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Viewing Angle and Imaging Polarization Analysis of Liquid Crystal Displays and Their Components
British Library Online Contents | 2014| -
A new multiple wavelength ellipsometric imager: design, limitations and applications
Online Contents | 2004| -
Automated metrology system including VUV spectroscopic ellipsometry and X-ray reflectometry for 300 mm silicon microelectronics
Online Contents | 2004|Beteiligte: Evrard, P. -
Automated metrology system including VUV spectroscopic ellipsometry and X-ray reflectometry for 300 mm silicon microelectronics
Online Contents | 2004|Beteiligte: Evrard, P. -
A new multiple wavelength ellipsometric imager: design, limitations and applications
Online Contents | 2004| -
VUV spectroscopic ellipsometry applied to the characterization of high-k dielectrics
Online Contents | 2004|Beteiligte: Heinrich, P. -
Automated metrology system including VUV spectroscopic ellipsometry and X-ray reflectometry for 300 mm silicon microelectronics
Online Contents | 2004|Beteiligte: Evrard, P.