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CHARGE DETECTION MASS SPECTROMETRY UTILIZING HARMONIC OSCILLATION AND SELECTIVE TEMPORAL OVERVIEW OF RESONANT ION ( STORI) PLOTS
Free accessEuropean Patent Office | 2023| -
LIVE-ASSISTED IMAGE ACQUISITION METHOD AND SYSTEM WITH CHARGED PARTICLE MICROSCOPY
Free accessEuropean Patent Office | 2023| -
Mit einem Strahl geladener Teilchen arbeitende Vorrichtung und Programm
Free accessEuropean Patent Office | 2022| -
METHODS OF DETERMINING ABERRATIONS OF A CHARGED PARTICLE BEAM AND CHARGED PARTICLE BEAM SYSTEM
Free accessEuropean Patent Office | 2023| -
Methods of determining aberrations of a charged particle beam, and charged particle beam system
Free accessEuropean Patent Office | 2023| -
Method for Image Adjustment and Charged Particle Beam System
Free accessEuropean Patent Office | 2021| -
COMPENSATON OF IMAGING DEVIATIONS IN A PARTICLE-BEAM WRITER USING A CONVOLUTION KERNEL
Free accessEuropean Patent Office | 2021 -
Method for image adjustment and charged particle beam system
Free accessEuropean Patent Office | 2022|