The Cost of Test (English)
- New search for: Ambler, A.
- New search for: IEEE
- New search for: Ambler, A.
- New search for: IEEE
In:
Systems readiness technology conference; 2001 IEEE AUTOTESTCON proceedings
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515-523
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2001
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ISBN:
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ISSN:
- Conference paper / Print
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Title:The Cost of Test
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Contributors:Ambler, A. ( author ) / IEEE
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Conference:37th, Systems readiness technology conference; 2001 IEEE AUTOTESTCON proceedings ; 2001 ; Valley Forge, PA
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Published in:AUTOTESTCON -IEEE- ; 515-523
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Publisher:
- New search for: IEEE
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Publication date:2001-01-01
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Size:9 pages
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Remarks:Theme title: Revolutionary ideas in test. IEEE cat. no. 01CH37237
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ISBN:
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ISSN:
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Keywords:
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Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 2
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An architecture to implement Integrated Vehicle Health Management systemsKeller, K. / Wiegand, D. / Swearingen, K. / Reisig, C. / Black, S. / Gillis, A. / Vandernoot, M. et al. | 2001
- 16
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A software architecture for building interchangeable test systemsCheij, D. et al. | 2001
- 23
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ATLAS2K and the IVI Signal Interface-the framework for an open, modular and distributed ATS architectureNeag, I.A. / Ramachandran, N. et al. | 2001
- 38
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IEEE-P1552 packaging architecture for computer-busboard systems (PACS)Stora, M.J. / Droste, D. et al. | 2001
- 54
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A systems framework for transmitting information between design and testRhyne, R.T. / Barton, D.L. / Bukata, E. et al. | 2001
- 63
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The relation of test requirements models to other requirements modelsBarton, D.L. et al. | 2001
- 71
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Formal specification of testability metrics in IEEE P1522Sheppard, J.W. / Kaufman, M. et al. | 2001
- 83
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BSML: an application of XML to enhance boundary scan test data transportabilityRolince, D.E. et al. | 2001
- 92
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Generating test vectors from system requirementsAkkipeddi, S. / Alexander, P. et al. | 2001
- 105
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Recent developments in the NIST ac-dc difference calibration service for thermal transfer standardsLipe, T.E. et al. | 2001
- 115
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Method for testing and characterization of analog-digital systemZagursky, V. et al. | 2001
- 121
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Adaptive filtering for calibration of redundant signalsRay, A. / Phoha, S. et al. | 2001
- 137
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Passive fiber optic position sensor with digital encodingRice, T.J. / Childers, B.A. / Borinski, J.W. / Crotts, R.L. / Harman, R.M. / Boyd, C.D. et al. | 2001
- 137
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Passive Fiber Optic Position Sensors with Digital EncodingRice, T. / Childers, B. / Borinski, J. / Crotts, R. / Harmon, R. / Boyd, C. / IEEE et al. | 2001
- 149
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Window rip-up for faster testing and fault tolerance in FPGAsKataria, P. / Taylor, A.M. / Emmert, J.M. et al. | 2001
- 159
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Using thermal analysis to enhance fault isolation techniquesRolke, D.L. / Johnson, J. / Kilmer, B. et al. | 2001
- 168
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PIP-enhanced "at system" diagnosis on the flightlineOrlidge, L.A. et al. | 2001
- 179
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Application of vertical test commonality to PALADIN maintenanceGarcia, G. / Nichols, B. et al. | 2001
- 188
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IEEE-1149.x standards: achievements vs. expectationsUngar, L.Y. / Bleeker, H. / McDermid, J.E. / Hulvershorn, H. et al. | 2001
- 206
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Design for test using a multi-tiered, model based specification approachBukata, E. et al. | 2001
- 214
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Routing algorithms for programmable logic device design and manufacturing test developmentHeath, J.R. / Vocke, N.J. / Stroud, C.E. / Emmert, J. et al. | 2001
- 229
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Application of integrated diagnostic process to non-avionics systemsGartner, D.L. / Dibbert, S.E. et al. | 2001
- 239
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Improving automation and reuse in TLC testing through COTS-based architectureBagnasco, A. / Chirico, M. / Scapolla, A.M. / Amodei, E. et al. | 2001
- 250
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Fiber optic sensors for predictive health monitoringBorinski, J.W. / Boyd, C.D. / Dietz, J.A. / Duke, J.C. / Home, M.R. et al. | 2001
- 263
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Advanced test equipment for third generation FLIRsKelly, T.H. et al. | 2001
