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    Correction of chromatic and spherical aberration using a Wien filter (English)

    In: European congress on electron microscopy ; I151-I152  ; 2000

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    Table of contents conference proceedings

    The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.

    1437
    SEM resolution improvement at low voltage with gun monochromator
    Barth, J. E. / Nykerk, M. D. / Mook, H. W. / Kruit, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1439
    Construction and characterisation of a TEM specimen holder for in situ application of magnetic in-plane fields
    Uhlig, T. / Heumann, M. / Schneider, M. / Hoffmann, H. / Zweck, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1441
    On the enhancement factors for electron field emitters
    Edgcombe, C. / Valdre, U. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1443
    Investigation of an EuS-coated cooled field emitter for application in state on the art electron microscopes
    Wittel, H. / Schafer, A. / Hasselbach, F. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1445
    Test specimens for SEM
    Matejka, F. / Ryzi, Z. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1447
    Field emission SEM with a newly developed FEGUN and a conical strongly excited objective lens
    Kazumori, H. / Yamada, A. / Mita, M. / Nokuo, T. / Saito, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1451
    On actual questions in filtering and inelastic interactions
    Jouffrey, B. / Schattschneider, P. / Hebert, C. / Nelhiebel, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1455
    Performance of detector elements for electron microscopes
    Schauer, P. / Autrata, R. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1459
    Design of a monochromator for electron sources
    Kahl, F. / Rose, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1461
    First development step and test of the SESAM/SATEM
    Kujawa, S. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1463
    Software for the analysis and design of imaging energy filters with homogeneous and inhomogeneous bending magnets
    Munro, E. / Rouse, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1465
    Performance data of a new 2048 x 2048 pixel slow-scan CCD camera for TEM
    Hiller, S. A. / Kabius, B. / Probst, W. / Troster, H. / Trendelenburg, M. / Crucifix, C. / Trondle, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1467
    Geometric distortion correction for imaging plates using reflected light signal improves gain normalization and DQE
    Bele, P. / Ochs, R. / Schroder, R. R. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1469
    Cryodetectors for high resolution X-Ray spectroscopy
    Hohne, J. / Buhler, M. / Hertrich, T. / Hess, U. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1471
    Scanning electron microscopy of semiconductor multilayers using a converter of backscattered electrons into secondary electrons
    Ascarelli, P. / Capelli, E. / Corticelli, F. / Franchi, S. / Merli, P. G. / Migliori, A. / Morandi, V. / Rossi, C. / Salvatori, S. / Valdre, A. et al. | 2000
    1473
    Simulation of electron trajectories in the 3D field of two coupled hemispherical electrostatic deflectors
    Huber, A. / Plies, E. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1475
    New possibilities of SEBIV mode in SEM
    Degel, B. / Kienle, M. / Plies, E. / Rau, E. I. / Zhu, S. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1477
    Detection of the angular distribution of the signal electrons in VLESEM
    Horacek, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1479
    Direct electron exposed silicon detectors in EELS
    Orsholm, C. / Scillag, S. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1481
    Auger microscopy with a parallel acquisition spectrometer
    Jacka, M. / Kale, A. / Tyndall, M. / Prutton, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1483
    Elemental mapping using omega filter and imaging plate
    Shindo, D. / Ikematsu, Y. / Lee, C.-W. / Murakami, Y. / Sugiyama, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1485
    New frame-transfer wide-angle slow-scan CCD camera allows recording of distortion-free images for digital montages
    Hiller, S. A. / Probst, W. / Seybold, V. / Zellmann, E. / Kabius, B. / Trondle, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1487
    Combined TEM and CL of self-assembled CdSe quantum dots
    Preis, H. / Muller, P. / Fuchs, K. / Kaiser, S. / Gebhardt, W. / Zweck, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1491
    Recent achievements in multi-keV X-ray microscopy
    Susini, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1495
    Amplitude and phase contrast soft X-ray cryo-microscopy of biological samples
    Schneider, G. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1499
    New aspects of coherent hard X-ray imaging
    Cloetens, P. / Ludwig, W. / Guigay, J. P. / Schlenker, M. / Baruchel, J. / Van Dyck, D. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1503
    Synchrotron radiation scanning photoemission microscopy: advances and applications
    Barinov, A. / Casalis, L. / Gregoratti, L. / Gunther, S. / Marsi, M. / Kiskinova, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1507
    Quantitative, chemical state mapping of wood composites via scanning X-ray microscopy
    Buckley, C. / Phanopoulos, C. / Khaleque, N. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1509
    Applications of high resolution microcalorimeter type X-Ray spectrometers in material analysis
    Hohne, J. / Buhler, M. / Hertrich, T. / Hess, U. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1511
    One plasma focus device as possible soft X-ray source for microscopy
    Antanasijevic, R. / Joksimovic, D. / Vukovic, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1515
    Environmental scanning electron Microscopy - taking SEM into the future
