Very low energy scanning electron microscopy (English)
- New search for: Frank, Luděk
- New search for: Frank, Luděk
- New search for: Hovorka, Miloš
- New search for: Konvalina, Ivo
- New search for: Mikmeková, Šárka
- New search for: Müllerová, Ilona
In:
Nuclear instruments & methods in physics research / A
;
645
, 1
; 46-55
;
2011
-
ISSN:
- Article (Journal) / Print
-
Title:Very low energy scanning electron microscopy
-
Contributors:
-
Published in:Nuclear instruments & methods in physics research / A ; 645, 1 ; 46-55
-
Publisher:
- New search for: North-Holland Publ. Co.
-
Place of publication:Amsterdam
-
Publication date:2011
-
ISSN:
-
ZDBID:
-
Type of media:Article (Journal)
-
Type of material:Print
-
Language:English
- New search for: 535/3450
- New search for: 33.07 / 33.05 / 33.40
- Further information on Basic classification
-
Keywords:
-
Classification:
-
Source:
Table of contents – Volume 645, Issue 1
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
-
30 years of CPO-conferencesWollnik, H. et al. | 2011
- 3
-
Thirty years of charged particle optics conferencesHawkes, P.W. et al. | 2011
- 7
-
The Wien filter: History, fundamentals and modern applicationsPlies, E. et al. | 2011
- 12
-
Monochromators in electron microscopyTsuno, K. et al. | 2011
- 20
-
Aplanatic imaging systems for the transmission electron microscopeMüller, Heiko et al. | 2011
- 28
-
C 3c measurement and dispersion reduction for beam-tilt optics of aberration-corrected SEMNakano, Tomonori et al. | 2011
- 33
-
Electromagnetic mirror objective with removable spherical aberrationBimurzaev, S.B. et al. | 2011
- 35
-
Electron optics for dual-beam low energy electron microscopyMankos, Marian et al. | 2011
- 41
-
Permanent magnet finger-size scanning electron microscope columnsNelliyan, K. et al. | 2011
- 46
-
Very low energy scanning electron microscopyFrank, Luděk et al. | 2011
- 55
-
Properties of the cathode lens combined with a focusing magnetic/immersion-magnetic lensKonvalina, I. et al. | 2011
- 60
-
Electron optics of multi-beam scanning electron microscopeMohammadi-Gheidari, A. et al. | 2011
- 68
-
Towards quantitative scanning electron microscopy: Applications to nano-scale analysisEl-Gomati, M.M. et al. | 2011
- 74
-
Properties of the imaging performance of an electron optical system for SEMSato, Mitsugu et al. | 2011
- 79
-
Comparison of calculated, simulated and measured signal amplification in a variable pressure SEMNeděla, V. et al. | 2011
- 84
-
Silicon photodiodes for electron beam position and drift detection in scanning electron microscopy and electron beam lithography systemKuo, Yi-Hung et al. | 2011
- 90
-
Electron beam transport in dusty plasmaVaislieva, T. et al. | 2011
- 96
-
Advances in helium ion microscopyHill, R. et al. | 2011
- 102
-
Development of a transmission positron microscopeMatsuya, M. et al. | 2011
- 113
-
Proton beam writing nanoprobe facility design and first test resultsvan Kan, J.A. et al. | 2011
- 116
-
Coulomb interactions in a low-voltage focussed ion beam systemMarianowski, K. et al. | 2011
- 120
-
Biased sample holder for complete correction of SIMS transmission losses with tilted samplesDowsett, D. et al. | 2011
- 124
-
Influence of clusters on Bi LMIS propertiesRadlička, Tomáš et al. | 2011
- 130
-
Correction of sample tilt in FIB instrumentsOral, M. et al. | 2011
- 136
-
The neon gas field ion source—a first characterization of neon nanomachining propertiesLivengood, Richard H. et al. | 2011
- 141
-
Equilibrium ion distribution modeling in RF ion traps and guides with regard to Coulomb effectsGrinfeld, D.E. et al. | 2011
- 146
-
Coulomb dynamics of ion bunches in multi-reflection electrostatic trapsBolotskikh, P.A. et al. | 2011
- 153
-
Ion beam neutralization using three-dimensional electron confinement by surface modification of magnetic polesNicolaescu, Dan et al. | 2011
- 159
-
The differential equations defining deflection of particles of ion beam from axial trajectory in electric and magnetic fieldsBaisanov, O.A. et al. | 2011
- 163
-
Influence of the fringe field on moving of the charged particles in flat and cylindrical capacitorsDoskeyev, G.A. et al. | 2011
