1–10 von 10 Ergebnissen

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  1.  

    New method for quantifying the response of filters at corners

    Schulze, Mark A. / Pearce, John A. | SPIE | 1994
  2.  

    Blue noise and model-based halftoning

    Schulze, Mark A. / Pappas, Thrasyvoulos N. | SPIE | 1994
  3.  

    Some properties of the two-dimensional pseudomedian filter

    Schulze, Mark A. / Pearce, John A. | SPIE | 1991
  4.  

    Rapid Communication - Classification Accuracy in Multiple Color Fluorescence Imaging Microscopy

    Castleman, Kenneth R. / Eils, R. / Morrison, Larry et al. | Online Contents | 2000
  5.  

    Semiconductor wafer defect detection using digital holography

    Schulze, Mark A. / Hunt, Martin A. / Voelkl, Edgar et al. | SPIE | 2003
  6.  

    Direct To Digital Holography For High Aspect Ratio Inspection of Semiconductor Wafers

    Thomas, C. E. (Tommy) / Hunt, Martin A. / Bahm, Tracy M. et al. | American Institute of Physics | 2003
  7.  

    Direct to digital holography for semiconductor wafer defect detection and review

    Thomas, C. E. / Bahm, Tracy M. / Baylor, Larry R. et al. | SPIE | 2002
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