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A sample scanning system with nanometric accuracy for quantitative SPM measurements
British Library Conference Proceedings | 2001| -
A sample scanning system with nanometric accuracy for quantitative SPM measurements
British Library Online Contents | 2001| -
A Heterodyne Laser Refractometer for the Measurement of the Air Refractive Index
British Library Conference Proceedings | 1997| -
Characterisation of optical and UV gratings by means of Scanning Tunneling Microscopy and optical diffractometry
British Library Conference Proceedings | 1998| -
STM carbon nanotube tips fabrication for critical dimension measurements
British Library Online Contents | 2005| -
STM carbon nanotube tips fabrication for critical dimension measurements
British Library Conference Proceedings | 2005| -
Topography reconstruction by means of optical scatterometry analysis
British Library Conference Proceedings | 2001| -
The IMGC Calibration Set-up for Microdisplacement Actuators
British Library Conference Proceedings | 1998| -
Interferometric calibration of microdisplacement actuators [5190-37]
British Library Conference Proceedings | 2003| -
Two scanning tunneling microscope devices for large samples
NationallizenzAmerican Institute of Physics | 1993| -
Structural and surface properties of sputtered Nb films for multilayer devices
British Library Online Contents | 1997| -
A Novel AC Current Source for Capacitance-Based Displacement Measurements
British Library Online Contents | 1997| -
An AC Current Source for Capacitance-Based Displacement Measurements
British Library Conference Proceedings | 1996| -
Two scanning tunneling microscope devices for large samples
British Library Online Contents | 1993|