- 168
-
Single-particle dynamics in electron storage rings with extremely low emittanceCai, Yunhai et al. | 2011
- 175
-
Optics and nonlinear effects in repetitive systemsBerz, Martin et al. | 2011
- 182
-
Fragment separator momentum compression schemesBandura, Laura et al. | 2011
- 187
-
Bunch compression efficiency of the femtosecond electron source at Chiang Mai UniversityThongbai, C. et al. | 2011
- 191
-
Study of thermionic RF-gun phase-space dynamics and slice emittance under influence of external electromagnetic fieldsKusoljariyakul, K. et al. | 2011
- 197
-
Non-linear time-of-flight synchronization mode for multi-turn TOF mass spectrometersBerdnikov, A.S. et al. | 2011
- 205
-
Aberrational description of periodical time-of-flight optical systemsBerdnikov, A.S. et al. | 2011
- 210
-
TOF systems with two-directional isochronous motionSudakov, Mikhail et al. | 2011
- 216
-
New schemes of static mass spectrometersBaisanov, O.A. et al. | 2011
- 219
-
On a possibility of reducing time-of-flight chromatic aberration of emission systemBimurzaev, S.B. et al. | 2011
- 221
-
A parallel magnetic sector mass analyzer designCheong, K.H. et al. | 2011
- 227
-
Parallel acquisition electrostatic electron energy analyzers for high throughput nano-analysisCubric, D. et al. | 2011
- 234
-
Electron optics of spheroid charged particle energy analyzersCubric, D. et al. | 2011
- 241
-
Experimental results from a second-order focusing toroidal energy spectrometer attachment for scanning electron microscopesHoang, H.Q. et al. | 2011
- 245
-
Improvement of a second-order focusing toroidal spectrometer by use of a pre-collimating lensHoang, H.Q. et al. | 2011
- 248
-
First-order focusing parallel electron energy magnetic sector analyzer designsKhursheed, Anjam et al. | 2011
- 253
-
Second-order focusing parallel electron energy magnetic sector analyzer designsKhursheed, Anjam et al. | 2011
- 257
-
A magnetic electron energy analyser for fast data acquisitionZha, X. et al. | 2011
- 260
-
Study of electro-chemical properties of metal–oxide interfaces using a newly constructed ambient pressure X-ray photoelectron spectroscopy endstationAksoy, Funda et al. | 2011
- 266
-
Numerical simulation methods for electron and ion opticsMunro, Eric et al. | 2011
- 273
-
The CPO programs and the BEM for charged particle opticsRead, Frank H. et al. | 2011
- 278
-
Development of the program EOD for design in electron and ion microscopyZlámal, J. et al. | 2011
- 283
-
Highly accurate potential calculations for cylindrically symmetric geometries using multi-region FDM: A reviewEdwards, David et al. | 2011
- 292
-
High order numerical differentiation and approximation of Laplace fields using regular grid dataBerdnikov, A.S. et al. | 2011
- 300
-
Design and optimization of multipole lens and Wien filter systemsLiu, Haoning et al. | 2011
- 307
-
Increased-accuracy numerical modeling of electron–optical systems with space-chargeSveshnikov, V. et al. | 2011
- 310
-
Simulation of Coulomb interaction effects in electron sourcesRouse, John et al. | 2011
- 316
-
Modeling of tip evolution of point cathode for numerical calculation of electric field in electron gunIiyoshi, Ryo et al. | 2011
- 321
-
Upgraded G-optk program for electron gun characterizationNagasao, K. et al. | 2011
- 327
-
ELECTRA: Electrostatic lens calculation tool with real time adjustment. A virtual optics bench for rapid determination of optical parameters using pre-characterized lensesDowsett, D. et al. | 2011
- 332
-
Optimal correction and design parameter search by modern methods of rigorous global optimizationMakino, K. et al. | 2011
- 338
-
The fast multipole method in the differential algebra frameworkZhang, He et al. | 2011
- 345
-
Computer simulation of electron and ion trajectories in electron-impact ion sources of a quadrupole mass spectrometerAhn, Jong Rok et al. | 2011
- 350
-
Author Index| 2011
-
EditorialKhursheed, Anjam et al. | 2011
-
Committees and Sponsors| 2011
-
Conference photo| 2011
-
Contents| 2011
-
List of Participants| 2011
-
Acknowledgements| 2011
-
Inside front cover (Editorial Board)| 2011