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    TOF study of pulsed-laser ablation of aluminum nitride for thin film growth

    Chu, C. / Ong, P.P. / Chen, H.F. et al. | Online Contents

    The interaction of C60 fullerene and carbon nanotube with Ar ion beam

    Zhu, Yongfa / Yi, Tao / Zheng, Bin et al. | Online Contents

    A TPD, HREELS, and XPS study of electron-induced deposition of germanium on Si(100)

    Lozano, J. / Craig Jr, J.H. / Campbell, J.H. | Online Contents

    Structural characterization of TiO2 thin films obtained by pulsed laser deposition

    Escobar-Alarcon, L. / Haro-Poniatowski, E. / Camacho-Lopez, M.A. et al. | Online Contents

    An X-ray photoelectron spectroscopic study on the effect of Ru and Sn additions to platinised carbons

    Shukla, A.K. / Aric`o, A.S. / El-Khatib, K.M. et al. | Online Contents

    Epitaxial growth of silver on Br-passivated Si(111) substrates under high vacuum

    Sundaravel, B. / Das, Amal K. / Ghose, S.K. et al. | Online Contents

    Observation of ferroelectric microdomains in LiNbO3 crystals by electrostatic force microscopy

    Tsunekawa, S. / Ichikawa, J. / Nagata, H. et al. | Online Contents

    Crystallization kinetics of thermally evaporated As45.2Te46.6In8.2 thin films

    Moharram, A.H. / Hafiz, M.M. / Abu-Sehly, A.A. | Online Contents

    Temperature-dependent dispersion model of float zone crystalline silicon

    Franta, Daniel / Franta, Pavel / Dubroka, Adam et al. | Online Contents | 2017

    Polarization characteristics of diffraction scattering from metal rough surface

    Jin, Lianhua / Taguchi, Takuma / Kondoh, Eiichi et al. | Online Contents | 2017

    Spectroscopic ellipsometry of columnar porous Si thin films and Si nanowires

    Fodor, Bálint / Defforge, Thomas / Agócs, Emil et al. | Online Contents | 2017

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