Nuclear instruments & methods in physics research : a journal on accelerators, instrumentation and techniques applied to research in nuclear and atomic physics, materials science and related fields in physics
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
Table of contents
- 1
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The feasibility of high power cyclotronsStammbach, Th et al. | 1996
- 8
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Large area ion and plasma beam sourcesWaldorf, J. et al. | 1996
- 16
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A new injector for the ISL-cyclotron at HMIEngels, O. et al. | 1996
- 21
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Technique for fluence attenuation by acceleration of decay particlesItahashi, T. / Kondo, M. / Yamagata, T. et al. | 1996
- 26
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The cooler synchrotron COSY in JuelichBechstedt, U. / Dietrich, J. / Maier, R. et al. | 1996
- 26
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The cooler synchrotron COSY in JülichBechstedt, U. et al. | 1996
- 30
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Ar+-beam experiments with the high-current heavy-ion Spiral-RFQ at GSIBessler, U. et al. | 1996
- 34
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The Frankfurt ECRIS-RFQ facility for materials research with highly charged ionsStiebing, K. et al. | 1996
- 38
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Design of low frequency RFQ accelerators for ion implantationVormann, H. et al. | 1996
- 42
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Study on a tuning-free network for the rf accelerating cavitySato, K. et al. | 1996
- 46
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Development of heavy ion IHQ linac for material irradiationIto, T. et al. | 1996
- 50
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Energy widths of ion beams from a tandem acceleratorHartmann, B. et al. | 1996
- 54
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The Proton Irradiation Facility at the Paul Scherrer InstituteHajdas, W. et al. | 1996
- 59
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Ion irradiation facility for materials research at the 1.4 MeV-u high-charge state injector of GSITinschert, K. et al. | 1996
- 63
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Concept and status of the new sample preparation and analyzing facility at BochumKubsky, S. / Borucki, L. / Berheide, M. et al. | 1996
- 67
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Fine-focusing system of intense beams for application of ion-induced plasmaSasa, K. et al. | 1996
- 71
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Computer simulation for electrostatic lenses by using piecewise polynomialsKiss, L. et al. | 1996
- 75
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Low-energy ion source characteristics for producing an ultra-fine microbeamIshii, Y. et al. | 1996
- 78
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Beam-current measurement based on residual gas ionizationBohne, W. et al. | 1996
- 81
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Review of industrial applications of electron acceleratorsMehnert, R. et al. | 1996
- 88
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Focused high-voltage electron beams in material scienceSigle, W. et al. | 1996
- 93
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Custom-tailored dose with the IMPELA electron irradiatorDrewell, N.H. et al. | 1996
- 96
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The measurement, control, and validation of critical parameters in an electron beam sterilization facilityBurns, P. et al. | 1996
- 103
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Electron beam technology for improvement of the recovery characteristics of power thyristorsIliescu, E. et al. | 1996
- 106
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IAP linacs in applied researchMartin, D. et al. | 1996
- 110
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Excimer lasers induced electron beams on metal cathodes under a plasma effectBeloglazov, A. / Martino, M. / Nassisi, V. et al. | 1996
- 114
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Computer aided simulations of high current small energy electron beam channelsMarghitu, S. et al. | 1996
- 119
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Improving beam profiles in the Super-ALIS super conducting storage ringYamada, K. et al. | 1996
- 122
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X-ray microprobesChevallier, P. et al. | 1996
- 128
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Accelerator based X-ray facilities applied to freight controlGaillard, G. et al. | 1996
- 134
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Compact flash X-ray sources and their applicationsPouvesle, J.M. et al. | 1996
- 141
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X-ray detectors with digitized preamplifiersStein, J. et al. | 1996
- 146
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Improvement of heavy element tomography results using tunable gamma-ray beamsBertschy, M. et al. | 1996
- 150
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Direct measurement and Monte Carlo simulation of a bremsstrahlung source created by 10 MeV electronsStritt, N. et al. | 1996
- 154
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Ion beam modification for submicron technologyKalbitzer, S. et al. | 1996
- 161
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Application of ion implantation in tooling industryStraede, C.A. et al. | 1996
- 167
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Depth resolving phase analysis of ion implanted stainless steelWalter, G. et al. | 1996
- 171
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Application of nuclear analytical and electron microscopic techniques to the investigation of the oxidation behavior of Mg-implanted steel samplesNoli, F. et al. | 1996
- 176
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Aluminum ion implantation under backfilling oxygenHausner, R.M. et al. | 1996
- 182
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Diffusion phenomena of implanted nitrogen in chromiumSymietz, I. et al. | 1996
- 186