    Donald, A. M. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1519
    Imaging of electronic structure: achievements, competition and challenges
    Howie, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1523
    Biomedical EM under change: recent developments and trends
    Maunsbach, A. B. / Czechoslovak Society for Electron Microscopy et al. | 2000
    1527
    EMS in the European framework
    Carrascosa, J. L. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I1
    On the development of electron microscopes in Brno
    Delong, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I7
    Electron microscopy at the milleniu
    Hawkes, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I13
    Prospects of quantitative high resolution electron microscopy
    Van Dyck, D. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I19
    High-performance electron microscopes of the future
    Rose, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I25
    Structural, magnetic and chemical surface electron microscopy with slow electrons
    Bauer, E. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I33
    Membrane protein structure and dynamics observed at high resolution by electron and atomic force crystallography
    Engel, A. / Heymann, B. J. / Muller, D. J. / Stahlberg, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I35
    Nanoscale Analysis by Energy Filtering TEM
    Mayer, J. / Plitzko, J. M. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I43
    New experiments in charged particle interferometry and quantum statistics
    Hasselbach, F. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I47
    Off-axis electron holography - the way to use
    Lichte, H. / Lehmann, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I49
    Electrons as waves - and what will come next?
    Tyc, T. / Lenc, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I51
    An electron antibunching experiment
    Kiesel, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I53
    Time-resolved observation in transmission electron microscopy using electron correlation measurement
    Osakabe, N. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I55
    Partial coherence and HREM image simulation
    Muller, H. / Schorsch, P. / Rose, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I57
    Assessment of the experimental constraints for phase contrast EM and complex object reconstruction
    Majorovits, E. / Nagayama, K. / Schroder, R. R. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I59
    Correction of the Fresnel diffraction caused by the biprism filament in phase-shifting electron holography
    Yamamoto, K. / Tanji, T. / Hirayama, T. / Hibino, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I61
    Complex electron microscopy
    Nagayama, K. / Danev, R. / Okawara, H. / Murata, K. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I63
    Off-axis electron holography of focused ion beam milled transistors
    Dunin-Borkowski, R. E. / Newcomb, S. B. / Doyle, D. / Deignan, A. / McCartney, M. R. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I65
    Miniaturized biprism interferometer for wide separation of the coherent beams
    Prochel, H. / Hasselbach, F. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I67
    Holographic studies of thin manganite films
    Lehmann, M. / Walter, T. / Dorr, K. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I69
    Inelastic electron holography
    Lichte, H. / Freitag, B. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I71
    Comparison of accuracy of electron holography and EELS on thickness measurement of amorphous SiO~2
    Lee, C.-W. / Ikematsu, Y. / Shindo, D. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I73
    Two-dimensional mapping of electrostatic potential in a SiC MESFET using electron holography
    Twitchett, A. C. / Lloyd, S. J. / Lehmann, M. / Midgley, P. A. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I77
    Recent trends in electron optics
    Munro, E. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I81
    SMART electron optics
    Preikszas, D. / Hartel, P. / Spehr, R. / Rose, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I85
    Design and manufacturing of magnetic electron optical systems with midsection symmetry
    Spehr, R. / Hartel, P. / Muller, H. / Preikszas, D. / Rose, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I87
    Computations of Wien filter properties and aberrations
    Lencova, B. / Vlcek, I. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I89
    High resolution imaging near zero Cs
    Chang, L. Y. / Chen, F. R. / Kai, J. J. / Kirkland, A. I. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I91
    Electron holography in the diffraction plane
    Zhou, F. / Plies, E. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I93
    An active vibration damping system
    Beierlein, R. / Hasselbach, F. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I95
    Quadrupole projector system with variable magnification for energy filtering transmission electron microscopes
    Gerheim, V. / Rose, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I97
    Outline of a variable-axis lens with arbitrary shift of the axis in one direction
    Schmid, P. / Janzen, R. / Rose, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I99
    Electron ray-tracing for numerical determination of aberrations
    Mynar, M. / Vasina, R. / Kolarik, R. / Lencova, B. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I101
    New CAD program for the design in electron optics
    Lencova, B. / Zlamal, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I103
    Perturbation methods in charged particle optics
    Radlicka, T. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I107
    Advances in atomic structure determination using the focal-series reconstruction technique
    Thust, A. / Jia, C. L. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I111
    Progress in structure analysis of crystal defects by quantitative HRTEM
