Iodine-Stabilized 1550 nm Diode Laser for Optical Fiber Communication (English)

In: Precision electromagnetic measurements   ;  473-474  ;  2000

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Table of contents conference proceedings

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3
Single Electron Transport and the Quantised Acousto-Electric Effect in GaAs
Pepper, M. / Cunningham, J. / Talyanski, V. I. / Shilton, J. M. / Ford, C. J. B. / Smith, C. G. / Ritchie, D. A. / Kristensen, A. / Lindelof, P. E. | 2000
5
Measurement of the collisional frequency shift in a /sup 87/Rb fountain
Bize, S. / Sortais, Y. / Nicolas, C. / Santarelli, G. / Clairon, A. / Mandache, C. / Salomon, C. | 2000
5
Measurement of the Collisional Frequency Shift in a ^8^7Rb Fountain
Bize, S. / Sortais, Y. / Nicolas, C. / Santarelli, G. / Clairon, A. / Mandache, C. / Salomon, C. | 2000
7
Laser-cooled /sup 87/Rb clock
Fertig, C. / Bouttier, J. / Gibble, K. | 2000
7
Laser-Cooled ^8^7Rb Clock
Fertig, C. / Bouttier, J. / Gibble, K. | 2000
8
The Stark effect on the HFS of Cs atoms: application to blackbody radiation shift
Domnin, Yu.S. / Novoselov, A.V. / Pal'chikov, V.G. | 2000
10
Preliminary results from the USNO cesium fountain atomic clock
Burt, E. / Swanson, T. / Ekstrom, C. | 2000
12
Recent measurements of single electron transport in surface acoustic wave devices at the NPL
Janssen, T.J.B.M. / Hartland, A. | 2000
14
Long-term charge offset and glassy dynamics in SET transistors
Zimmerman, N.M. / Huber, W.H. | 2000
16
Measurement of the frequency dependence of a single-electron tunneling capacitance standard
Eichenberger, A.L. / Keller, M.W. / Martinis, J.M. / Zimmerman, N.M. | 2000
18
Application of SET devices in metrology: Overview of results of the European project SETamp (1997-1999)
Liefrink, F. / Teunissen, P. | 2000
20
Evaluation of ac-dc difference of thermal converters using an SFQ-based D/A converter
Sasaki, H. / Bubanja, V. / Kiryu, S. / Hirayama, F. / Maezawa, M. / Shoji, A. | 2000
22
Fast reversed dc measurements on thermal converters using a SINIS Josephson junction array
Funck, T. / Behr, R. / Klonz, M. | 2000
24
Improvements in the NIST cryogenic thermal transfer standard
Lipe, T.E. / Kinard, J.R. / Reintsema, C.D. | 2000
26
Tests on the IEN electrometric ac-dc transfer standard
Pogliano, U. / Bosco, G.C. | 2000
28
Magnetoresistive watt-converter for measurement active power in the frequency range of 20 Hz-20 kHz
Vountesmeri, V. | 2000
30
Stochastic measurement of PWM signals
Pejic, D. / Vujicic, V. | 2000
32
A thermal power comparator based on the push-pull techniques
Park, Y.T. / Yu, K.M. / Song, Y.S. | 2000
34
Single DVM sampling power meter for low frequencies
Lapuh, R. / Visocnik, I. / Arnsek, A. | 2000
36
A sampling wattmeter with a capacitive shunt for the measurement of power under highly distorted waveforms
Garcia, R. / Regueiro, A. / Laiz, H. | 2000
38
Influence of frequency difference between current and voltage on ac power measurement result
Liu, L.X. / Chen, T.P. / Chua, S.W. | 2000
40
Some new results in calibration of three-phase power/energy comparator in NIM
Lu Zuliang, / Li Min, / Guo Fengying, / Li Xiaotie, / Wang Lei, | 2000
41
Automatic high precision audio frequency power standard
Helisto, P. / Rautiainen, A. / Seppa, H. | 2000
43
Measurement of reactive power using a 90/spl deg/ reference and a wattmeter
Gibbes, A.M. | 2000
43
Measurement of Reactive Power using a 90^o Reference and a Wattmeter
Gibbes, A. M. | 2000
45
Complex compactly-supported orthonormal wavelets: constructions and applications in power system
Chen Xiangxun, | 2000
46
Low phase noise temperature-compensated cryogenic whispering gallery mode resonator operated at 63 K in a closed cycle cooler
Hao, L. / Gallop, J.C. / Klein, N. / Winter, M. | 2000
48
A bi-directional interferometric frequency discriminator for low noise microwave applications
Hartnett, J.G. / Tobar, M.E. / Ivanov, E.N. | 2000
50
Design analysis of a sapphire loaded cavity for a spaceborne hydrogen maser
Morikawa, T. / Takahei, K. / Uehara, M. / Mori, K. / Tsuda, M. | 2000
52
The dual mixer time difference at IEN
Brida, G. | 2000
54
Spectral methods in investigations of superconducting open resonators
Afonin, D.G. / Kravchenko, V.F. | 2000
56
International comparison of power measurements at 62 GHz
Achkar, J. | 2000
58
International comparison for RF power in the frequency range up to 18 GHz
de Vreede, J.P.M. / Korfage-Janssen, W. | 2000
60
International comparison of a pulse calibrator used in high voltage impulse calibration
Yi Li, / Rungis, J. / McComb, T.R. / Lucas, W. | 2000
62
International comparison of a resistive divider at 100 kV DC
Li, Y. / Rungis, J. / Jing, T. / Su, T.H. / Chen, I.P. / Lee, D. / Shimizu, K. | 2000
64
