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Table of contents – Volume 101, Issue 4

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The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.

313
Charge exchange of low energy particles passing through thin carbon foils: Dependence on foil thickness and charge state yields of Mg, Ca, Ti, Cr and Ni
Gonin, M. / Kallenbach, R. / Bochsler, P. / Bürgi, A. | 1995
321
Stopping power for low-velocity heavy ions: (0.01-0.9) MeV-nucleon Si ions in 18 (Z = 13-79) metals
Arstila, K. / Keinonen, J. / Tikkanen, P. | 1995
327
L-subshell ionization studies in Au and Bi by 4.8-8.8 MeV boron ion bombardment
Dhal, B.B. / Nandi, T. / Padhi, H.C. | 1995
327
L-subshell MeV boron ion bombardment
Dhal, B. B. / Nandi, T. / Padhi, H. C. | 1995
335
Isotopic mass effects in low-energy sputtering of copper and molybdenum
Bieck, W. / Gnaser, H. / Oechsner, H. | 1995
343
Electron emission from conducting surfaces impacted by multiply-charged polyatomic ions
Axelsson, J. / Parilis, E.S. / Reimann, C.T. / Sullivan, P. / Sundqvist, B.U.R. | 1995
357
Electron depth dose distributions in water, iron and lead: The GEPTS system
Chibani, O. | 1995
379
On the correction for multiple scattering of linearly polarized X-rays in Compton profile measurements
Bell, F. / Felsteiner, J. | 1995
388
Thermal and ion beam diffusion constants of Sb impurity implanted into <100> Ni single crystal
Belattar, A. / Stephens, G.A. / Cardwell, P.D. | 1995
394
Formation of a CoSi2 layer by Co ion implantation using a metal vapor vacuum arc ion source
Zhu, D.H. / Chen, Y.G. / Liu, B.X. | 1995
400
Improvement of adhesion of TiN coatings on stainless steel substrates by high energy heavy ion irradiation
Srivastav, S. / Jain, A. / Kanjilal, D. | 1995
406
Radiation damage problems in high power spallation neutron sources
Ullmaier, H. / Carsughi, F. | 1995
422
Preparation and analysis of targets with implanted thick Ar layers for in-beam gamma-spectroscopy
Grabowy, U. / Busch, H. / Gohla, A. / Speidel, K.-H. | 1995
422
Preparation and analysis of targets with implanted thick Ar layers for in-beam g-spectroscopy
Grabowy, U. / Busch, H. / Gohla, A. / Speidel, K.-H. / Kremeyer, S. / Jakob, G. / Freitag, K. / Gerber, J. / Assmann, W. | 1995
427
A newly developed chemical bevelling technique used for depth independent high depth resolution SIMS analysis
Hsu, C.M. / McPhail, D.S. | 1995
435
Surface-sensitive X-ray diffraction methods: Physics, applications and related X-ray and SR instrumentation
Kovalchuk, M.V. / Kazimirov, A.Yu / Zheludeva, S.I. | 1995
453
PIXE analysis of plant leaves of domestic use in Mexico
Aspiazu, J. / Policroniades, R. / Vivero, R. / Jiménez, M. | 1995
459
An optimized and simplified compact ECR ion source for gaseous species
Boukari, F. / Wartski, L. / Roy, V. / Coste, Ph / Schwebel, C. / Aubert, J. / Souza, M. | 1995
464
On-line beam monitoring for neutron capture therapy at the MIT Research Reactor
Harling, O.K. / Moulin, D.J. / Chabeuf, J.-M. / Solares, G.R. | 1995
473
14 MeV neutron spectra measurements with 4% energy resolution using a type IIa diamond detector
Pillon, M. / Angelone, M. / Krasilnikov, A.V. | 1995
484
On the shape of the diffraction peaks measured by Fourier reverse time-of-flight spectrometry
Kudryashev, V.A. / Priesmeyer, H.G. / Keuter, J.M. / Schröder, J. / Wagner, R. | 1995
493
A new device for XAFS data collection up to 2000 K (or 3700 K under vacuum)
Farges, F. / Itié, J.-P. / Fiquet, G. / Andrault, D. | 1995
499
A simple model of photon transport
Cullen, D.E. | 1995
511
Studies on an electrostatic ion-collection methodology
Howard, A.J. | 1995