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  1.  

    Reflections on the year gone and the year to come

    Alles, M. | British Library Conference Proceedings | 2008
  2.  

    Microfluidic detachment assay to probe the adhesion strength of diatoms

    Alles, M. / Rosenhahn, A. | Taylor & Francis Verlag | 2015
  3.  

    Microfluidic detachment assay to probe the adhesion strength of diatoms

    Alles, M. / Rosenhahn, A. | British Library Online Contents | 2015
  4.  

    Mechanism of CuA assembly in the biogenesis of cytochrome c oxidase

    Alles, M. / Ludwig, B. | British Library Online Contents | 2012
  5.  

    GeneQuence® Salmonella Assay

    Alles, S. / Mozola, M. | British Library Online Contents | 2009
  6.  

    Topology on the Lattice

    Alles, B. / D'Elia, M. | arXiv | 2006
  7.  

    Behavior near theta = π of the mass gap in the two-dimensional O(3) nonlinear sigma model (8 pages)

    Alles, B. / Giordano, M. / Papa, A. | British Library Online Contents | 2014
  8.  

    OAS Harderwijk: modellering van bakjes tot strengen

    Heinhuis, M. / Alles, J. | British Library Online Contents | 2004
  9.  

    A Case Study in Reliability-Aware Design: A Resilient LDPC Code Decoder

    May, M. / Alles, M. / Wehn, N. | British Library Conference Proceedings | 2008
  10.  

    A synthesizable IP core for WiMedia 1.5 UWB LDPC code decoding

    Alles, M. / Wehn, N. / Berens, F. | Tema Archiv | 2009
  11.  

    2005-01-1531 In-Vehicle Network Architecture for the Next-Generation Vehicles

    Mahmud, S. M. / Alles, S. | British Library Online Contents | 2005
  12.  

    Decanning installation at Marcoule, France

    Alles, M. | Engineering Index Backfile | 1963
  13.  

    Simulation of Large Spatial Domain Ultrasound Scattering Problems

    Alles, E.J. / van Dongen, K.W.A. | British Library Conference Proceedings | 2009
    Sonstige Beteiligte: Boone, Marinus M.
  14.  

    Control implications of worker identification with firm sales success

    Alles, M. / Datar, S. | British Library Online Contents | 2002
  15.  

    Non-Destructive Contamination Detection in Thick and Extremely Thin SOI Wafers Using Optical Second Harmonic Generation

    Kryger, M. C. / Changala, J. P. / Alles, M. L. | British Library Conference Proceedings

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