Intercomparison between PTB and UkrCSM of the calibration of standard current transformers and standard voltage transformers
Kopshyn, V.V. / Kikalo, V.N. / Butenko, O.G. / Surdu, M.N. / Ornatsky, O.A. / Vogel, H. / Eckardt, H. | 2000
66
International comparison of 50/60 Hz power (1996-1999)
Oldham, N. / Nelson, T. / Bergeest, R. / Carranza, R. / Gibbes, M. / Jones, K. / Kyriazis, G. / Laiz, H. / Liu, L. / Lu, Z. et al. | 2000
68
High resistance comparison among KRISS, VNIIM and NIM
Kwang Min Yu, / Young Tae Park, / Je Cheon Ryu, / Kwon Su Han, / Semenov, Yu.P. / Litvinov, B. / Haiming, S. | 2000
70
A study on the measurements of clock difference using 10 kHz and 1 pps signal
Chang Bok Lee, / Sung Hoon Yang, / Young Bum Kim, / Yang Sup Song, | 2000
72
Uncertainty evaluation of GPS common-view time transfer and frequency stability measurements
Zhongning Dai, / Chua, H.A. / Neo, H. | 2000
74
Time transfer using GPS carrier phase with multi-channel common-view
Tu, K.-Y. / Liao, C.-S. / Chang, F.-R. / Wang, L.-S. | 2000
76
A long term time and frequency transfer by GPS CP over a very long baseline
Dudle, G. / Overney, F. / Prost, L. / Springer, T. / Dach, R. / Schildknecht, Th. | 2000
78
Some aspects of GPS receiver application
Kleyman, A.S. / Solovyov, V.S. / Talamanov, S.A. | 2000
80
Reinforcing a telephone synchrony network in Mexico using the GPS common-view technique
Molina, V. / Lopez, J.M. / Jardon, H. | 2000
82
Measurement assurance in traceable time dissemination
Shan, Y. / Chua, H.A. | 2000
84
Traceability of national standard of frequency and its distribution in Slovenia
Lapuh, R. / Svetik, Z. | 2000
86
Two-way satellite time transfer network in Pacific Rim region
Imae, M. / Hosokawa, M. / Imamura, K. / Yukawa, H. / Shibuya, Y. / Kurihara, N. / Fisk, P.T.H. / Lawn, M.A. / Li Zhigang, / Li Huanxin, et al. | 2000
88
Measurement of time delay for a transmission line in frequency domain
Yao, A. / Yao-Huang Kao, | 2000
90
Uncertainty analysis of a DVM-based quantum Hall measurement set-up
Rietveld, C. / Van Mullem, C.J. | 2000
92
A quantum Hall cryogenic current comparator resistance bridge
Jones, K. / Early, M.D. | 2000
94
Establishment of resistance traceability chain for Croatian resistance standards
Butorac, J. / Malaric, R. / Lenicek, I. | 2000
96
Cryogenic current comparator implementation at CENAM
Sanchez, C. / Aviles, D. / Hernandez, D. / Duran, G. | 2000
98
Traceability of the 10 k/spl Omega/ standard at IEN
Boella, G. / Capra, P. / Cassiago, C. / Cerri, R. / Reedtz, G.M. / Sosso, A. | 2000
98
Traceability of the 10 kOmega Standard at IEN
Boella, G. / Capra, P. / Cassiago, C. / Cerri, R. / Marullo Reedtz, G. C. / Sosso, A. | 2000
100
An improved CCC and QHR system for resistance standards metrology
Good, J.A. / Owczarkowski, M. / Holubar, T. | 2000
102
100 Ohm transfer standard
Satrapinski, A. / Seppa, H. | 2000
104
A sealed NML 1 ohm resistor
Pritchard, B.J. | 2000
106
New group resistance standards
Litvinov, B. / Ploshinsky, A. / Semyonov, Y. | 2000
107
Imaging of Si-Crystal Lattice by Phase-Contrast X-Ray Microscopy
Bergamin, A. / Cavagnero, G. / Mana, G. / Massa, E. / Zosi, G. | 2000
107
Imaging of Si-crystal lattice by phase-contrast X-ray microscopy [for Avogadro constant determination]
Bergamin, A. / Cavagnero, G. / Mana, G. / Massa, E. / Zosi, G. | 2000
109
A New Scanning X-Ray Interferometer
Bergamin, A. / Cavagnero, G. / Mana, G. / Massa, E. / Zosi, G. / Leistner, A. J. / Pavlovic, E. P. | 2000
109
A new scanning X-ray interferometer [for basic physical constants determination]
Bergamin, A. / Cavagnero, G. / Mana, G. / Massa, E. / Zosi, G. / Leistner, A. / Pavlovic, E. | 2000
111
Accurate nuclear transition data determined by prompt (n,/spl gamma/)-spectrometry
Paul, A. / Rottger, S. / Zimbal, A. / Keyser, U. | 2000
111
Accurate Nuclear Transition Data Determined by Prompt (n,gamma)-Spectrometry
Paul, A. / Rottger, S. / Zimbal, A. / Keyser, U. | 2000
113
Simulation of convective currents in density measurements of silicon spherical standards [for Avogadro constant redetermination]
Peuto, A. / Pettonuso, S. / Perosino, A. / Zosi, G. | 2000
113
Simulation of Convective Currents in Density Measurements of Silicon Spherical Standards
Peuto, A. M. / Pettorruso, S. / Perosino, A. / Zosi, G. | 2000
115
Silicon molar volume discrepancy: perfection of the NRLM crystal [for Avogadro constant determination]
Nakayama, K. / Fujimoto, H. / Ishikawa, T. / Takeno, H. | 2000
115
Silicon Molar Volume Discrepancy: Perfection of the NRLM Crystal
Nakayama, K. / Fujimoto, H. / Ishikawa, T. / Takeno, H. | 2000
117
Density Comparison Measurement of Silicon by Pressure of Flotation Method
Waseda, A. / Fujii, K. | 2000
117
Density comparison measurement of silicon by pressure of flotation method [for Avogadro constant determination]