    Schweinfest, R. / Ernst, F. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I115
    Image formation using incoherent scattering in a CTEM
    Anstis, G. R. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I117
    Extension of HRTEM resolution using Gerchberg-Saxton algorithm: application to grain boundary and interface
    Chen, F.-R. / Kai, J. J. / Chang, L. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I119
    Effect of the objective lens on the measurement of rapidly varying displacement fields from HRTEM images
    Hytch, M. / Plamann, T. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I121
    The effect of strain on chemically sensitive imaging with the (002) reflection in sphalerite type crystals
    Rosenauer, A. / Van Dyck, D. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I123
    Parallel realization of the simulated annealing algorithm and its applications to quantitative electron microscopy
    Li, S.-Y. / Wu, M.-Y. / Zhu, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I125
    Quantitative measurement of intensity profiles of equal thickness fringes of Si and MgO crystals and estimation of crystal potential
    Nishio, K. / Isshiki, T. / Okunishi, E. / Oikawa, T. / Kawasaki, M. / Endoh, H. / Shiojiri, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I127
    A Fourier space approach for calculating the electron optical phase shift of superconducting fluxons
    Beleggia, M. / Pozzi, G. / Tonomura, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I129
    Design aspects for an optimum DF STEM probe
    Van Aert, S. / Dekker, A. J. d. / Van Dyck, D. / van den Bos, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I131
    A quantitative evaluation of different STEM imaging modes
    Dekker, A. J. d. / Van Aert, S. / Van Dyck, D. / van den Bos, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I133
    Accurate measurements of atomic displacements in La~0~.~9Sr~0~.~1MnO~3 thin films grown on a SrTiO~3 substrate
    Geuens, P. / Lebedev, O. I. / Van Dyck, D. / Van Tendeloo, G. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I135
    Direct object data retrieval: an inversion of electron diffraction
    Scheerschmidt, K. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I137
    Influence of experimental parameters on the accuracy of lattice-distortion measurements directly from high-resolution micrographs
    Du, K. / Jin-Phillipp, N. Y. / Phillipp, F. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I139
    EELS thickness-measurement without spectrum acquisition
    Tanaka, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I141
    Contrast modulations in HRTEM images caused by crystal tilt
    Waitz, T. / Karnthaler, H. P. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I145
    Towards sub-Angstrom point resolution by correction of spherical aberration
    Haider, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I149
    Advances in Cs-corrected STEM
    Krivanek, O. L. / Dellby, N. / Lupini, A. R. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I151
    Correction of chromatic and spherical aberration using a Wien filter
    Steffen, T. / Tiemeijer, P. C. / Krijn, M. P. C. M. / Mentink, S. A. M. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I153
    Performance of the mirror corrector for an ultrahigh-resolution spectromicroscope
    Hartel, P. / Preikszas, D. / Spehr, R. / Rose, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I155
    An electrostatic achromat
    Henstra, A. / Krijn, M. P. C. M. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I157
    Electrostatic correction of the chromatic and spherical aberration of charged particle lenses
    Weissbaecker, C. / Rose, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I159
    Super resolution imaging of complex metal oxides
    Kirkland, A. I. / Sloan, J. / Meyer, R. / Dunin-Borkowski, R. E. / Hutchison, J. L. / Saxton, W. O. / Sayagues, M. J. / Tilley, R. J. D. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I161
    Validity of spherical aberration free focus condition
    Endoh, H. / Hashimoto, H. / Kumao, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I163
    The Triebenberg laboratory - designed for highest resolution electron microscopy and holography
    Lichte, H. / Schulze, D. / Lehmann, M. / Just, H. / Erabi, T. / Furst, P. / Gobel, J. / Hasenpusch, A. / Dietz, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I165
    A new method for the determination of the wave aberration function
    Meyer, R. R. / Kirkland, A. I. / Saxton, W. O. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I169
    Aspects of aberration correction in LVSEM
    Zach, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I173
    Scanning low and very low energy electron microscopy
    Mullerova, I. / Frank, L. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I177
    New aspects in LEEM and spectroscopic emission microscopy instrumentation
    Lilienkamp, G. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I181
    X-ray photoemission and low energy electron microscope
    Kolarik, V. / Vasina, R. / Mynar, M. / Bejdak, T. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I183
    Low voltage electron microscope II. - Applications
    Coufalova, E. / Delong, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I185
    Low energy electron scattering - Monte Carlo simulation
    Fitting, H. J. / Kuhr, J. C. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I187
    In-depth imaging in S.E.M
    Lehuede, P. / Appriou-Marciano, J. / Cazaux, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I189
    Double scintillation detector with a conical retarding lens for SEM
    Slowko, W. / Drzazga, W. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I191
    Quantitative topographic contrast in LV SEM
    Slowko, W. / Hejna, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I193
    Energy filtering scanning transmission electron microscopy at low voltage with a `simulated' spherical deflection analyzer
