Automated recognition of Auger electron spectra (English)
National licence
- New search for: Frank, Luděk
- New search for: Frank, Luděk
In:
Vacuum
;
36
, 7-9
;
437-440
;
1986
-
ISSN:
- Article (Journal) / Electronic Resource
-
Title:Automated recognition of Auger electron spectra
-
Contributors:Frank, Luděk ( author )
-
Published in:Vacuum ; 36, 7-9 ; 437-440
-
Publisher:
-
Publication date:1986-01-01
-
Size:4 pages
-
ISSN:
-
DOI:
-
Type of media:Article (Journal)
-
Type of material:Electronic Resource
-
Language:English
-
Source:
Table of contents – Volume 36, Issue 7-9
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 397
-
IntroductionBuch, J / Kedro, M et al. | 1986
- 399
-
Quantification and measurement by Auger electron spectroscopy and X-ray photoelectron spectroscopySeah, MP et al. | 1986
- 409
-
Depth profiling of microelectronic structures by SIMS and AESMaier, M et al. | 1986
- 413
-
Surface modification by ion beamsColligon, JS et al. | 1986
- 419
-
Molecular beam epitaxy of semiconductor, dielectric and metal filmsStenin, SI et al. | 1986
- 427
-
Macroscopic measurements and microscopic information in surface scienceKnor, Z et al. | 1986
- 433
-
Quantitative Auger analysis of silicidesWirth, T / Procop, M / Lange, H et al. | 1986
- 437
-
Automated recognition of Auger electron spectraFrank, Luděk et al. | 1986
- 441
-
Correction of Auger peak-to-peak height distortions caused by a difference in the values of coordination number of atomsSiuda, R / Bukaluk, A / Rozwadowski, M et al. | 1986
- 445
-
Local density of states of the Si(111) surface with vacancies and its reconstructionTomášek, M / Karpušin, AA / Sorokin, AN et al. | 1986
- 447
-
X-ray photoelectron spectroscopy of supported metal particlesBastl, Zdeněk et al. | 1986
- 449
-
TPD and static SIMS investigation of CO adsorption on Pd(111) during catalytic oxidationMatolín, V / Gillet, E et al. | 1986
- 453
-
Subtraction of satellites in XPSHricovíni, K / Dieška, P et al. | 1986
- 455
-
Thermal and plasma models of pulsed heating of thin filmsAleksandrov, LN et al. | 1986
- 465
-
Spectral ellipsometric TEM and electron spectroscopic investigations on oxidized aluminium thin filmsBarna, PB / Bodó, Z / Gergely, G / Ádám, J et al. | 1986
- 471
-
Some new possibilities in non-destructive depth profiling using secondary emission spectroscopy: REELS and EPESGergely, G / Menyhárd, M / Sulyok, A et al. | 1986
- 479
-
Rf reactive sputtering of indium-tin-oxide filmsTvaroěk, V / Novotný, I / Harman, R / Kováč, J et al. | 1986
- 483
-
Effect of molecular oxygen on the stability of multi-alkali photocathodesPancíř, J / Haslingerová, I / Jedlička, M et al. | 1986
- 485
-
The electrical and optical properties of Cdln2O4 thin films prepared by dc reactive sputteringZakrzewska, K / Leja, E et al. | 1986
- 489
-
High resistivity layer formation in InP by ion implantation for ohmic contact characterizationJakabovič, J et al. | 1986
- 493
-
Application of ion beam techniques for amorphization and analysis of thin filmsLinker, G et al. | 1986
- 503
-
Hot filament ionization gauges for high pressures in the vacuum rangeEdelmann, C et al. | 1986
- 509
-
Developments in the measurement of total and partial pressureH<math><rm><a><ac>u</ac><ac>dot</ac></a></rm></math>lek, Z et al. | 1986
- 515
-
Photocathodes-contemporary state and trendsJedlička, M / Kulhánek, P et al. | 1986
- 523
-
Analysis of outgassing characteristics of metalsMoraw, Michal et al. | 1986
- 527
-
Vacuum system of the multipurpose 14 MeV neutron source in Bratislava: design and statusPivarč, J / Lórencz, R / Matoušek, V et al. | 1986
- 531
-
The selectivity of poly Si and SiO2 etching using a negative dc biasing of powered electrodeBrčka, Jozef / Harman, Rudolf / Blackburn, Anthony et al. | 1986
- 535
-
Probe measurements in a 380 kHz CHF3 plasma in a planar reactorBrčka, Jozef / Harman, Rudolf et al. | 1986
- 539
-
Discharge transfer in a photoluminescent dc plasma displaySzlenk, K / Poniewierski, T / Jesionek, J / Glowacki, R et al. | 1986
- 543
-
The measurement of very low pressures by the compression methodČešpíro, Zdeněk et al. | 1986
- 547
-
Comparative mass spectrometric study of AIII-BV compounds covered with a gold layerVeresegyházy, R / Mojzes, I / Pécz, B et al. | 1986
- 551
-
Utilization of zeolite NaY for analysis of hydrocarbons in vacuum systemsMiertušová, J / Miertuš, S / Kalužay, J et al. | 1986
- 555
-
Carbon contamination of ion implanted layersKrál, J / Zemek, J et al. | 1986
- 559
-
The residual current of the modulated Bayard-Alpert gaugeŘepa, Petr et al. | 1986
- 561
-
Appearance potential spectroscopic studies of the electron interactions in some metals—a simple modelEckertová, Ludmila et al. | 1986
- 561
-
Ti-W-alloy interaction with polycrystalline siliconBuch, J / Pavlenda, P et al. | 1986
- 563
-
Seventh Czechoslovak Conference on Electronics and Vacuum Physics—list of presented papers| 1986
- 567
-
Seventh Czechoslovak Conference on Electronics and Vacuum Physics| 1986
- 569
-
New products and developments| 1986
- 575
-
New patents| 1986
- I
-
Editorial: Software survey section| 1986