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Densimeter calibration method versus temperature and pressure
National licenceIOP Institute of Physics | 1992| -
Finite element analysis of deflection and residual stress on machined ultra-thin silicon wafers
National licenceIOP Institute of Physics | 2011| -
Determining the propagation angle for non-vertical surface-breaking cracks and its effect on crack sizing using an ACFM sensor
PaperIOP Institute of Physics | 2015| -
Single crystallization of Al interconnection wires
National licenceIOP Institute of Physics | 2002| -
Fabrication and characteristics of high speed InGaAs/GaAs quantum-wells superluminescent diode emitting at 1053 nm
PaperIOP Institute of Physics | 2014| -
Angled-cavity lasers with photonic-crystal structure and high-order surface gratings
LetterIOP Institute of Physics | 2017| -
Physics of dynamic threshold voltage and steep subthreshold swing in Al2O3–InAlN–GaN MOSHEMTs
PaperIOP Institute of Physics | 2016| -
Laser integrated measurement of surface roughness and micro-displacement
National licenceIOP Institute of Physics | 2000| -
High dynamic range third-order correlation measurement of picosecond laser pulse shapes
National licenceIOP Institute of Physics | 1993| -
Narrow stripe selective growth of oxide-free InGaAlAs/InGaAlAs MQWs by ultra-low pressure MOVPE
National licenceIOP Institute of Physics | 2006| -
Velocity overshoot in a modulation-doped Si/Si1-xGex structure
National licenceIOP Institute of Physics | 1994| -
Nano-flower and nano-wall SnS2 films fabricated with controllable shape and size by the PECVD method
National licenceIOP Institute of Physics | 2013| -
Ionizing radiation effect on metal–ferroelectric–insulator–semiconductor memory capacitors
PaperIOP Institute of Physics | 2015| -
Background subtraction of digital coincidence Doppler broadening spectra
National licenceIOP Institute of Physics | 2005| -
A new approach to the hot-phonon effect on carrier cooling in GaAs
National licenceIOP Institute of Physics | 1994| -
A differential delay line for optical coherence domain polarimetry
PaperIOP Institute of Physics | 2015| -
Doping dependence of the ultrafast thermalization and relaxation of highly photoexcited carriers in bulk polar semiconductors
National licenceIOP Institute of Physics | 1992| -
Controlling the carriers of topological insulators by bulk and surface doping
National licenceIOP Institute of Physics | 2012| -
Progress in semiconducting oxide-based thin-film transistors for displays
National licenceIOP Institute of Physics | 2005|
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