    Kramer, K. H. / Kohl, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I195
    Low voltage electron microscope III. - Present and future possibilities
    Stepan, P. / Delong, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I197
    Low voltage electron microscope I. - Design
    Delong, A. / Hladil, K. / Kolarik, V. / Pavelka, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I199
    Dimension measurement in a cathode lens equipped low-energy SEM
    Hutar, O. / Oral, M. / Mullerova, I. / Frank, L. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I201
    Application of low-energy backscattered electron detection in the inspection of semiconductor devices technology
    Hutar, O. / Oral, M. / Mullerova, I. / Romanovsky, V. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I203
    Signal detection near the critical energy of non-charging illumination in a low-energy SEM equipped with a cathode lens
    Kanova, J. / Frank, L. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I207
    Charging mechanisms in S.E.M.: from the secondary yield to the contrast of images?
    Cazaux, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I211
    Scanning electron microscopy at low vacuum in specimen chamber
    Autrata, R. / Jirak, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I217
    Possibilities of evaluation of the influence of conditions in the specimen chamber on the quality of imaging in environmental SEM
    Michlek, M. / Jirak, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I219
    ESEM as a routine tool for failure analysis in industry
    van der Wal, D. / Baken, E. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I221
    ESEM and TEM investigations on experimentally corroded synthetic zirconolite crystals and their replacing secondary phases
    Malmstrom, J. / Reusser, E. / Guggenheim, R. / Duggelin, M. / Mathys, D. / Giere, R. / Lumpkin, G. R. / Blackford, M. G. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I223
    Structure degradation of austenitic stainless steels as effect of corrosion fatigue
    Palka, K. / Surowska, B. / Weronski, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I225
    Absorbed electron imaging of non-conductive samples in low-vacuum SEM
    Hellum, B. / Reme, P. / Hansen, L. U. / Johnsen, P. O. / Hjelen, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I227
    SEM analysis of corrosion degradation on tinplate substrates
    Zumelzu, E. / Vera, A. / Cabezas, C. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I229
    Charging effects in S.E.M.: role of the working distance
    Grillon, F. / Cazaux, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I231
    Studies of biological specimens by environmental scanning electron microscopy
    Autrata, R. / Horky, D. / Ilkovics, L. / Prochazka, V. / Skricka, T. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I233
    Microstructural and compositional changes at high temperature oxidation of stainless steel in steam environment
    Khalid, F. A. / Hussain, N. / Qureshi, A. H. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I235
    Conditions of study of electrode masses structures in environmental scanning electron microscope
    Drnovsky, R. / Jirak, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I237
    An anomalous contrast effect in scanning electron microscopy of insulators: the pseudo-mirror effect
    Belhaj, M. / Jbara, O. / Odof, S. / Msellak, K. / Cazaux, J. / Rau, E. I. / Andrianov, M. V. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I239
    Spectral distribution of backscattered electrons of charged insulators
    Jbara, O. / Belhaj, M. / Odof, S. / Rau, E. I. / Andrianov, M. V. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I241
    Combined scintillation and ionisation detectors for environmental scanning electron microscopes
    Romanovsky, V. / Autrata, R. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I243
    Imaging of semiconductor structures in environmental SEM
    Romanovsky, V. / Hutar, O. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I245
    Effect of the electron beam accelerating voltage and of specimen coating on the image in the microscope operating at higher pressures
    Autrata, R. / Jirak, J. / Spinka, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I249
    Near field optical microscopy: theory and applications
    Tomanek, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I255
    Spectroscopy on semiconductor surfaces using photoassisted scanning tunneling microscopy and Kelvin probe force microscopy
    Lux-Steiner, M. C. / Sommerhalter, C. / Matthes, T. W. / Boneberg, J. / Leiderer, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I259
    Electrochemical applications of SPM
    Janda, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I263
    An in situ STM for applications in catalysis
    Aires, F. J. C. S. / Deranlot, C. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I265
    Direct imaging of AFM force interactions using TEM
    Erts, D. / Olin, H. / Olsson, L. / Ryen, L. / Tholen, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I267
    Force microscopy experiments in ultrahigh vacuum
    Meyer, E. / Guggisberg, M. / Bennewitz, R. / Loppacher, C. / Barwich, V. / Pfeiffer, O. / Schar, S. / Baratoff, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I269
    AFM in the study of primary neurons isolated from rabbit olfactory mucosa
    Menevse, A. / Sahin, F. I. / Ergun, M. A. / Tan, E. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I271
    Electron transport in point contacts studied by TEM-STM
    Erts, D. / Lohmus, A. / Lohmus, R. / Olin, H. / Olsson, E. / Ryen, L. / Tholen, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I275
    X-ray microanalysis at low kV
    Wendt, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I279
    Standardless microanalysis
    Wernisch, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I283
    Automated analysis of submicron particles in SEM?