Waseda, A. / Fujii, K. | 2000
119
Measurements of volume and density of the new IMGC silicon standard [for Avogadro constant determination]
Sacconi, A. / Peuto, A. / Panciera, R. / Pasin, W. / Pettorruso, S. | 2000
119
Measurements of Volume and Density of the New IMGC Silicon Standard
Sacconi, A. / Peuto, A. M. / Panciera, R. / Pasin, W. / Pettorruso, S. | 2000
121
A Bragg Silicon Lattice Comparator
Alasia, F. / Basile, G. / Becker, P. / Kuetgens, U. / Stumpel, J. / Servidori, M. / Haertwig, J. | 2000
121
A Bragg silicon lattice comparator [for Avogadro constant determination]
Alasia, F. / Basile, G. / Becker, P. / Kuetgens, U. / Stuempel, J. / Servidori, M. / Haertwig, J. | 2000
123
A microprocessor based electronic high performance capacitor
Hagiwara, N. / Wada, T. / Kimura, Y. | 2000
125
New stable 10-pF gas-dielectric capacitors
Rae Duk Lee, / Han Jun Kim, / Semenov, Y.P. | 2000
127
Precise measurement of dielectric constants of liquids using the principle of the cross capacitor
Rae Duk Lee, / Han Jun Kim, / Semenov, Y.P. | 2000
129
Zerodur 0.5 pF toroidal cross capacitor
Small, G.W. / McGregor, M.C. | 2000
131
Fused silica dielectric 100 pF capacitor
Small, G.W. / Ku, Y.S. / Cameron, G.C. | 2000
133
Fundamental Determination of the Loss Factor of 1 muF Capacitors at 1 kHz
Ramm, G. / Moser, H. | 2000
133
Fundamental determination of the loss factor of 1 /spl mu/f capacitors at 1 kHz
Ramm, G. / Moser, H. | 2000
135
Reproduction of the loss angle unit of VNIIM
Klionskiy, M.D. / Semenov, Y.P. | 2000
137
A new multivalue inductance standard based on equivalents with the switched capacitors
Egorov, P.M. | 2000
139
The national inductance standard in NIM
Wang Xin, / Lu Wenjun, / Din Cheng, / He Xiaobing, / Shao Fang, | 2000
141
Automatic setup for inductance measurement at IEN
Callegaro, L. / D'Elia, V. | 2000
143
Temperature control system for inductance standard
Gulmez, Y. / Gulmez, C. / Turhan, E. / Ozkan, T. | 2000
145
The Strontium Single Ion Standard: Application to Optical Frequency Measurements of the 385 THz Rb Two-Photon Transition and the 474 THz I~2/HeNe Standard
Madej, A. A. / Bernard, J. E. / Siemsen, K. J. / Marmet, L. / Latrasse, C. / Touahri, D. / Poulin, M. / Allard, M. / Tetu, M. | 2000
145
The strontium single ion standard: application to optical frequency measurements of the 385 THz Rb two photon transitions and the 474 THz I/sub 2//He-Ne standard
Madej, A.A. / Bernard, J.E. / Siemsen, K.J. / Marmet, L. / Latrasse, C. / Touahri, D. / Poulin, M. / Allard, M. / Tetu, M. | 2000
147
High-Resolution Spectroscopy of the 435 nm ^2S~1~/~2 - ^2D~3~/~2 Transition in Trapped ^1^7^1Yb^+
Tamm, C. / Buhner, V. | 2000
147
High-resolution spectroscopy of the 435 nm /sup 2/S/sub 1/2/-/sup 2/D/sub 3/2/ transition in trapped /sup 171/Yb/sup +/
Tamm, C. / Buhner, V. | 2000
149
Suppression of spurious phase shifts in an optical frequency standard
Trebst, T. / Binnewies, T. / Helmcke, J. / Riehle, F. | 2000
151
Femtosecond optical clock
Bagayev, S.N. | 2000
152
Effect of a back gate on the AC characteristics of quantum Hall devices
Delahaye, F. / Kibble, B.P. / Zarka, A. | 2000
154
Bulk and edge phenomena in AC quantum Hall effect?
Schurr, J. / Melcher, J. / Von Campenhausen, A. / Pierz, K. / Hein, G. / Ahlers, F.-J. | 2000
156
AC QHR loop measurements
Inglis, A.D. / Wood, B.M. / Cote, M. / Young, R.B. | 2000
158
Frequency dependence of the AC quantum Hall effect; comparison of data from two laboratories
Giblin, S.P. / Awan, S.A. / Williams, J.M. / Schurr, J. / Melcher, J. / Von Campenhausen, A. / Pierz, K. / Hein, G. | 2000
160
A generalised treatment of the calibration and measurement for vector indicating microwave reflectometers
Cox, M.G. / Dainton, M.P. / Harris, P.M. / Ridler, N.M. / Young, P.R. | 2000
162
An efficient broadband method for equivalent source reflection coefficient measurements
Torok, A. / Janik, D. / Peinelt, W. / Stumpe, D. / Stumper, U. | 2000
164
Evaluation of uncertainty due to excess heating by an adiabatic line in calorimetric measurement of RF power
Inoue, T. | 2000
166
NIST 0.05-50 GHz direct comparison power calibration system
Juroshek, J.R. | 2000
171
The Role of Fundamental Constants in the International System of Units (SI): Present and Future
Taylor, B. N. | 2000
171
Metrology and the Universe
Ekers, R. | 2000
172
A new four terminal-pair bridge for impedance measurements at frequencies up to 1 MHz
Awan, S.A. / Kibble, B.P. / Robinson, I.A. / Giblin, S.P. | 2000
174
Octofilar resistors with calculable frequency dependence
Bohacek, J. / Wood, B.M. | 2000
176
Intercomparison of resistance standards with calculable frequency dependence for the characterisation of quantum Hall devices
Melcher, J. / Bohacek, J. / Riha, J. / Von Campenhausen, A. / Pesel, E. | 2000
178
