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  • industrielle technik
  • ingenieurwesen
  • ingenieurwissenschaft
  • ingenieurwissenschaften
  • technik
  • technikwissenschaften
  • technique
  • technische wissenschaften

Verwendete Synonyme:

  • fur

Verwendete Synonyme:

  • angewandte optik
  • optische technik
  • technische optik

Verwendete Synonyme:

  • gesellschaft
  1.  

    Robust PPC and DFM methodology for exposure tool variations

    Kotani, T. / Nakajima, F. / Mashita, H. et al. | Tema Archiv | 2008
  2.  

    A study of active thermography approaches for the non-destructive testing and evaluation of aerospace structures

    Avdelidis, N.P. / Ibarra-Castanedo, C. / Marioli-Riga, Z.P. et al. | Tema Archiv | 2008
  3.  

    Long-term reliable operation of a MOPA-based ArF light source for microlithography

    Ishihara, T. / Besaucele, H. / Maley, C. et al. | Tema Archiv | 2004
  4.  

    EUV mask reflectivity measurements with micron-scale spatial resolution

    Goldberg, K.A. / Rekawa, S.B. / Kemp, C.D. et al. | Tema Archiv | 2008
  5.  

    Visual robot control for close range inspections

    Monning, F. / Pfeifer, T. | Tema Archiv | 2004
  6.  

    EUV mask inspection tool using high NA DUV inspection tool

    Choi, Yongkyoo / Oh, Sunghyun / Kim, Munsik et al. | Tema Archiv | 2008
  7.  

    Application of comparative digital holography for distant shape control

    Baumbach, T. / Osten, W. / Kopylow, C. von et al. | Tema Archiv | 2004
  8.  

    Aerial image measurement methods for fast aberration set-up and illumination pupil verification

    Laan, H. van der / Dierichs, M. / Greevenbroek, H. van et al. | Tema Archiv | 2001
  9.  

    Digital holography used for measurement of deformations during gas quenching processes

    Alsen, J. / Kopylow, C. von / Juptner, W. | Tema Archiv | 2004
  10.  

    Denoising of conoscopic holography fringe patterns with orientational filters: a comparative study

    Enguita, J.M. / Fernandez, Y. / Alvarez, I. et al. | Tema Archiv | 2004
  11.  

    A practical guide to IR windows

    Robinson, M.G. | Tema Archiv | 2003
  12.  

    Detecting water in aviation honeycomb structures by using transient infrared thermographic NDT

    Vavilov, V.P. / Klimov, A. / Nesteruk, D. et al. | Tema Archiv | 2003
  13.  

    Thermal profiling for IC chip high-voltage stress prediction

    Hsieh, Sheng-Jen / Huang, Sung-Ling | Tema Archiv | 2003

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