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Wang, J.
Herguth, Axel
Chemical and environmental engineering
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Pseudorapidity distributions of charged hadrons in xenon-xenon collisions at root S-NN=5.44 TeV
Free accessSirunyan, A. M. / Tumasyan, A. / Adam, W. et al. | BASE | 2019 -
Influence of bound hydrogen states on BO-regeneration kinetics and consequences for high-speed regeneration processes
Free accessWilking, Svenja / Beckh, Cornelius / Ebert, Sebastian et al. | BASE | 2014 -
Determination of BO-LID and LeTID related activation energies in Cz-Si and FZ-Si using constant injection conditions
Free accessGraf, Alexander / Herguth, Axel / Hahn, Giso | BASE | 2019 -
Pseudorapidity distributions of charged hadrons in xenon-xenon collisions at √s-NN=5.44 TeV
Free accessSirunyan, A. M. / Tumasyan, A. / Adam, W. et al. | BASE | 2019 -
Recovery of LeTID by low intensity illumination : reaction kinetics, completeness and threshold temperature
Free accessHerguth, Axel / Derricks, Christian / Keller, Philipp et al. | BASE | 2017 -
Influence of hydrogen effusion from hydrogenated silicon nitride layers on the regeneration of boron-oxygen related defects in crystalline silicon
Free accessWilking, Svenja / Ebert, Sebastian / Herguth, Axel et al. | BASE | 2013 -
A 3-in-1 doping process for interdigitated back contact solar cells exploiting the understanding of co-diffused dopant profiles by use of PECVD borosilicate glass in a phosphorus diffusion
Free accessGloger, Sebastian / Herguth, Axel / Engelhardt, Josh et al. | BASE | 2016 -
Influencing Light and Elevated Temperature Induced Degradation and Surface-Related Degradation Kinetics in Float-Zone Silicon by Varying the Initial Sample State
Free accessHammann, Benjamin / Engelhardt, Josh / Sperber, David et al. | BASE | 2020 -
D-0-Meson R-AA in PbPb Collisions at root s(NN)=5.02 TeV and Elliptic Flow in pPb Collisions at root s(NN)=8.16 TeV with CMS
Free accessShi, Zhaozhong / Sirunyan, A. M. / Tumasyan, A. et al. | BASE | 2019 -
Regeneration of boron-oxygen related degradation in Cz-Si PERC-type solar cells at high temperatures
Free accessHerguth, Axel / Derricks, Christian / Hahn, Giso | BASE | 2017 -
Pseudorapidity distributions of charged hadrons in xenon-xenon collisions at \sqrt{s_{NN}}$ =5.44 TeV
Free accessSirunyan, A. M. / Tumasyan, A. / Adam, W. et al. | BASE | 2019 -
BO-Related Defects : Overcoming Bulk Lifetime Degradation in Crystalline Si by Regeneration
Free accessHahn, Giso / Wilking, Svenja / Herguth, Axel | BASE | 2016 -
Investigation of degradation in solar cells from different mc-Si materials
Free accessJunge, Johannes / Herguth, Axel / Hahn, Giso et al. | BASE | 2011 -
Determination of the parton distribution functions of the proton from ATLAS measurements of differential W± and Z boson production in association with jets
Free accessAad, G. / Abbott, B. / Abbott, D. C. et al. | BASE | 2021 -
On the influence of advection cooling during degradation and regeneration of Boron-Oxygen defects using high intensities
Free accessHerguth, Axel / Derricks, Christian / Hahn, Giso | BASE | 2019 -
Accelerating boron-oxygen related regeneration : lessons learned from the BORNEO project
Free accessHerguth, Axel / Wilking, Svenja / Horbelt, Renate et al. | BASE | 2015 -
Of apples and oranges : why comparing BO regeneration rates requires injection level correction
Free accessWilking, Svenja / Ebert, Sebastian / Beckh, Cornelius et al. | BASE | 2016 -
A Phenomenological Model for the Contact Formation of Ag/Al Screen-Printing Pastes through SiN x :H Layers
Free accessFritz, Susanne / Ebert, Stefanie / Herguth, Axel et al. | BASE | 2014 -
On the Role of AlO x Thickness in AlO x /SiN y : H Layer Stacks Regarding Light- and Elevated Temperature-Induced Degradation and Hydrogen Diffusion in c-Si
Free accessSchmid, Andreas / Fischer, Christian / Skorka, Daniel et al. | BASE | 2021 -
Measurement of the inclusive production cross sections for forward jets and for dijet events with one forward and one central jet in pp collisions at $ \sqrt {s} = 7 $ TeV
Free accessChatrchyan, S. / Khachatryan, V. / Frühwirth, R. et al. | BASE | 2012
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