A power-frequency current-comparator-based direct-reading four-terminal resistance bridge
So, E. / Djokic, B. | 2000
180
The "Avogadro" problem: summary of tests with null results
Becker, P. / Kuetgens, U. / Stumpel, J. | 2000
182
Density measurements of silicon crystals by hydrostatic weighing
Fujii, K. / Waseda, A. / Kinoshita, M. / Tanaka, M. | 2000
184
Determination of the Avogadro constant from precision density measurements on a silicon sphere
Kenny, M.J. / Walsh, C.J. / Leistner, A.J. / Fen, K. / Giardini, W.J. / Wielunski, L.S. / Ward, B.R. | 2000
186
The molar volume of silicon: sometimes materials are not what we would like them to be
de Bievre, P. / Valkiers, S. / Taylor, P.D.P. / Becker, P. / Bettin, H. / Pento, A. / Pettorruso, S. / Fujii, K. / Waseda, A. / Tanaka, M. et al. | 2000
188
Cryogenic sapphire oscillator with exceptionally high frequency stability
Mann, A.G. / Chang Sheng, / Luiten, A.N. | 2000
190
Stability tests of three cryo-cooled sapphire oscillators
Wang, R.T. / Dick, G.J. | 2000
192
Fiber-coupled and monolithic cryogenic optical resonators
Brazmaier, C. / Pradl, O. / Muller, H. / Eiermann, B. / Peters, A. / Mlynek, J. / Schiller, S. | 2000
194
Progress towards measuring the standard quantum limit using a monolithic sapphire transducer
Locke, C.R. / Tobar, M.E. / Ivanov, E.N. | 2000
196
Observation and temperature measurement of the sympathetically cooled ions in an rf trap
Hasegawa, T. / Shimizu, T. | 2000
198
Absolute Frequency Measurement of the Cesium D~2 Line
Wu, G. / Cheng, W.-Y. / Shy, J.-T. | 2000
198
Absolute frequency measurement of the cesium D/sub 2/ line
Guilin Wu, / Wang-Yau Cheng, / Jow-Tsong Shy, | 2000
200
Sub-Doppler atomic velocities for an optical frequency standard by Maxwell's demon cooling
Binnewies, T. / Sterr, U. / Helmcke, J. / Riehle, F. | 2000
202
Progress Towards Absolute Frequency Measurement of the ^1^2^7I~2-Stabilized Nd:YAG Laser at 563.2 THz/532 nm
Ducos, F. / Hadjar, Y. / Rovera, D. / Zondy, J. J. / Acef, O. | 2000
202
Progress towards absolute frequency measurement of the /sup 127/I/sub 2/-stabilized Nd:YAG laser at 563.2 THz/532 nm
Ducos, F. / Hadjar, Y. / Rovera, D. / Zondy, J.J. / Aeef, O. | 2000
204
Development of a compact acetylene optical frequency standard at 1.5 /spl mu/m
Nakagawa, K. / Onse, A. / Okumura, K. / Yoda, J. | 2000
204
Development of a Compact Acetylene Optical Frequency Standard at 1.5 mum
Nakagawa, K. / Onae, A. / Okumura, K. / Yoda, J. | 2000
206
An optical frequency chain for absolute frequency measurement of the 445 THz strontium trapped ion frequency standard
Gill, P. / Huang, G. / Lea, S.N. / Margolis, H.S. | 2000
208
The UWA/PTB optical synthesizer: an update
Luiten, A.N. / Kovacich, R. / McFerran, J. | 2000
210
Development of an optical frequency interval divider centred at 709 nm
McFerran, J.J. / Luisen, A.N. | 2000
212
A Frequency Measurement System for an Optical Frequency Standard at 1.5 mum
Onae, A. / Okumura, K. / Yoda, J. / Nakagawa, K. / Kourogi, M. | 2000
212
A frequency measurement system for an optical frequency standard at 1.5 /spl mu/m
Onae, A. / Okumura, K. / Yoda, J. / Nakagawa, K. / Kourogi, M. | 2000
214
Progress in linking the farad and the R/sub K/ value to the SI units at BNM-LCIE
Trapon, G. / Thevenot, O. / Lacueille, J.C. / Poirier, W. / Fhima, H. / Geneves, G. | 2000
214
Progress in Linking the Farad and the R~K Value to the SI Units at BNM-LCIE
Trapon, G. / Thevenot, O. / Lacueille, J. C. / Poirier, W. / Fhima, H. / Geneves, G. | 2000
216
First results of a calculable capacitor at KRISS
Rae Duk Lee, / Han Jun Kim, / Semenov, Yu.P. | 2000
218
Maintenance and development of the capacitance unit at CENAM
Moreno, J.A. / Hanke, R. | 2000
220
Measurement of complex voltage ratios by means of precise digital voltmeters
Ilic, D. / Butorac, J. | 2000
222
Inductive voltage dividers comparison with a vector voltmeter
Callegaro, L. / Serazio, D. | 2000
224
An inductive voltage divider for international comparisons
Fiander, J.R. / Small, G.W. | 2000
226
Comparison of high frequency AC-DC voltage transfer standards at NRC, VSL, PTB and NIST
Filipski, P.S. / Van Mullem, C.J. / Janik, D. / Klonz, M. / Kinard, J.R. / Lipe, T. / Waltrip, B. | 2000
228
Characteristics of Single Junction Thermal Converters
Bubanja, V. / Early, M. D. / Sasaki, H. | 2000
228
Characterisitics of single junction thermal converters
Bubanja, V. / Early, M.D. / Sasaki, H. | 2000
230
Evaluation of AC-DC transfer standards in the mV-range
Rudler, K.-E. / Tarasso, V. | 2000
232
Automatic measurements of the voltage dependence of range resistors for AC-DC thermal converters
Pogliano, U. / Bosco, G.C. | 2000
234
Calibration of AC voltage
Jones, R.G. / Clarkson, P. / Wheaton, A.J. / Wright, P.S. | 2000
236
A standard calibration system for geomagnetometers