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Ion beam mixing at copper-alumina interfaces using marker geometryNeubeck, K. et al. | 1996
- 191
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Effect of Cr implantation on the morphology of Al:Si filmsZaborowski, M. / Gawlik, G. / Barcz, A. et al. | 1996
- 196
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Crystallographic structure of d-TiN films prepared by photon and ion beam assisted depositionWengenmair, H. et al. | 1996
- 201
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A study on the metallisation and stabilisation of porous siliconGiaddui, T. et al. | 1996
- 205
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Low energy ion beam irradiation of siliconNebiker, P.W. et al. | 1996
- 209
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Defect development and dopant location due to elevated temperature implantation of InP with MeV zinc ionsKrause, H. et al. | 1996
- 214
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Epitaxial crystallization and nucleation during MeV-ion beam processing of amorphous GaAs surface layersBachmann, T. et al. | 1996
- 218
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Light ion induced damage in CdTe and Hg(1-x)Cd(x)Te epitaxial thin filmsRusso, S. P. / Johnston, P. N. / Elliman, R. G. et al. | 1996
- 223
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Depth profile analysis and study of the electronic properties of silicon nitride layers produced by ion implantationMarkwitz, A. et al. | 1996
- 227
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Microstructural characterization of stoichiometric buried Si 3)N4 filmsPaloura, E.C. et al. | 1996
- 231
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The effect of ion implantation in the microstructure of Si 3)N4 films: An X-ray absorption studyPaloura, E.C. et al. | 1996
- 235
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Low-energy 15N implantation in carbon for the synthesis of carbon nitride layersLink, F. et al. | 1996
- 239
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Damage production and annealing of ion implanted silicon carbideHeft, A. et al. | 1996
- 244
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Damage and sputtering of fullerene by low energy medium and heavy ionsFink, D. / Chadderton, L. T. / Vacik, J. et al. | 1996
- 248
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Influence of pulsed laser annealing on rare earth implanted luminescenceCan, N. et al. | 1996
- 253
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An IBA and Raman study of irradiated thin films of YBa~2Cu~3O~7 superconductorVlastou, R. / Gazis, E. N. / Papadopoulos, C. T. et al. | 1996
- 257
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Electrical conduction in ion implanted Nylon-6 filmsBalasubramanian, V. / Kelkar, D. S. / Kurup, M. B. et al. | 1996
- 261
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Radiation damage in spinel single crystalsTuros, A. et al. | 1996
- 266
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Influence of plasma density and plasma sheath dynamics on the ion implantation by plasma immersion techniqueBender, H. et al. | 1996
- 270
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RBS with monolayer resolutionKimura, K. et al. | 1996
- 275
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Elemental concentration profile in ancient gold artifacts by ion beam scatteringRuvalcaba-Sil, J.L. et al. | 1996
- 279
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RBS characterization of iridium silicides formed by RTA in vacuumRodriguez, T. et al. | 1996
- 284
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Alpha backscattering used in stoichiometry determination of thin SiC coatings on Si(100) wafersSomatri, R. et al. | 1996
- 288
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Density of thin TiO2 filmsLaube, M. et al. | 1996
- 293
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Study of structural differences between stoichiometric and congruent lithium niobateKling, A. et al. | 1996
- 296
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Investigation of chemical processes at mineral surfaces using accelerator-based and surface analytical techniques: Heavy metal sorption on zeolite crystalsMisaelides, P. et al. | 1996
- 300
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BSCAT: Code for simulation and for analysis of the RBS-NRA spectraRajchel, B. et al. | 1996
- 303
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ERDA of solar selective absorbersAssmann, W. et al. | 1996
- 308
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Elastic recoil detection (ERD) with extremely heavy ionsForster, J.S. et al. | 1996
- 312
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Damage in semiconductor materials during heavy-ion elastic recoil detection analysisWalker, S.R. et al. | 1996
- 317
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From micro- to nanoprobes: Auspices and horizonsButz, T. et al. | 1996
- 323
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Nuclear microprobe designMutsaers, P.H.A. et al. | 1996
- 330
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Applications of nuclear microprobes in the semiconductor industryTakai, M. et al. | 1996
- 336
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Applications of nuclear microprobes in environmental researchMalmqvist, K.G. et al. | 1996
- 347
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Ion beam studies of archaeological gold jewellery itemsDemortier, G. et al. | 1996
- 354
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Further results from PIXE analysis of inks in Galileo's notes on motionCarmine, P.Del et al. | 1996
- 359
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Aerosol study in the town of Genova with a PIXE analysisFormenti, P. et al. | 1996
- 363
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X-ray emission spectroscopy applied for bulk and individual analysis of airborne particulatesValkovic, V. et al. | 1996
- 368
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PIGE-PIXE analysis of chewing sticks of pharmacological importanceOlabanji, S.O. et al. | 1996
- 373
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Glancing incident MeV ion beams for total reflection PIXE (TPIXE) and RBS surface analysisKan, J.A.van et al. | 1996
