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  1.  

    Laser Driven Sealed Beam Lamp With Improved Stability

    BLONDIA RUDI | European Patent Office | 2018
  2.  

    Electron source architecture for a scanning electron microscopy system

    TAHMASSEBPUR MOHAMMED | European Patent Office | 2018
  3.  

    X-ray tube including hybrid electron emission source

    KANG JUN TAE / SONG YOON-HO / KIM JAE-WOO et al. | European Patent Office | 2016
  4.  

    COMPACT DEFLECTING MAGNET

    RAND ROY E / ZISKIN VITALIY | European Patent Office | 2017
  5.  

    Electron microscope with improved imaging resolution

    HENSTRA ALEXANDER / DONA PLEUN | European Patent Office | 2018
  6.  

    Analyzer

    MURTHY PRAKASH SREEDHAR | European Patent Office | 2018
  7.  

    DISCHARGE LAMP

    KURIYAMA HARUO / SERIZAWA IZUMI | European Patent Office | 2018
  8.  

    Dual Parabolic Laser Driven Sealed Beam Lamp

    BLONDIA RUDI | European Patent Office | 2018
  9.  

    ABERRATION MEASUREMENT METHOD AND ELECTRON MICROSCOPE

    KONO YUJI / NAKAMURA AKIHO | European Patent Office | 2017
  10.  

    ELEKTRONENKANONE

    DIETRICH CHRISTOF / FESTL NORBERT / SEIDEL HARALD | European Patent Office | 2018
  11.  

    ELECTRON BEAM GENERATOR AND ELECTRON BEAM APPLICATION DEVICE

    NISHITANI TOMOHIRO / KOIZUMI ATSUSHI / KAWAMATA TOMOAKI et al. | European Patent Office | 2017
  12.  

    CHARGED PARTICLE SOURCE

    LI SHUAI | European Patent Office | 2019
  13.  

    CHARGED PARTICLE BEAM SYSTEM

    ZEIDLER DIRK / SCHUBERT STEFAN / MUELLER INGO et al. | European Patent Office | 2019
  14.  

    FOCUSED ION BEAM APPARATUS

    KAWANAMI YOSHIMI | European Patent Office | 2017
  15.  

    Laser driven sealed beam lamp

    BLONDIA RUDI | European Patent Office | 2015

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