Shifrin, V.Ya. / Alexandrov, E.B. / Chikvadze, T.I. / Kalabin, V.N. / Yakobson, N.N. / Khorev, V.N. / Park, P.G. | 2000
238
Microscope compatible coils for generation of the uniform flat rotating magnetic field
Andreev, A.K. | 2000
240
Miniature DC SQUID devices for the detection of single atomic spin-flips: scaling of flux sensitivity with device dimension
Pakes, C.I. / Josephs-Franks, P.W. / Reed, R.P. | 2000
242
Magnetic flux density standard for low magnetic field at KRISS
Park, P.G. / Shifrin, V.Ya. / Khorev, V.N. / Kim, Y.G. | 2000
244
Nondestructive evaluation of aged 1Cr-1Mo-0.25V steel using first harmonics
Ryu, K.S. / Park, J.S. / Nahm, S.H. / Yu, K.M. / Kim, Y.B. / Son, D. | 2000
246
Intercomparison of magnetic flux density by means of field coil transfer standard
Weyand, K. | 2000
247
The numerical calculation of magnetic shielding effectiveness of comparator based on FEM
Zhijie Zhang, / Shiyan Ren, | 2000
249
North American interlaboratory comparison of 10 V Josephson voltage standards
Deaver, D. / Miller, W.B. / Pardo, L. / Jaeger, K. / Plowman, D. / Hamilton, C.A. | 2000
251
Comparison of the Josephson voltage standards of VNIIM and PTB
Behr, R. / Niemeyer, J. / Katkov, A. | 2000
253
Recent developments in BIPM voltage standard comparisons
Reymann, D. / Witt, T.J. / Vrabcek, P. / Tang, Y.H. / Hamilton, C.A. / Katkov, A. / Mendeleyev, D.I. / Jeanneret, B. / Power, O. | 2000
255
Improvement of the 10 volt Josephson array voltage standard at the BEV by semiautomated computer control
Waldmann, W. / Riegelbauer, H. / Gutmann, P. | 2000
257
Interlaboratory comparison of Josephson Voltage Standards (JVS) between NIST and Lockheed Martin Astronautics (LMA)
Tang, Y.H. / Miller, W.B. | 2000
259
Establishment of 10-V Josephson array voltage standard
Kyu-Tae Kim, / Jinhee Kim, / Se Il Park, / Yang Sup Song, | 2000
259
Establishment of a 10-V Josephson Array Voltage Standard
Kim, K.-T. / Kim, J. / Park, S. I. / Song, Y. S. | 2000
261
Responsivity calibration methods for 365 nm irradiance meters
Larason, T.C. / Brown, S.W. / Eppeldauer, G.P. / Lykke, K.R. | 2000
263
Response linearity test of biased 1337 traps
Balling, P. / Fox, N.P. | 2000
265
Optical heterodyne refractometry in the microwave range to 100 GHz
Fang, H. / Himbert, M. / Khelifa, N. / Juncar, P. / Pendrill, L.R. | 2000
267
Correction of the interpolation error of quadro-phase detection in interferometry
Smid, M. / Hakl, F. / Sebek, P. / Balling, P. | 2000
269
On a nonimaging optics approach to diode lasers collimation
Novero, C. | 2000
271
Simulation of electromagnetic wave interaction with long-period fiber Bragg gratings by using of non-traditional method of theoretical investigation
Mkrttchian, V. / Mkrtchyan, V.S. / Mkrtchyuan, K.V. / Eranosian, A. | 2000
273
Proceedings ISCC 2000. Fifth IEEE Symposium on Computers and Communications
| 2000
273
To Increase Reliability of Certification of Standard Geodetic Bases
Pushkaryov, G. P. / Kostrikov, A. L. / Kupko, V. S. | 2000
275
Expanding the bandwidth of an asymmetric TEM cell for EMC measurements
Chi, C.M. / Lao, R.R. | 2000
277
Traceable antenna-gain measurement in a single-antenna setup
Glimm, J. / Munter, K. / Pape, R. / Spitzer, M. | 2000
279
ETL open-area site for antenna measurement
Komiyama, K. / Morioka, T. | 2000
281
Measurements of antenna characteristics over different conducting planes
Morioka, T. / Komiyama, K. | 2000
283
An optically modulated field sensor to make TEM cells traceable to the NPL calculable standard dipole antenna
Loader, B. / Liang, W. / Alexander, M. / Gregory, A. | 2000
285
An Asymmetrical Sensor for Simultaneous Electric and Magnetic Field Measurements
David, V. / Cretu, M. / Salceanu, A. | 2000
285
An asymetrical sensor for simultaneous electric and magnetic field measurements
David, V. / Cretu, M. / Salceanu, A. | 2000
287
Accurate selective isotropic measuring system for electromagnetic fields in amplitude and phase
Jacquin, F. / Nicolas, E. | 2000
289
Potentiometric calibration of dc voltage- and resistance-ratios up to 1000 V
Kyu-Tae Kim, / Kwang Min Yu, | 2000
291
Construction and Evaluation of 100 MOmega Resistance Transfer Standard
Lindic, M. | 2000
291
Construction and evaluation of 100 M/spl Omega/ resistance transfer standard
Lindic, M. | 2000
293
High value resistance standards at ETL
Kinoshita, J. / Nakanishi, M. | 2000
295
A dual-balance high-resistance bridge in the range 1 T/spl Omega/ to 100 T/spl Omega/
Jarrett, D.G. | 2000
295
A Dual-Balance High-Resistance Bridge in the Range 1 TOmega to 100 TOmega
Jarrett, D. G. | 2000
297
High resistance measurement at NIM
Shao Haiming, / Liang Bo, / Dai Kenan, / Wang Hao, / Wu Hao, | 2000
299
Is linear regression good enough for determining bridge balance in precision high resistance measurements?