- 378
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Testing of radiation detectors by IBIC imagingJaksic, M. et al. | 1996
- 382
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Scanning transmission ion microscopy (STIM) with a 3 MeV proton cyclotron beamMaanen, I.F.van et al. | 1996
- 387
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Investigation of the resolution affecting parameters of a nuclear microprobe using a solenoid lensStephan, A. et al. | 1996
- 391
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Determination of the microbeam profile using deconvolution proceduresMaj, B. et al. | 1996
- 396
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Cross section of the ^1^4N(,P~o)^1^7O nuclear reaction for analytical applicationsGiorginis, G. / Misaelides, P. / Crametz, A. et al. | 1996
- 396
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Cross section of the 14N(a,P0)17O nuclear reaction for analytical applicationsGiorginis, G. et al. | 1996
- 399
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Cross section of the ^3^2S(, p)^3^5Cl nuclear reaction for sulphur determinationSoltani-Farshi, M. / Meyer, J. D. / Misaelides, P. et al. | 1996
- 399
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Cross section of the 32S(a, p)35Cl nuclear reaction for sulphur determinationSoltani-Farshi, M. et al. | 1996
- 403
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Boron localisation in silicon, an application of nuclear reaction channelling for materials analysisVollmer, M. et al. | 1996
- 407
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A computer controlled PIGE setup for the analysis of thin samplesStrivay, D. et al. | 1996
- 411
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Quantification of fluorine in SiFx etch residues on silicon with proton induced g-emissionIJzendoorn, L.J.van et al. | 1996
- 411
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Quantification of fluorine in SiF~x etch residues on silicon with proton induced gamma-emissionVan IJzendoom, L. J. / Hayerlag, M. / Verbeek, A. et al. | 1996
- 415
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Thin layer activation of non-metallic materials by using nuclear implantationDitroi, F. et al. | 1996
- 420
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Ion beam-based studies for tribological phenomenaRacolta, P.M. et al. | 1996
- 424
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Excitation function of alpha-particle induced nuclear reactions on natural nickelTakács, S. et al. | 1996
- 429
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Production of residual nuclei from irradiation of thin Pb-targets with protons up to 1.6 GeVGloris, M. / Michel, R. / Herpers, U. et al. | 1996
- 434
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Production of cosmogenic nuclides in meteoroids: Accelerator experiments and model calculations to decipher the cosmic ray record in extraterrestrial matterMichel, R. et al. | 1996
- 445
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Detection of ^2^3^6U: a possible 100-million year neutron flux integratorPurser, K. H. / Kilius, L. R. / Litherland, A. E. et al. | 1996
- 453
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41Ca measurements at the Zurich AMS facilityDittrich-Hannen, B. et al. | 1996
- 457
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High-precision radiocarbon measurements at the ANTARES AMS CentreHotchkis, M.A.C. et al. | 1996
- 461
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A high capacity ion source for AMSKieser, W.E. et al. | 1996
- 465
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The Groningen AMS facilityWijma, S. et al. | 1996
- 470
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Cross section measurements of proton induced reactions using a gas targetParrat, Y. et al. | 1996
- 474
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Environmental levels of carbon-14 around a Swedish nuclear power plant measured with accelerator mass spectrometryStenström, K. et al. | 1996
- 477
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AMS 14C dating of ancient human bones in missing layersSixun, Y. et al. | 1996
- 479
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Medical application of 26AlSteinhausen, C. et al. | 1996
- 484
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On the production of 36Cl by high energy protons in thin and thick targetsSchiekel, Th et al. | 1996
- 490
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Increase of ^1^2^9I in the environmentWagner, M. J. M. / Dittrich-Hannen, B. / Synal, H.-A. et al. | 1996
- 495
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Nuclear waste transmutationLeray, S. et al. | 1996
- 501
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Radioactive ion beams for solid state researchCorreia, J.G. et al. | 1996
- 507
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Perturbed angular correlations in metal oxides with radioactive tracer beamsLupascu, D. et al. | 1996
- 513
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Biomedical applications of hadron acceleratorsAmaldi, U. et al. | 1996
- 522
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The proton therapy system for the NPTC: Equipment description and progress reportJongen, Y. et al. | 1996
- 526
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High-current positron beams in gamma-defectoscopyGorev, V. V. / Kachalov, K. O. / Kleonsky, V. I. et al. | 1996
- 526
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High-current positron beams in g-defectoscopyGorev, V.V. et al. | 1996
- 530
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SIMS characterization of thin layers of IR and its silicidesBlanco, J. M. / Serrano, J. J. / Jimenez-Leube, J. et al. | 1996
- 534
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The behaviour of Si and CoSi2 during low energy nitrogen bombardment, with and without O2-floodingDeleu, J. et al. | 1996
- 539
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Author index| 1996
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Editorial| 1996
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Photographs| 1996
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Committees and Sponsors| 1996