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Synonyms were used for: Elektronenmikroskopie
Search without synonyms: keywords:("Elektronenmikroskopie")
Used synonyms:
- electron microscopy
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Quantitative Sub-Angstrom Imaging Through ADF STEM
NTIS | 1998|Keywords: Transmission Electron Microscopy, Scanning Electron Microscopy -
Z-contrast imaging of catalysts in the 300 kV STEM
NTIS | 1995|Keywords: Electron Microscopy, Transmission Electron Microscopy, Scanning Electron Microscopy -
Direct sublattice imaging of interface dislocation structures in CdTe/GaAs(001)
NTIS | 1995|Keywords: Transmission Electron Microscopy, Scanning Electron Microscopy -
Z-contrast imaging and grain boundaries in semiconductors
NTIS | 1996|Keywords: Transmission Electron Microscopy, Electron Microscopy, Scanning Electron Microscopy -
Z-contrast scanning transmission electron microscopy of nanometer-scale coated particulate materials
NTIS | 1998|Keywords: Transmission Electron Microscopy, Scanning Electron Microscopy -
Determination of interface structure and bonding at atomic resolution in the STEM
NTIS | 1994|Keywords: Transmission Electron Microscopy, Electron Microscopy, Scanning Electron Microscopy -
Determination of atomic structure at surfaces and interfaces by high-resolution stem
NTIS | 1996|Keywords: Transmission Electron Microscopy, Scanning Electron Microscopy -
Microanalysis at atomic resolution
NTIS | 1995|Keywords: Transmission Electron Microscopy, Electron Microscopy, Scanning Electron Microscopy -
Nanocrystal Thickness Information from Z-Stem: 3-D Imaging in One Shot
NTIS | 1999|Keywords: Transmission electron microscopy -
Atomic structures of inversion domain boundaries and dislocations in sintered AlN
NTIS | 1998|Keywords: Transmission Electron Microscopy, Scanning Electron Microscopy -
Direct observations of defect structures in optoelectronic materials by Z-contrast STEM
NTIS | 1998|Keywords: Transmission Electron Microscopy, Scanning Electron Microscopy -
Microanalysis at the atomic level
NTIS | 1995|Keywords: Transmission Electron Microscopy, Electron Microscopy, Scanning Electron Microscopy -
Diffusion, segregation, and recrystallization in high-dose ion-implanted Si
NTIS | 1989|Keywords: Transmission electron microscopy, Scanning Electron Microscopy -
High-resolution imaging using Z-contrast Scanning Transmission Electron Microscopy. Foreign trip report, February 19--25, 1994
NTIS | 1994|Keywords: Transmission Electron Microscopy, Electron Microscopy -
Z-Contrast STEM Imaging and EELS of CdSe Nanocrystals: Towards the Analysis of Individual Nanocrystal Surfaces
NTIS | 1999|Keywords: Transmission Electron Microscopy -
High-resolution imaging in the scanning transmission electron microscope
NTIS | 1992|Keywords: Transmission electron microscopy, Scanning Electron Microscopy -
Atomic resolution Z-contrast imaging of ultradispersed catalysts
NTIS | 1997|Keywords: Transmission Electron Microscopy, Scanning Electron Microscopy -
Atomic-scale structure and chemistry of interfaces by Z-contrast imaging and electron energy loss spectroscopy in the STEM
NTIS | 1993|Keywords: Transmission Electron Microscopy, Scanning Electron Microscopy -
Atomic resolution characterization of a SrTiO3 grain boundary in the STEM
NTIS | 1994|Keywords: Electron Microscopy -
Towards sub-(Angstrom) resolution through incoherent imaging
NTIS | 1997|Keywords: Transmission Electron Microscopy