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Computer simulation of channelling measurements in He-irradiated V₃Si single crystals
Free accessBASE | 1999| -
Analysis of Phosphosilicate Glass Layers by Backscattering and Channelling Effect Measurements
Free accessBASE | 1999| -
Analysis of Rb and Cs Implantations in Silicon by Channelling and Hall Effect Measurements
Free accessBASE | 1999| -
Study of the defect structures in irradiated Al- and NbC-single crystals by the channeling technique
Free accessBASE | 1999| -
Radiation Damage and Ion Behaviour in Ion Implanted Vanadium and Nickel Single Crystals
Free accessBASE | 1999| -
Analysis of Amorphous Layers on Silicon by Backscattering and Channelling Effect Measurements
Free accessBASE | 1999| -
Recent progress in high precision nuclear spectrometry with semiconducters
Free accessBASE | 1999| -
Analysis of Thin Evaporated and Sputtered Superconducting Films by the Backscattering Technique
Free accessBASE | 1999|