Failure analysis using optical evaluation technique (OBIC) of LDs for fiber optical communication (Englisch)
- Neue Suche nach: Takeshita, Tatsuya
- Neue Suche nach: Oohashi, Hiromi
- Neue Suche nach: Takeshita, Tatsuya
- Neue Suche nach: Oohashi, Hiromi
In:
MRS Fall Meeting, 2009, Symposium B, Reliability and Materials Issues of Semiconductor Optical and Electrical Devices, 2009
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15-26
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2010
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Print
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Titel:Failure analysis using optical evaluation technique (OBIC) of LDs for fiber optical communication
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Weitere Titelangaben:Fehleranalyse unter Verwendung eines optischen Auswerteverfahrens (OBIC) von Laserdioden für faseroptische Kommunikation
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Beteiligte:Takeshita, Tatsuya ( Autor:in ) / Oohashi, Hiromi ( Autor:in )
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Erschienen in:Materials Research Society Symposium - Proceedings ; 1195 ; 15-26
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Verlag:
- Neue Suche nach: Materials Research Society (MRS)
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Erscheinungsort:Warrendale
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Erscheinungsdatum:2010
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Format / Umfang:12 Seiten, 17 Bilder, 25 Quellen
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ISBN:
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ISSN:
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Coden:
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DOI:
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Medientyp:Aufsatz (Konferenz)
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Format:Print
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Sprache:Englisch
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Reportnr. / Förderkennzeichen:1195-B01-02
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis Konferenzband
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