Kelvin probe force microscopy : from single charge detection to device characterization (English)
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- New search for: Sadewasser, Sascha
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- New search for: Glatzel, Thilo
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2018
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ISBN:
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Title:Kelvin probe force microscopy : from single charge detection to device characterization
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Contributors:Sadewasser, Sascha ( editor ) / Glatzel, Thilo ( editor ) / Springer International Publishing ( publisher )
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Published in:Springer series in surface sciences ; volume 65
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Publisher:
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Place of publication:Cham, Switzerland
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Publication date:2018
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Size:xxiv, 521 Seiten
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Remarks:23.5 cm x 15.5 cm
Illustrationen, Diagramme
Includes bibliographical references and index -
ISBN:
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DOI:
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Type of media:Book
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Type of material:Print
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Language:English
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Table of contents eBook
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 3
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Experimental Technique and Working ModesSadewasser, Sascha / Glatzel, Thilo et al. | 2018
- 23
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Dissipation Modulated Kelvin Probe Force Microscopy MethodMiyahara, Yoichi / Grütter, Peter et al. | 2018
- 49
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Dynamic Modes in Kelvin Probe Force Microscopy: Band Excitation and G-ModeJesse, Stephen / Collins, Liam / Neumayer, Sabine / Somnath, Suhas / Kalinin, Sergei V. et al. | 2018
- 101
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Practical Aspects of Kelvin Probe Force Microscopy in LiquidsKobayashi, Kei / Yamada, Hirofumi et al. | 2018
- 119
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Time-Resolved Electrostatic and Kelvin Probe Force MicroscopySadewasser, Sascha / Nicoara, Nicoleta et al. | 2018
- 147
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Imaging Static Charge Distributions: A Comprehensive KPFM TheoryRahe, Philipp / Söngen, Hagen et al. | 2018
- 171
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Interpretation of KPFM Data with the Weight Function for ChargesSöngen, Hagen / Rahe, Philipp / Bechstein, Ralf / Kühnle, Angelika et al. | 2018
- 201
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Precise Modeling of Electrostatic Interactions with Dielectric Samples in Kelvin Probe Force MicroscopySadeghi, Ali et al. | 2018
- 227
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Quantitative Analysis of Kelvin Probe Force Microscopy on SemiconductorsPolak, Leo / Wijngaarden, Rinke J. et al. | 2018
- 251
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Nanoscale Transport Imaging of Active Lateral Devices: Static and Frequency Dependent ModesStrelcov, Evgheni / Ahmadi, Mahshid / Kalinin, Sergei V. et al. | 2018
- 331
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Kelvin Probe Force Microscopy Characterization of Organic and Hybrid Perovskite Solar CellsGrévin, Benjamin et al. | 2018
- 367
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KPFM of Nanostructured Electrochemical SensorsHenning, Alex / Rosenwaks, Yossi et al. | 2018
- 391
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Applications of KPFM-Based Approaches for Surface Potential and Electrochemical Measurements in LiquidCollins, Liam / Weber, Stefan A.L. / Rodriguez, Brian J. et al. | 2018
- 437
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Kelvin Probe Force Microscopy with Atomic ResolutionLi, Yan Jun / Wen, Haunfei / Ma, Zong Min / Kou, Lili / Naitoh, Yoshitaka / Sugawara, Yasuhiro et al. | 2018
- 465
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The Electrostatic Field of CO Functionalized Metal TipsEllner, Michael / Pou, Pablo / Perez, Ruben et al. | 2018
- 499
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Imaging Charge Distribution Within Molecules by Scanning Probe MicroscopyOndráček, Martin / Hapala, Prokop / Švec, Martin / Jelínek, Pavel et al. | 2018