Chen, T.P. / Sim, T.Y. / Chua, S.W. / Liu, L.X. | 2000
301
Influence of connecting cables on the measurement uncertainty in calibration of resistance thermometers
Bojkovski, J. / Bergelj, F. / Pusnik, I. / Drnovsek, J. | 2000
303
Current dependence measurement of resistance using a cryogenic constant current source with linear output
Nakanishi, M. / Kinoshita, J. / Murayama, Y. / Endo, T. | 2000
305
Power dependence characteristics of metal foil type standard resistors
Zaslavsky, V. / Daniltchenko, N. / Sim, T.Y. | 2000
307
Calibration of a standard resistance using a standard platinum resistance thermometer
Valencia-Rodriguez, J. / Figueroa-Estrada, J.M. / Escamilla-Esquivel, A. / Martinez-Martinez, S. / Martinez-Guerrero, B. | 2000
309
Comparison of two cesium fountain primary frequency standards
Santarelli, G. / Abgrall, M. / Zhang, S. / Lemonde, P. / Laurent, Ph. / Clairon, A. | 2000
311
Accuracy evaluation of a cesium fountain primary frequency standard at NIST
Meekhof, D.M. / Jefferts, S.R. / Shirley, J.H. / Parker, T.E. | 2000
313
Characterization of a cold cesium source for PARCS: Primary Atomic Reference Clock in Space
Heavner, T.P. / Hollberg, L. / Jefferts, S.R. / Kitching, J. / Meekhof, D.M. / Robinson, H.G. / Sullivan, D.B. | 2000
315
Development of a cold cesium continuous fountain frequency standard
Joyet, A. / Berthoud, P. / Mileti, G. / Thomann, P. | 2000
317
A capacitance standard based on counting electrons
Keller, M.W. / Zimmerman, N.M. / Eichenberger, A.L. / Martinis, J.M. | 2000
319
The single electron R-pump: First experiment
Lotkhov, S.V. / Bogoslovsky, S.A. / Zorin, A.B. / Niemeyer, J. | 2000
321
Measurements of single electron transistor devices combined with a CCC: progress report
Gay, F. / de Wilde, Y. / Piquemal, F. / Geneves, G. | 2000
323
A highly stable tunable cryogenic capacitor
Overney, F. / Jeanneret, B. / Furlan, M. | 2000
325
On the choice of comparison reference values for the purpose of pair-wise comparison of laboratories
White, D.R. | 2000
327
Report on the CCEM comparison of 10 pF capacitance standards
Jeffery, A.-M. | 2000
329
NRC-PTB intercomparison of voltage transformer calibration systems for high voltage
So, E. / Latzel, H.-G. | 2000
331
International comparison GT/RF 86-1: electric field strengths, 27 MHz to 10 GHz
Kanda, M. / Camell, D. / Achkar, J. / Alexander, M. / de Vreede, J.P.M. / Borsero, M. / Yajima, H. / Chung, N.S. / Trzaska, H. | 2000
335
Josephson voltage standards-a review
Hamilton, C.A. | 2000
337
Meeting the challenge to keep electrical measurements consistent globally
Hebner, R. | 2000
339
DC voltage synthesis using a pulse-quantized Josephson voltage source
Benz, S.P. / Christian, L.A. / Burroughs, C.J. / Hamilton, C.A. | 2000
341
1 volt Josephson fast reversed dc source
Burroughs, C.J. / Benz, S.P. / Harvey, T.E. / Sasaki, H. | 2000
343
Development of Josephson voltage calibrator
Klushin, A.M. / Siegel, M. / Semerad, R. | 2000
345
Development of Josephson series arrays for a DC quantum voltmeter
Behr, R. / Grimm, L. / Funck, T. / Kohlmann, J. / Schulze, H. / Muller, F. / Niemeyer, J. | 2000
347
Absolute quantum efficiency measurements using correlated photons: A study of systematics
Migdall, A.L. | 2000
349
Superconducting transition-edge bolometer arrays for ultra-low power radiometry
Grossman, E.N. / Chervenak, J.A. / Irwin, K.D. / Reintsema, C.D. / Allen, C. / Moseley, S.H. | 2000
351
Pulse-handling capabilities of intersecting-waveguide type optical modulators/switches with curved electrodes
Nayyer, J. / Imai, Y. | 2000
353
Hybrid interferometer for control of three degrees of freedom
Lawall, J. / Howard, L. / Deslattes, R.D. / Chien-Ming Wu, | 2000
355
Development and evaluation of a high resolution measuring system for a switching impulse measurement
Hong Tang, / Bergman, A. | 2000
357
In-situ calibration of high voltage three-phase transformer loss measuring systems
So, E. / Hanique, E. | 2000
359
Influence of time delay in calibration systems for instrument transformers with digital output
Juvik, J.I. | 2000
361
Electro-optic sensor for measurement of DC fields in the presence of space charge
Cecelja, F. / Bordowsky, M. / Balachandran, W. | 2000
363
Automated DC voltage divider to calibrate voltages up to 1 kV
Sakamoto, Y. / Endo, T. / Shao, H. / Matsuzawa, S. | 2000
365
Automated self-calibration resistive divider for 10 V to 1 kV
Forest Shih-Sen Chien, / I-Pao Chen, / Kai-Jan Lin, | 2000
367
IEN calibration laboratory for high precision multifunction instruments
Cassiago, C. / Bosco, G.C. / La Paglia, G. | 2000
369
High stabilization of DC-current source on the basis of atomic magnetic resonance in helium-4 [for proton gyromagnetic ratio measurement]
Shifrin, V.Ya. / Park, P.G. / Khorev, V.N. / Kim, K.-T. / Song, Y.S. / Lee, S.K. | 2000
369
High Stabilization of DC-Current Source on the Basis of Atomic Magnetic Resonance in Helium-4
Shifrin, V. Y. / Park, P. G. / Khorev, V. N. / Kim, K.-T. / Song, Y. S. / Lee, S. K. | 2000
371
Least-squares fitting of the current drift for a DVM-based comparison method
de Aguilar, J.D. / Zorzano, R. / Rodriguez, M. | 2000
373
Making 1 attoamp measurements
Daire, A. | 2000
375
Calibration of multimeters as voltage ratio standards
Sosso, A. / Cerri, R. | 2000
377
Characterization of the travelling standard for an international comparison of AC-DC transfer difference in the millivolt range
Tarasso, V. / Rydler, K.-E. | 2000
379
Improvements in the PSB AC-DC transfer capabilities and a proposal for range extension
Liu, L.X. / Chua, S.W. / Chen, T.P. / Ang, C.K. / Sim, T.Y. | 2000
381
Improvements of the NMi VSL HF AC-DC transfer facilities
van Mullem, C.J. / Dessens, J.T. | 2000
383
