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TIB reading rooms collection
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USE OF ORGANIC CONDUCTIVE POLYMER FOR MULTIPLEX ION BEAM IMAGING
Free accessEuropean Patent Office | 2023| -
Multiplexed imaging of tissues using mass tags and secondary ion mass spectrometry
Free accessEuropean Patent Office | 2022| -
An apparatus and method for sub-micrometer elemental image analysis by mass spectrometry
Free accessEuropean Patent Office | 2021| -
SINGLE CELL ANALYSIS USING SECONDARY ION MASS SPECTROMETRY
Free accessEuropean Patent Office | 2021| -
MULTIPLEXED IMAGING OF TISSUES USING MASS TAGS AND SECONDARY ION MASS SPECTROMETRY
Free accessEuropean Patent Office | 2022| -
AN APPARATUS AND METHOD FOR SUB-MICROMETER ELEMENTAL IMAGE ANALYSIS BY MASS SPECTROMETRY
Free accessEuropean Patent Office | 2022| -
MULTIPLEXED IMAGING OF TISSUES USING MASS TAGS AND SECONDARY ION MASS SPECTROMETRY
Free accessEuropean Patent Office | 2019| -
Single-Cell Mass Cytometry of Differential Immune and Drug Responses Across a Human Hematopoietic Continuum
Online Contents | 2011|Contributors: Bruggner, Robert V., Balderas, Robert S. -
SINGLE CELL ANALYSIS USING SECONDARY ION MASS SPECTROMETRY
Free accessEuropean Patent Office | 2021| -
TISSUE MULTIPLEXING IMAGING USING MASS TAG AND SECONDARY ION MASS SPECTROMETER
Free accessEuropean Patent Office | 2019| -
Multiplexed imaging of tissues using mass tags and secondary ion mass spectrometry
Free accessEuropean Patent Office | 2019| -
SINGLE CELL ANALYSIS USING SECONDARY ION MASS SPECTROMETRY
Free accessEuropean Patent Office | 2019| -
Multiplexed imaging of tissues using mass tags and secondary ion mass spectrometry
Free accessEuropean Patent Office | 2020| -
MULTIPLEXED IMAGING OF TISSUES USING MASS TAGS AND SECONDARY ION MASS SPECTROMETRY
Free accessEuropean Patent Office | 2019| -
MULTIPLEXED IMAGING OF TISSUES USING MASS TAGS AND SECONDARY ION MASS SPECTROMETRY
Free accessEuropean Patent Office | 2019| -
Single cell analysis using secondary ion mass spectrometry
Free accessEuropean Patent Office | 2018| -
Multiplexed imaging of tissues using mass tags and secondary ion mass spectrometry
Free accessEuropean Patent Office | 2018| -
AN APPARATUS AND METHOD FOR SUB-MICROMETER ELEMENTAL IMAGE ANALYSIS BY MASS SPECTROMETRY
Free accessEuropean Patent Office | 2017| -
An apparatus and method for sub-micrometer elemental image analysis by mass spectrometry
Free accessEuropean Patent Office | 2016|
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