Education News]| 2007
- 108
-
Member Benefits| 2007
- 108
-
Stay Technically Current with IEEE Expert Now Online Courses [Member Benefits]Catis, Marilyn G. et al. | 2007
- 111
-
Present an All-Day Workshop on Emergiing Deviice and Packagiing Technollogiies 2007| 2007
- 112
-
MTT-S OmbudsmanNiehenke, Ed et al. | 2007
- 113
-
38th European Microwave Conference 2008| 2007
- 116
-
MTT Society News - Operations Committee Report| 2007
- 116
-
Operations Committee Report [MTT Society News]| 2007
- 118
-
Transitions - John Pippin| 2007
- 118
-
In Memory of John Pippin [Transitions]Sudbury, Roger et al. | 2007
- 119
-
The upward struggle of the microwave engineer [cartoon]| 2007
- 120
-
Conference Calendar| 2007
- 120
-
Conference Calendar [2008]| 2007
- 122
-
New products| 2007
- 125
-
ICMMT 2008 - Call for Papers| 2007
- 127
-
2007 Year-End Index| 2007
- 127
-
2007 Index IEEE Microwave Magazine Vol. 8 [Year-End Index]| 2007
- 134
-
GSMM 2008 - Call for Papers| 2007
- 135
-
Advertisers index| 2007
- 136
-
Low-Noise Device [Outside the Bandwidth]Gupta, Madhu S. et al. | 2007
- 136
-
Outside the Bandwidth - Low-Noise DeviceGupta, Madhu et al. | 2007
- c1
-
Front cover - IEEE Microwave Magazine - Front cover| 2007