    Poelt, P. / Schmied, M. / Brunner, T. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I285
    Correction of peak overlap in EDX-maps by digital image processing
    von Bradke, M. / Ruckdaeschel, R. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I287
    Standards for analysis of submicron particles by SEM / EDXS
    Schmied, M. / Poelt, P. / Dahl, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I289
    Combined autoradiography and electron microscopy analysis for granulometric measurements of actinide oxide aerosols
    Le Naour, H. / Fritsch, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I291
    Quantitative electron microprobe analyses of subsurface micro-inclusions in diamonds
    Gutkin, V. / Izraeli, E. / Navon, O. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I293
    The use of energy dispersive X-ray microanalysis (EDX) in pollution impact studies
    Gregory, M. A. / McClurg, T. P. / Connell, A. D. / Moodley, V. E. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I295
    Characterisation of industrial TiO~2 pigments with low voltage FE-SEM/EDX and FE-TEM/STEM/EDX methods
    Tapper, U. / Kauppinen, E. I. / Jalava, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I299
    Understanding EELS and its applications to metallic alloys and semiconductors
    Humphreys, C. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I303
    Energy filtering transmission electron microscopy: fundamentals and applications
    Kohl, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I307
    Analysis of the atomic scale oxygen vacancy ordering by EELS and Z- contrast imaging
    Ito, Y. / Stemmer, S. / Klie, R. F. / Browning, N. D. / Mazanec, T. J. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I309
    Extended image-series analysis in the energy-filtered TEM
    Thomas, P. J. / Midgley, P. A. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I311
    Composition and chemical shift analysis of a multilayer using spatially-resolved EELS
    Kimoto, K. / Matsui, Y. / Aoyama, T. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I313
    Electron channeling and monopole transitions in ELNES
    Schattschneider, P. / Hebert, C. / Jouffrey, B. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I315
    Monochromator for high brightness electron guns
    Mook, H. W. / Batson, P. E. / Kruit, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I317
    Application of EFTEM for cross-sectional on-product characterization of semiconductor devices
    Engelmann, H. J. / Blum, W. / Saage, H. / Worch, M. / Zschech, E. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I319
    Extraction of three-body distribution in amorphous silicon by wavelet analysis of EXELFS
    Muto, S. / Yu, K. M. / Walukiewicz, W. / Jin, H.-C. / Abelson, J. R. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I321
    Wavelet analysis of extended energy-loss fine structure
    Muto, S. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I323
    Energy-filtering techniques for thick samples
    Kabius, B. / Seybold, V. / Hiller, S. / Rilk, A. / Zellmann, E. / Probst, W. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I325
    EFTEM analysis of the interaction of Co with a fluorinated organic dielectric
    Hens, S. / Van Landuyt, J. / Bender, H. / Lanckmans, F. / Maex, K. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I327
    Quantitative evaluation of short-range order diffuse scattering in Cu~7~2~.~5Pd~2~7~.~5 alloy by energy filter and imaging plate
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    I329
    Cryo-EFTEM elemental mapping of particles in frozen solutions
    Bovin, J.-O. / Balmes, O. / Karlsson, G. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I331
    Electron energy-loss near-edge structures of silicon and silicon carbide
    Park, M. Y. / Kruger, P. / Kohl, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I333
    Effect of the excited state lifetime on the near edge structure in EELS or XANES experiments
    Hebert, C. / Kostner, M. / Schattschneider, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I335
    EELS study of phase transformation in Cu-Al-Ni alloy
    Hanada, T. / Kitao, R. / Nakata, Y. / Hirotsu, Y. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I337
    Stability performance of an energy filtering TEM
    Benner, G. / Zellmann, E. / Harscher, A. / Harle, R. / Kabius, B. / Seybold, V. / Probst, W. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I339
    Factor analysis of TEM-EEL spectra on nanoscale Fe/Al/Fe layers
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    I341
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    I343
    Factors affecting the performance of EELS energy-filters
    Kothleitner, G. / Brink, H. A. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I345
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    I347
    Direct atomic scale characterization of interfaces and doping layers in field-effect transistors
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    I351
