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Effect of Reduced Extended Defect Density in MOCVD Grown AlGaN/GaN HEMTs on Native GaN Substrates
Online Contents | 2016| -
Selective switching of GaN polarity on Ga-polar GaN using atomic layer deposited Al2O3
Online Contents | 2014| -
SURFACE PROFILE MAPPING FOR EVALUATING III-N DEVICE PERFORMANCE AND YIELD
Freier ZugriffEuropäisches Patentamt | 2021| -
Electron Backscatter Diffraction Study of Hexagonal Boron Nitride Growth on Cu Single-Crystal Substrates
American Chemical Society | 2015| -
SURFACE PROFILE MAPPING FOR EVALUATING III-N DEVICE PERFORMANCE AND YIELD
Freier ZugriffEuropäisches Patentamt | 2023| -
Deep-UV photoemission electron microscopy for imaging nanoscale heterogeneity and defects in gallium nitride
British Library Conference Proceedings | 2023| -
Dense nanocrystalline yttrium iron garnet films formed at room temperature by aerosol deposition
British Library Online Contents | 2016| -
Mapping and evaluating GaN wafers for vertical device applications
Freier ZugriffEuropäisches Patentamt | 2022|