A method to reduce the voltage dependence of high voltage thermal converters
Jiangtao Zhang, | 2000
385
Automated system for measuring AC-DC transfer difference of TVCs
Tuz, Yu. / Litvikh, V. | 2000
387
A new fabrication process for planar thin-film multijunction thermal converters
Wunsch, T.F. / Kinard, J.R. / Manginell, R.P. / Solomon, O.M. / Lipe, T.E. | 2000
389
Comparison between the SNS and SIS Josephson voltage standards at OFMET
Jeanneret, B. / Rufenacht, A. / Burroughs, C.J. | 2000
391
Microwave coupling to large series arrays of SNS ramp-type junctions for programmable voltage standards
Popel, R. / Muller, F. / Hagedorn, D. / Buchholz, F.-I. / Dolata, R. / Niemeyer, J. | 2000
393
Microwave properties of large SINIS series arrays for Josephson voltage standards of intrinsic stability
Kohlmann, J. / Schulze, H. / Behr, R. / Muller, F. / Krasnopolin, I.Y. / Niemeyer, J. | 2000
395
Development of a programmable bipolar Josephson-array voltage-standard
Liefrink, F. / Houtzager, E. / de Jong, G. / Teunissen, P. / Heimeriks, J.W. / Dyrseth, A.A. / Royset, A. / Johnsen, L. / Behr, R. / Kohlmann, J. et al. | 2000
397
Development of fast-switching Nb/Al/Nb SNS junctions for the AC Josephson voltage standard
Lacquaniti, V. / Maggi, S. / Monticone, E. / Polcari, A. / Rocci, R. / Steni, R. / Andreone, D. | 2000
399
Progress in Josephson voltage standard development
Hassel, J. / Seppa, H. / Gronberg, L. / Suni, I. / Helisto, P. | 2000
401
Measurement uncertainty in the 1/f noise region: Zener voltage standards
Helisto, P. / Seppa, H. / Rautiainen, A. | 2000
403
Measurement uncertainties arising from unpowered shipment of DC voltage references
Christian, L.A. / Chua, S.W. / Sim, T.Y. / Liu, L.X. | 2000
405
Gravitational force-a possible noise source of Zener standard under humidity change?
Liu, L.X. / Chua, S.W. / Sim, T.Y. | 2000
407
Applying humidity model to reduce uncertainty of voltage comparisons using Zener standards
Liu, L.X. / Sim, T.Y. / Tan, V.K.S. / Chua, H.A. / Chua, S.W. | 2000
409
Behavior of the travelling standards in the international comparisons of DC voltage ratio
Reedtz, G.M. / Cerri, R. | 2000
411
Precise current comparator for the calibration of high voltage standard transformers
Surdu, M.N. / Ornatsky, O.A. / Bondarchuk, S.A. / Goncharenko, O.V. / Karpov, I.A. / Kopshyn, V.V. / Kikalo, V.N. / Vogel, H. / Eckardt, H. | 2000
413
An electronic device for increasing the accuracy of high-voltage measuring transformers
Slomovitz, D. | 2000
415
Estimation of errors of voltage transformers on-site and the uncertainty of the estimate
Bergman, A. | 2000
417
100 kV DC voltage standard divider of the shielded type
Marx, R. | 2000
419
Capacitance and dissipation factor measurements under high voltage at BNM-LCIE
Gournay, P. | 2000
421
Analysis of the performances of a digitizer for peak measurement of lightning pulse
Fiorentin, P. | 2000
423
Design and optimization of an optical high electric field sensor
Barthod, C. / Passard, M. / Fortin, M. / Galez, C. / Bouillot, J. | 2000
425
An accurate calculation of the reference electric field nonuniformity
Pavic, A. / Stih, Z. / Ilic, D. | 2000
427
Improved modelling of the coaxial Kelvin balance
Wood, B.M. / Cote, M. | 2000
429
Comparison of capacitance with resistance by IVD-based quadrature bridge at frequencies from 50 Hz to 10 kHz
Hsu, J.C. / Yi-sha Ku, | 2000
431
Development and uncertainty estimation of bridges for the link between capacitance and the QHR at 1 kHz
Nakamura, Y. / Nakanishi, M. / Sakamoto, Y. / Endo, T. | 2000
433
Measurement of low impedances with digital techniques for current and voltage compensation
Wicht, R. | 2000
435
High-accuracy voltage and current transmission by a four-coaxial cable
Cabiati, F. / D'Elia, V. | 2000
437
A multi-frequency 4-terminal-pair AC bridge
Jeffery, A. / Shields, J.Q. / Shields, S.H. | 2000
439
Characterization of four-terminal-pair resistance standards: a comparison of measurements and theory
Elmquist, R.E. / Jeffery, A. / Jarrett, D.G. | 2000
441
Resistance standards with calculable frequency characteristic for calibration of autobalance RLC bridges
Horsky, J. / Volny, K. | 2000
443
200 kOmega AC Resistance Standard
Coogan, P. C. / Darlow, J. M. | 2000
443
200 k/spl Omega/ AC resistance standard
Coogan, P.C. / Darlow, J.M. | 2000
445
Noise-source stability measurements
Randa, J. / Dunleavy, L.P. / Terrell, L.A. | 2000
447
Effect of anomalously low voltage noise in measurement systems with cross-correlation signal processing
Ivanov, E.N. / Walls, F.L. | 2000
449
Frequency flicker limitation in dual oscillator phase noise measurement instruments
Groslambert, J. / Rubiola, E. / Brunet, M. / Giordano, V. | 2000
451
A broadband microwave total power radiometer
Nakano, H. / Inoue, T. / Kawakami, T. / Kato, Y. | 2000
453
Cryogenic noise parameter measurements of microwave devices
Rolfes, I. / Musch, T. / Schiek, B. | 2000
455
Precise Measurements on Dielectric Reference Liquids over the Temperature Range 5-50 ^oC Using Coaxial Line Methods
Gregory, A. P. / Etzel, S. / Clarke, R. N. | 2000
455
Precise measurements on dielectric reference liquids over the temperature range 5-50/spl deg/C using coaxial line methods
Gregory, A.P. / Etzel, S. / Clarke, R.N. | 2000
457
A novel open-resonator system for precise measurement of permittivity and loss-tangent
Afsar, M.N. / Hanyi Ding, | 2000
459
Whispering gallery method of measuring complex permittivity in highly anisotropic materials
Tobar, M.E. / Hartnett, J.G. / Ivanov, E.N. / Cros, D. / Blondy, P. | 2000
461
Sensor for the measurement of liquid permittivity using one measurement cell
Matko, V. | 2000
463
Do we know the wavelength of laser beams?
