METHOD AND SYSTEM FOR TAKING MEASUREMENTS IN A HIGH-THROUGHPUT SCREENING WITH HIGH TIME RESOLUTION (English)
Free access
- New search for: SCHADE ANDREAS
- New search for: KÜSTER MIKE
- New search for: OCHMANN KLAUS
- New search for: HARNAU MICHAEL
- New search for: KOECHING KARL-HERMANN
- New search for: BURKHARDT NILS
- New search for: KALTHOF BERND
- New search for: SCHNEIDER LINN
- New search for: SCHMIDT GEORG
- New search for: SCHADE ANDREAS
- New search for: KÜSTER MIKE
- New search for: OCHMANN KLAUS
- New search for: HARNAU MICHAEL
- New search for: KOECHING KARL-HERMANN
- New search for: BURKHARDT NILS
- New search for: KALTHOF BERND
- New search for: SCHNEIDER LINN
- New search for: SCHMIDT GEORG
2020
- Patent / Electronic Resource
-
Title:METHOD AND SYSTEM FOR TAKING MEASUREMENTS IN A HIGH-THROUGHPUT SCREENING WITH HIGH TIME RESOLUTION
-
Patent number:US2020191717
-
Patent applicant:
-
Patent family:
-
Contributors:SCHADE ANDREAS ( author ) / KÜSTER MIKE ( author ) / OCHMANN KLAUS ( author ) / HARNAU MICHAEL ( author ) / KOECHING KARL-HERMANN ( author ) / BURKHARDT NILS ( author ) / KALTHOF BERND ( author ) / SCHNEIDER LINN ( author ) / SCHMIDT GEORG ( author )
-
Publisher:
- New search for: Europäisches Patentamt
-
Publication date:2020-06-18
-
Type of media:Patent
-
Type of material:Electronic Resource
-
Language:English
- New search for: G01N
- Further information on International Patent Classification
-
Classification:
IPC: G01N Untersuchen oder Analysieren von Stoffen durch Bestimmen ihrer chemischen oder physikalischen Eigenschaften, INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES -
Source: