A dual-rail compact defect-tolerant multiplexer (Englisch)

in Microelectronics Reliability ; 55 , 3-4 ; 662-670
Microelectronics Reliability
; 2015
  • Neue Suche nach:

As the dimensions of CMOS devices scale down to the nanometers, manufacturing defects are becoming a challenging concern in current and future technologies. This work aims at improving defect tolerance in FPGAs which are certainly affected by technology downsizing. Since the cornerstone of the FPGA logic and interconnect resources is the multiplexer, we propose a defect-tolerant multiplexer architecture based on differential logic. This architecture proved to be more resilient to single defects (opens and bridges) than its single-ended standard counterpart and more compact than existing hardened architectures. The architectures were studied under single defect injection by a tool that models several possible defects for a given design according to its extracted netlist. The robustness gain using differential logic was assessed for different sizes of FPGA look-up tables. Eventually, three different aging phenomena resulting in device wear-out were examined. An aging-aware analysis was performed according to an appropriate simulation flow. Results were given for the proposed multiplexer architecture and its standard counterpart.

Wie erhalte ich diesen Titel?


Inhaltsverzeichnis – Band 55, Ausgabe 3-4

Zeige alle Jahrgänge und Ausgaben

Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Nachweisen der enthaltenen Aufsätze. Die Anzeige der Jahrgänge kann aufgrund fehlender Aufsatznachweise unvollständig oder lückenhaft sein, obwohl die Zeitschrift komplett in der TIB verfügbar ist.

Leakage current study and relevant defect localization in integrated circuit failure analysis
Wu, Chunlei / Yao, Suying / Corinne, Bergès | 2015
An accurate closed-expression model for FinFETs parasitic resistance
Pereira, A.S.N. / Giacomini, R. | 2015
MOSFET channel resistance characterization from the triode region to impact ionization region with the inductive breakdown network
Lee, Chie-In / Lin, Wei-Cheng | 2014
Elimination of stress induced dislocation in deep Poly Sinker LDMOS technology
Xu, Xiangming / Huang, Jingfeng / Yu, Han / Ma, Biao / Wang, Peng-Fei / Zhang, David Wei | 2015
Characterization and modeling of power MOSFET switching times variations under constant electrical stress
Sezgin, Hatice Gül / Özçelep, Yasin | 2015
Ageing and thermal recovery of advanced SiGe heterojunction bipolar transistors under long-term mixed-mode and reverse stress conditions
Fischer, G.G. / Sasso, G. | 2014
Burnout properties of microwave pulse injected on GaAs PHEMT
Zhang, Cunbo / Zhang, Jiande / Wang, Honggang / Du, Guangxing | 2015
Hot carrier effect on the bipolar transistors’ response to electromagnetic interference
Xiong, Cen / Liu, Shuhuan / Li, Yonghong / Tang, Du / Zhang, Jinxin / Du, Xuecheng / He, Chaohui | 2014
Robust dual-direction SCR with low trigger voltage, tunable holding voltage for high-voltage ESD protection
Wang, Yang / Jin, Xiangliang / Yang, Liu / Jiang, Qi / Yuan, Huihui | 2014
A return on investment analysis of applying health monitoring to LED lighting systems
Chang, Moon-Hwan / Sandborn, Peter / Pecht, Michael / Yung, Winco K.C. / Wang, Wenbin | 2015
Reliability of thin films: Experimental study on mechanical and thermal behavior of indium tin oxide and poly(3,4-ethylenedioxythiophene)
Alkhazaili, Atif / Hamasha, Mohammad M. / Choi, Gihoon / Lu, Susan / Westgate, Charles R. | 2015
Temperature mapping by μ-Raman spectroscopy over cross-section area of power diode in forward biased conditions
Kociniewski, T. / Moussodji, J. / Khatir, Z. | 2014
Improving the power cycling performance of IGBT modules by plating the emitter contact
Özkol, Emre / Brem, Franziska / Liu, Chunlei | 2015
An efficient BTX sensor based on p-type nanoporous titania thin films
Dutta, K. / Bhowmik, B. / Hazra, A. / Chattopadhyay, P.P. / Bhattacharyya, P. | 2014
Degradation behavior by DC-accelerated and pulse-current stress in Co/Cr/Y/Al/Ni co-doped ZnO–PrO1.83-based varistors
Nahm, Choon-W. | 2015
Maximum pulse current estimation for high accuracy power capability prediction of a Li-Ion battery
Lee, Seongjun / Kim, Jonghoon / Cho, B.H. | 2014
An evaluation of dwell time and mean cyclic temperature parameters in the Engelmaier model
George, Elviz / Osterman, Michael / Pecht, Michael | 2014
The fundamentals of thermal-mass diffusion analogy
Wong, E.H. | 2014
Effect of aluminum concentration on the microstructure and mechanical properties of Sn–Cu–Al solder alloy
Yang, Li / Zhang, Yaocheng / Du, Chengchao / Dai, Jun / Zhang, Ning | 2014
Development of a fast method for optimization of Au ball bond process
Gomes, J. / Mayer, M. / Lin, B. | 2014
Microstructure, tensile and electrical properties of gold-coated silver bonding wire
Tseng, Yi-Wei / Hung, Fei-Yi / Lui, Truan-Sheng | 2015
Vacuum effect on the void formation of the molded underfill process in flip chip packaging
Guo, Xue-Ru / Young, Wen-Bin | 2014
Fatigue life and resistance analysis of COG assemblies under hygrothermal aging
Zhang, Wenguo / Ma, Jianhua / Gao, Lilan / Zhang, Zhe / Gao, Hong | 2015
The effect of the echo-time of a bipolar pulse waveform on molten metallic droplet formation by squeeze mode piezoelectric inkjet printing
Wu, Cheng-Han / Hwang, Weng-Sing | 2014
Design and analyze of transient-induced latch-up in RS485 transceiver with on-chip TVS
Jiang, Qi / Yuan, Huihui / Wang, Yang / Jin, Xiangliang | 2014
Cross-layer investigation of continuous-time sigma–delta modulator under aging effects
Cai, Hao / Wang, You / Liu, Kaikai / Naviner, Lirida Alves de Barros / Petit, Hervé / Naviner, Jean-François | 2014
Design of a folded cascode opamp with increased immunity to conducted electromagnetic interference in 0.18μm CMOS
Richelli, Anna / Matig-a, Gilbert / Redouté, Jean-Michel | 2014
A dual-rail compact defect-tolerant multiplexer
Ben Dhia, A. / Slimani, M. / Cai, H. / de B. Naviner, L.A. | 2015
Extended Sensor Reliability Evaluation Method in multi-sensor control systems
Łęczycki, Paweł / Andrzejczak, Artur / Pietrzak, Piotr / Pękosławski, Bartosz / Napieralski, Andrzej | 2014
Improving the reliability of the Benes network for use in large-scale systems
Jahanshahi, Mohsen / Bistouni, Fathollah | 2014
Accurate reliability analysis of concurrent checking circuits employing an efficient analytical method
An, T. / Liu, K. / Cai, H. / de B. Naviner, L.A. | 2014
Real-time fault-tolerance with hot-standby topology for conditional sum adder
Mukherjee, Atin / Dhar, Anindya Sundar | 2014
Inside front cover - Editorial board
| 2015

Ähnliche Titel