Acceleration of potential-induced degradation (PID) by salt-mist preconditioning in c-Si photovoltaic modules (Englisch)

WCPEC, World Conference on Photovoltaic Energy Conversion, 6
; 2014
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In this study, we have demonstrated that certain types of salt-mist stress followed by high-voltage stress can cause drastic degradation of electrical performance in the photovoltaic (PV) modules. Degradation profiles that are related to the potential-induced degradation (PID) were obtained by measuring the current-voltage characteristics and by other procedures. Based on these results, we conclude that PID is accelerated by salt-mist preconditioning. This degradation may indicate the wear-out phenomenon after the long-term exposure in the field (especially near the coast).

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