Acoustic emission for detecting deterioration of capacitors under aging (Englisch)
- Neue Suche nach: Smulko, Janusz
- Neue Suche nach: Jozwiak, Kazimierz
- Neue Suche nach: Olesz, Marek
- Neue Suche nach: Hasse, Lech
- Neue Suche nach: Smulko, Janusz
- Neue Suche nach: Jozwiak, Kazimierz
- Neue Suche nach: Olesz, Marek
- Neue Suche nach: Hasse, Lech
In:
Microelectronics Reliability
;
51
, 3
;
621-627
;
2011
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Acoustic emission for detecting deterioration of capacitors under aging
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Weitere Titelangaben:Schallemissionsprüfung für die Erkennung der Verschlechterung von Kondensatoren durch Altern
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Beteiligte:Smulko, Janusz ( Autor:in ) / Jozwiak, Kazimierz ( Autor:in ) / Olesz, Marek ( Autor:in ) / Hasse, Lech ( Autor:in )
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Erschienen in:Microelectronics Reliability ; 51, 3 ; 621-627
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Verlag:
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Erscheinungsdatum:2011
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Format / Umfang:7 Seiten, 12 Bilder, 1 Tabelle, 14 Quellen
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ISSN:
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Coden:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 51, Ausgabe 3
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Inside front cover - Editorial board| 2011