1–20 of 22 hits

Sort by: Relevancy | Date newest | Title A-Z

  1.  

    Aging monitoring with local sensors in FPGA-based designs

    Leong, C. / Semiao, J. / Teixeira, I. C. et al. | IEEE | 2013
  2.  

    Analyzing NBTI impact on SRAMs with resistive-open defects

    Martins, M. Tulio / Medeiros, G. / Copetti, T. et al. | IEEE | 2016
  3.  

    Delay-fault tolerance to power supply Voltage disturbances analysis in nanometer technologies

    Semiao, J. / Freijedo, J. / Rodriguez-Andina, J. et al. | IEEE | 2009
  4.  

    Dynamic fault detection in digital systems using dynamic voltage scaling and multi-temperature schemes

    Rodriguez-Irago, M. / Rodriguez Andina, J.J. / Vargas, F. et al. | IEEE | 2006
  5.  

    Dynamic fault test and diagnosis in digital systems using multiple clock schemes and multi-VDD test

    Rodriguez-Irago, M. / Andina, J.J.R. / Vargas, F. et al. | IEEE | 2005
  6.  

    Enhancing the Tolerance to Power-Supply Instability in Digital Circuits

    Semiao, J. / Freijedo, J. / Andina, J.J. Rodriguez et al. | IEEE | 2007
  7.  

    Hybrid soft error detection by means of infrastructure IP cores [SoC implementation]

    Bolzani, L. / Rebaudengo, M. / Reorda, M.S. et al. | IEEE | 2004
  8.  

    Improving the Tolerance of Pipeline Based Circuits to Power Supply or Temperature Variations

    Semiao, J. / Rodriguez-Andina, J. J. / Vargas, F. et al. | IEEE | 2007
  9.  

    Improving Tolerance to Power-Supply and Temperature Variations in Synchronous Circuits

    Semiao, J. / Freijedo, J. / Rodriguez-Andina, J. J. et al. | IEEE | 2007
  10.  

    Process Tolerant Design Using Thermal and Power-Supply Tolerance in Pipeline Based Circuits

    Semiao, J. / Rodriguez-Andina, J. J. / Vargas, F. et al. | IEEE | 2008
  11.  

    Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPG

    Palermo, N. / Tihhomirov, V. / Copetti, T.S. et al. | IEEE | 2015
  12.  

    Reliability analysis of an on-chip watchdog for embedded systems exposed to radiation and EMI

    Oliveira, C. / Benfica, J. / Bolzani Poehls, L. M. et al. | IEEE | 2013
  13.  

    Reliability analysis of an on-chip watchdog for embedded systems exposed to radiation and EMI

    Oliveira, C. / Benfica, J. / Bolzani Poehls, L. M. et al. | IEEE | 2013
  14.  

    SoC prototyping environment for electromagnetic immunity measurements

    Vargas, F. / Benfica, J. / Piccoli, L. et al. | IEEE | 2008

Number of results: 10 | 20 | 50

Feedback