Massa, E. | 2000
465
Frequency Stabilization at ^1^2^7I~2 Doppler-broadened Line Center near 532 nm using Nd:YVO~4 Intracavity Doubled Lasers
Shen, N.-C. / Zang, E. J. / Cao, J.-P. / Li, C.-Y. | 2000
465
Frequency stabilization at /sup 127/I/sub 2/ Doppler-broadened line center near 532 nm using Nd:YVO/sub 4/ intracavity doubled lasers
Naicheng Shen, / Er Jun Zang, / Jianping Cao, / Chengyang Li, | 2000
467
Extension of frequency atlas of molecular iodine at 532 nm
Feng-Lei Hong, / Ishikawa, J. | 2000
469
Absolute Measurement of Hyperfine Splittings of ^1^2^7I~2 Lines at Lambda ≅ 633 nm for Improved Wavelength Standards
Simonsen, H. R. / Rose, F. | 2000
469
Absolute measurement of hyperfine splittings of /sup 127/I/sub 2/ lines at h/spl lambda//spl ap/633 nm for improved wavelength standards
Simonsen, H.R. / Rose, F. | 2000
471
Wavelength Standard in 543 nm and the Corresponding ^1^2^7I~2 Hyperfine Transitions
Cheng, W.-Y. / Shy, J.-T. | 2000
471
Wavelength standard in 543 nm and the corresponding /sup 127/I/sub 2/ hyperfine transitions
Wang-Yau Chang, / Jow-Tsong Shy, | 2000
473
Iodine-stabilized 1550 nm diode laser for optical fiber communication
Cheng, W.-Y. / Chang, H.-Y. / Lin, Y.-R. / Shy, J.-T. / Lin, T. / Chen, Y.-K. / Chou, M.-H. / Fejer, M.M. | 2000
475
Frequency modulation spectroscopy of iodine at 532 nm using a vibrating mirror
Tong-Long Huang, / Yan-Rung Lin, / Wang-Yau Cheng, / Jow-Tsong Shy, / Hai-Pei Liu, | 2000
477
On the use of conical reflectors in laser displacement interferometry
Vitsushkin, A.L. | 2000
479
Design of Nd:YAG/KTP laser at 532 nm [for displacement interferometry and frequency standard]
Khaleev, M.M. / Novikov, G.E. / Orlov, O.A. / Terekhov, S.S. / Ustyagov, V.I. | 2000
479
Design of Nd:YAG/KTP Laser at 532 nm
Khaleev, M. M. / Novikov, G. E. / Orlov, O. A. / Terekhov, S. S. / Ustyugov, V. I. / Chartier, J.-M. / Vitushkin, L. F. | 2000
480
Ion beam measurement with a HTS SQUID current comparator
Hao, L. / Macfarlane, J.C. / Gallop, J.C. | 2000
482
A cryogenic current comparator resistance ratio bridge for the range 10 k/spl Omega/ to 1 G/spl Omega/
Fletcher, N.E. / Williams, J.M. / Janssen, T.J.B.M. | 2000
482
A Cryogenic Current Comparator Resistance Ratio Bridge for the Range 10 kOmega to 1 GOmega
Fletcher, N. E. / Williams, J. M. / Janssen, T. J. B. M. | 2000
484
Progress in the development of a high-temperature superconducting CCC
Early, M.D. / Jones, K. / Staines, M.P. / Exley, R.R. | 2000
486
Transport behaviour of commercially available 100 /spl Omega/ standard resistors
Schumacher, B. / Warnecke, P. | 2000
486
Transport Behaviour of Commercially Available 100 Omega Standard Resistors
Schumacher, B. / Warnecke, P. | 2000
488
A high-temperature superconducting transmission line for cryogenic electrical metrology applications
Reintsema, C.D. / Kinard, J.R. / Lipe, T.E. | 2000
490
New ac-dc transfer step-up calibration and uncertainty calculation in PTB and INTI
Klonz, M. / Laiz, H. | 2000
492
Calibration of ac current shunts
Jones, R.G. / Clarkson, P. / Wheaton, A.J. | 2000
494
Use of precise digital voltmeters for ac voltage measurements
Ilic, D. / Butorac, J. / Kresic, M. | 2000
496
Traceable calibration of specific absorption rate (SAR) for mobile phone dosimetry
Liang, W. / West, P. / Loader, B. / Lees, K. / Gregory, A.P. / Clarke, R.N. | 2000
498
Novel Probes and Evaluation Procedures Providing Pseudo-Vector Information
Pokovic, K. / Schmid, T. / Frohlich, J. / Kuster, N. | 2000