- 271
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Micromechanical measurement subsystemZagursky, V. / Zibinch, D. et al. | 2001
- 276
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Integrated circuit test sensors using semiconducting nanotubesWright, R.G. / Kirkland, L.V. / Zgol, M. / Keeton, S. / Adebimbe, D. et al. | 2001
- 284
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Spectral analysis in parallel structuresZagursky, V. / Zorin, V. et al. | 2001
- 289
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Tools and procedures for successful TPS managementJackson, P. et al. | 2001
- 306
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Commercial ATS program managementSchwarz, C. / Pothier, C. et al. | 2001
- 313
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A prime contractor's perspective on total ATS development and life cycle cost (LCC) support responsibilityLiosis, A.C. et al. | 2001
- 319
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The forces changing automatic testing for DoD depots and what lies aheadLaise, S.D. et al. | 2001
- 333
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Whither AI in test and diagnosis?Fenton, B. / McGinnity, T.M. / Maguire, L.P. et al. | 2001
- 352
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Model-based health trackingBos, A. et al. | 2001
- 365
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Improved diagnostic and prognostic assessments using health management information fusionRoemer, M.J. / Kacprzynski, G.J. / Schoeller, M.H. et al. | 2001
- 378
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AI-ESTATE: a declarative based logic calculatorGiarla, A.J. et al. | 2001
- 389
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Optimum performance comparative study of combined gas turbine partial oxidation cycle and reheat cycleAbdel-Rahim, Y.M. / Mohamed, H.A. et al. | 2001
- 401
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An open standard for Web-based condition-based maintenance systemsThurston, M.G. et al. | 2001
- 416
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Integrated reliability analysis, diagnostics and prognostics for critical power systemsTu, F. / Azam, M.S. / Shlapak, Y. / Pattipati, K. / Karanam, R. / Amin, S. et al. | 2001
- 441
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Effective turbine engine diagnosticsPettigrew, J.L. et al. | 2001
- 459
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The integration of virtual instruments into pipeline LPG network monitoring systemWang, O.L. et al. | 2001
- 468
-
ATLAS2K-The framework for precise and extensible signal descriptions in modern ATSEllis, K. / Delaney, D. / Gorringe, C. et al. | 2001
- 480
-
IEEE P1505 Receiver Fixture Interface (RFI) system standard update 6.0Stora, M.J. et al. | 2001
- 497
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The IVI foundation signal interface; a new industry standardGeathers, G.E. et al. | 2001
- 504
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A mixed-signal framework and standard for high-frequency timing measurementsSoma, M. et al. | 2001
- 515
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The cost of testAmbler, A. et al. | 2001
- 524
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Recovering faulty processing elements to enhance reliability and lifecycle in VLSI processor arraysStroud, C.E. / Emmert, J.M. / Taylor, A.M. / Ferry, J.T. et al. | 2001
- 524
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Recovering Fault Processing Elements to Enhance Reliability and Lifecycle in VLSI Processor ArraysStroud, C. E. / Emmert, J. M. / Taylor, A. M. / Ferry, J. T. / IEEE et al. | 2001
- 532
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A process and tool for determining the cost/benefit of prognostic applicationsKeller, K. / Simon, K. / Stevens, E. / Jensen, C. / Smith, R. / Hooks, D. et al. | 2001
- 545
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TPS Precision and AccuracyVoigt, K. A. / Heyn, W. C. / IEEE et al. | 2001
- 545
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TPS precision & accuracyVoigt, K.A. / Heyn, W.C. et al. | 2001
- 559
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PROMIS methodology for prognostic health managementSmeulers, J.P.M. / Zeelen, R. / Bos, A. et al. | 2001
- 569
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Feedback and feedforward approaches in technical diagnosticsSkormin, V.A. et al. | 2001
- 584
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Paladin's prognostic/diagnostic interface unit (P/DIU) enhancement effortJonsson, P.J. et al. | 2001
- 593
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Residual stress measurement of thermal barrier coatings using laser fluorescence technique and their life predictionJordan, E.H. / Sohn, Y.H. / Xie, W. / Gell, M. / Xie, L. / Tu, F. / Pattipati, K.R. / Willett, P. et al. | 2001
- 605
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XML TPS data exchangeWegener, S. / Davis, D. et al. | 2001
- 616
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Parallel analog functional testViehland, J. / Fairbanks, T. et al. | 2001
- 625
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Augmenting legacy military ate for functional test using NxTest technologyOrlet, J.L. / Murdock, G.L. et al. | 2001
- 632
-
Re-configurable hardware for "synthetic" wideband instrumentsHoward, H. / Cruger, F. et al. | 2001
- 649
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ATS software design patternsToal, R.J. / Hayes, R.G. et al. | 2001
- 658
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Visual programming versus textual programming in automatic testing and diagnosisNeag, I.A. / Tyler, D.F. / Kurtz, W.S. et al. | 2001
- 672
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Developing visual component library for a graphical programming platform using object-orientationWang, L.L. et al. | 2001
