Editorial Board (Unknown)
In:
Nuclear instruments and methods in physics research section B
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444
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ii
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2019
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ISSN:
- Article (Journal) / Print
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Title:Editorial Board
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Published in:
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Publisher:
- New search for: Elsevier Science B.V., Amsterdam.
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Publication date:2019-01-01
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Size:ii
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ISSN:
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Type of media:Article (Journal)
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Type of material:Print
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Language:Unknown
- New search for: 539.7
- Further information on Dewey Decimal Classification
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Classification:
DDC: 539.7 -
Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents – Volume 444
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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PESA in the analysis of hydrogen containing polymeric materials: Some basic considerationsKumar, Sanjiv / Sunitha, Y. / Sukumar, A.A. / Ramana, J.V. / Reddy, G.L.N. et al. | 2019
- 6
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Raman spectroscopy of Ar+-irradiated graphite surfaces supporting platinum nanoparticlesKimata, Tetsuya / Kakitani, Kenta / Yamamoto, Shunya / Yamaki, Tetsuya / Terai, Takayuki / Nakamura, Kazutaka G. et al. | 2019
- 10
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Superfocusing and zero-degree focusing in planar channeling of protons in a thin silicon crystalĆosić, M. / Nešković, N. / Petrović, S. et al. | 2019
- 23
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Structural investigation of RBMK nuclear graphite modified by 12C+ ion implantation and thermal treatmentLagzdina, Elena / Lingis, Danielius / Plukis, Artūras / Plukienė, Rita / Gaspariūnas, Mindaugas / Matulaitienė, Ieva / Kovalevskij, Vitalij / Niaura, Gediminas / Remeikis, Vidmantas et al. | 2019
- 33
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Damages on pure tungsten irradiated by compression plasma flowsQu, Miao / Kong, Fanhang / Yan, Sha / Uglov, V.V. / Xue, Jianming / Wang, Yugang et al. | 2019
- 38
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Chemical effect on the energy lose for slow ion channeling a narrow band gap semiconductorLi, Chang-kai / Liu, Sheng / Zhang, Feng-Shou et al. | 2019
- 43
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Comparison of ionization track structure models for electronic devices of different sizesLiu, Jizhe / Yan, Sha / Xue, Jianming / Wang, Yugang et al. | 2019
- 50
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Evolution of radiation defects in NPN bipolar junction transistors irradiated by 3 MeV protonsLiu, Chaoming / Zhang, Yanqing / Qi, Chunhua / Li, Heyi / Wei, Yidan / Wang, Tianqi / Ma, Guoliang / Zhou, Bin / Huo, Mingxue et al. | 2019
- 54
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Presence of reactive impurities in Ar+ ion beam plays a key role for Si ripple formationBhowmik, Dipak / Mukherjee, Manabendra / Karmakar, Prasanta et al. | 2019
- 62
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Raman study of ion beam irradiation damage on nanostructured TiO2 thin filmHazem, R. / Izerrouken, M. / Cheraitia, A. / Djehlane, A. et al. | 2019
- 68
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Impact of composition modification induced by ion beam Coulomb-drag effects on the nanoindentation hardness of HT9Gigax, Jonathan G. / Kim, Hyosim / Aydogan, E. / Price, L.M. / Wang, X. / Maloy, S.A. / Garner, F.A. / Shao, L. et al. | 2019
- 74
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Comparison of defect structure in Si and Ge ion implanted GaN epilayers by RBS/channelingPągowska, K.D. / Kozubal, M. / Taube, A. / Guziewicz, M. / Gołaszewska-Malec, K. / Kruszka, R. / Jakieła, R. / Piotrowska, A. et al. | 2019
- 80
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Robust inference of two-dimensional strain fields from diffraction-based measurementsHendriks, J.N. / Wensrich, C.M. / Wills, A. / Luzin, V. / Gregg, A.W.T. et al. | 2019
- 91
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Annealing effects on elemental composition and morphological properties of Pd thin films grown on crystalline silicon substrateMasenya, M. / Halindintwali, S. / Madhuku, M. / Mtshali, C. / Cummings, F. et al. | 2019
- 96
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Investigation of structural and magnetic properties of Co+ ion implanted indium tin oxide thin films on polyethylene terephthalate (C10H8O4)n substrates by 100 keV ionsOluwaleye, O. / Madhuku, M. / Mwakikunga, B. / Moloi, S.J. et al. | 2019
- 103
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Effects of nuclear and electronic stopping powers on the conversion of hybrid silicate thin filmsQi, Y. / Shojaee, S.A. / Harriman, T.A. / Wang, Y.Q. / Mehner, A. / Lucca, D.A. et al. | 2019
- 107
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Investigation of the mechanical properties of ODS steels at high temperatures using nanoindentation techniqueWyszkowska, E. / Kurpaska, L. / Frelek-Kozak, M. / Jozwik, I. / Perkowski, K. / Jagielski, J. et al. | 2019
- 112
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Test of the validity of Bragg's rule for mean excitation energies of small molecules and ionsSauer, Stephan P.A. / Sabin, John R. / Oddershede, Jens et al. | 2019
- 117
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EBT3 film calibration in the Bragg peak region for proton beams below 5 MeVBattaglia, M.C. / Espino, J.M. / Gallardo, M.I. / Lallena, A.M. / Fernandez, B. / Cortés-Giraldo, M.A. / Quesada, J.M. / Schardt, D. et al. | 2019
- 125
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Parametric X-ray radiation in the Smith-Purcell geometry for non-destructive beam diagnosticsSkoromnik, O.D. / Feranchuk, I.D. / Lu, D.V. et al. | 2019
- 135
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Comment on N. Khelidj et al., Nucl. Instrum. Meth. Phys. Res. B 236 (2005) 88–94Gillen, Kenneth T. / Clough, Roger L. et al. | 2019
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Editorial Board| 2019