    Photoemission electron microscopy with high chemical and magnetic sensitivity
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    I355
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    I359
    Quantitative secondary electron emissiometry
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    I361
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    I363
    Magneto-optical linear dichroism in threshold photoemission electron microscopy of a polycrystalline Fe-film
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    I365
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    I367
    Secondary electron field emission microscopy - SEFEM
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    I369
    Possibilities of measurement of magnetic field distributions by photoemission electron microscopy
    Nepijko, S. A. / Sedov, N. N. / Marx, G. K. L. / Schonhense, G. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I371
    Domain imaging and determination of magnetic moments in Co-films using XMCD-PEEM
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    I375
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    I379
    ProcessDiffraction: a computer program to process electron diffraction patterns from polycrystalline or amorphous samples
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    I381
    Detection of particles in elemental maps using 2D-histograms
    Muller, I. / Kohl, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I383
    Bimodal stereo-based surface reconstruction in SEM
    Jan, J. / Janova, D. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I385
    EMS simulations for STEM and applications
    Mobus, G. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I387
    On the optimum energy for backscattered electron imaging of topographic details in scanning electron microscopy
    Merli, P. G. / Morandi, V. / Rosa, R. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I389
    Genetic algorithms as applied to surface morphology reconstruction in the scanning electron microscope
    Li, X. / Kodama, T. / Uchikawa, Y. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I391
    Influence of the imaginary part of the atomic scattering factor on diffractograms of thin amorphous foils
    Knippelmeyer, R. / Thesing, A. / Kohl, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I393
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    Rau, E. I. / Sennov, R. A. / Sokolov, V. N. / Yurkovets, D. I. / Melnik, V. N. / Boyde, A. / Howell, P. G. T. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I395
    Aliasing correction of undersampled crystal images
    Koeck, P. J. B. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I397
    Monte Carlo calculation on 3D distribution of maximum penetration depths of backscattered electrons in the SEM
    Hoffmeister, H. / Reimer, L. / Kohl, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I399
    Image analysis of illuvial soil horizons
    Kyzlassov, I. / Shoba, S. A. / Sokolov, V. N. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I401
    Application of 2D-FFT for analysis of vanadium carbonitrides precipitates
    Kruk, A. / Osuch, W. / Ciura, F. / Michta, G. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I403
    An implementation of the coherence function multislice method
    Schorsch, P. / Muller, H. / Rose, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I407
    Microscope automation: does the computer replace the operator?
    Volkl, E. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I411
    WebXpertEze: intelligent instruments via the Internet
    Caldwell, N. H. M. / Breton, B. C. / Holburn, D. M. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I413
    Computer-controlled transmission electron microscopy
    van der Krift, T. P. / Ziese, U. / Janssen, A. H. / van Maurik, W. A. M. / Koster, A. J. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I417
    COM technology based modular software for scientific instrumentation control
    Vasina, J. / Vasina, R. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I419
    Computer controlled high-throughput integration system: FasTEM
    Fukushima, K. / O Donnell, R. M. / Fujiwara, K. / Kai, H. / Okunishi, E. / Kawasaki, M. / Kersker, M. / Naruse, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I423
    Modern electron optics in SEM and inspection
    Plies, E. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I427
    Advances in TEM instrumentation
    Kruit, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I431
    A high resolution add-on lens for scanning electron microscopes
    Khursheed, A. / Karuppiah, N. / Koh, S. H. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I433
    Advances in high-throughput multiple electron-beam lithography
    Mankos, M. / Chang, T. H. P. / Czechoslovak Society for Electron Microscopy et al. | 2000
    I435
    Investigations of an electrostatic duo-hexapole-stigmator
    Bartle, J. / Plies, E. / Czechoslovak Society for Electron Microscopy et al. | 2000

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