- 679
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AI-ESTATE model editing in a component based ATSGiarla, A.J. / Meech, D. et al. | 2001
- 692
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Active aircraft fault detection and isolationGlavaski, S. / Elgersma, M. et al. | 2001
- 706
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An application of diagnostic inference modeling to vehicle health managementBartolini, A. / Sheppard, J.W. / Munns, T.E. et al. | 2001
- 718
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Vehicle health management research for legacy and future operational environmentsFaas, P. / Schroeder, J.B. / Smith, G. et al. | 2001
- 730
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Monitoring functional integrity in critical control computers subjected to electromagnetic disturbances during laboratory testsEure, K.W. / Belcastro, C.M. / Weinstein, B. et al. | 2001
- 740
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Instrumenting embedded test software to support system integration, factory production and depot repairVash, J.R. et al. | 2001
- 746
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Mitigating COTS obsolescence in military testMarion, R.L. et al. | 2001
- 757
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The re-configurable ID [interface devices]Munoz, M.G. et al. | 2001
- 757
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The Reconfigurable IDMunoz, M. G. / IEEE et al. | 2001
- 770
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EOTS to EO CASS rehost technical solutionsRaney, R.L. et al. | 2001
- 780
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Determining how to do prognostics, and then determining what to do with itGreitzer, F.L. / Hostick, C.J. / Rhoads, R.E. / Keeney, M. et al. | 2001
- 793
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Semantic requirements on information integration for diagnostic maturationWilmering, T.J. et al. | 2001
- 808
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Maintenance data mining and visualization for fault trend analysisWright, R.G. / Kirkland, L.V. / Cicchiani, J. / Deng, Y. / Dowd, N. / Hartmuller, T. / Urchasko, J. et al. | 2001
- 816
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On quality of test sets: relating fault coverage to defect coverageD'souzat, A.L. / Hsiao, M.S. et al. | 2001
- 827
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Full-scale testing of fuselage panelsBakuckas, J.G. / Bigelow, C.A. / Tan, P.W. / Awerbuch, J. / Lau, A.C. / Tan, T.M. et al. | 2001
- 847
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Optical fiber-based corrosion sensor systems for health monitoring of aging aircraftCooper, K.R. / Elster, J. / Jones, M. / Kelly, R.G. et al. | 2001
- 857
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Fault prognosis using dynamic wavelet neural networksVachtsevanos, G. / Wang, P. et al. | 2001
- 871
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Digital tooling for major structural repair [of aircraft]Boyer, L.P. et al. | 2001
- 871
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Digital Tooling for Major Structural RepairBoyer, L. P. / IEEE et al. | 2001
- 881
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Instrument replacements and obsolescence issues of legacy test systems [for avionics]Somerville, J.M. et al. | 2001
- 881
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Instrument Replacements and Obsolescence Issues of Legacy Test SystemsSomerville, J. M. / IEEE et al. | 2001
- 901
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Replacing legacy digital test instrumentationHutchinson, J.A. / Earley, D. et al. | 2001
- 913
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A methodology for addressing support equipment obsolescence [ATE]Craig, R.W. et al. | 2001
- 913
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A Methodology for Addressing Support Equipment ObsolescenceCraig, R. W. / IEEE et al. | 2001
- 923
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VXI LVDT simulation COTS resource augments legacy commercial airline industry ATEJohnson, M.W. / Dayton, D.W. et al. | 2001
- 932
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Next generation test support systems for the aircraft life cycleBaltes, E. et al. | 2001
- 940
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Accelerated evolution of the system support paradigmScully, J.K. et al. | 2001
- 951
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Logistics Control and Information Support (LOCIS) demonstration and future plansHardenburg, G. / Curtis, C. et al. | 2001
- 962
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Lifecycle Operational Flight Program (OFP) loading support for the C-17 Globemaster III weapon systemEcklund, R. / Liosis, A.C. et al. | 2001
- 978
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An algorithm for diagnostic reasoning using TFPG models in embedded real-time applicationsHoward, L. et al. | 2001
- 978
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Real-Time ApplicationsHoward, L. / IEEE et al. | 2001
- 988
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Remote diagnosis server architectureSomnath, D. / Ghoshal, S. et al. | 2001
- 999
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Implementation strategy for AI-ESTATE compliance in the Remote Diagnosis Server (RDS) frameworkGhoshal, S. / Deb, S. et al. | 2001
- 1015
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A singular pencil model fault diagnosis strategy for an industrial processXiaochun George Wang, / Wei Liu, et al. | 2001
- i
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2001 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. (Cat. No.01CH37237)| 2001
- xxvi
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Author index| 2001