Differentiation of 18O‐ and 16O‐rich layers in anodic alumina films by glow discharge time‐of‐flight mass spectroscopy (Englisch)
- Neue Suche nach: Molchan, I. S.
- Neue Suche nach: Thompson, G. E.
- Neue Suche nach: Skeldon, P.
- Neue Suche nach: Trigoulet, N.
- Neue Suche nach: Tempez, A.
- Neue Suche nach: Chapon, P.
- Neue Suche nach: Tuccitto, N.
- Neue Suche nach: Licciardello, A.
- Neue Suche nach: Molchan, I. S.
- Neue Suche nach: Thompson, G. E.
- Neue Suche nach: Skeldon, P.
- Neue Suche nach: Trigoulet, N.
- Neue Suche nach: Tempez, A.
- Neue Suche nach: Chapon, P.
- Neue Suche nach: Tuccitto, N.
- Neue Suche nach: Licciardello, A.
In:
Surface and Interface Analysis
;
42
, 4
;
211-214
;
2010
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Differentiation of 18O‐ and 16O‐rich layers in anodic alumina films by glow discharge time‐of‐flight mass spectroscopy
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Beteiligte:Molchan, I. S. ( Autor:in ) / Thompson, G. E. ( Autor:in ) / Skeldon, P. ( Autor:in ) / Trigoulet, N. ( Autor:in ) / Tempez, A. ( Autor:in ) / Chapon, P. ( Autor:in ) / Tuccitto, N. ( Autor:in ) / Licciardello, A. ( Autor:in )
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Erschienen in:Surface and Interface Analysis ; 42, 4 ; 211-214
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Verlag:
- Neue Suche nach: John Wiley & Sons, Ltd.
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Erscheinungsdatum:01.04.2010
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Format / Umfang:4 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 42, Ausgabe 4
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