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  1. New frame-transfer wide-angle slow-scan CCD camera allows recording of distortion-free images for digital montages

    Hiller, S. A. / Probst, W. / Seybold, V. et al. | British Library Conference Proceedings | 2000

  2. Auger microscopy with a parallel acquisition spectrometer

    Jacka, M. / Kale, A. / Tyndall, M. et al. | British Library Conference Proceedings | 2000

  3. On actual questions in filtering and inelastic interactions

    Jouffrey, B. / Schattschneider, P. / Hebert, C. et al. | British Library Conference Proceedings | 2000

  4. SEM resolution improvement at low voltage with gun monochromator

    Barth, J. E. / Nykerk, M. D. / Mook, H. W. et al. | British Library Conference Proceedings | 2000

  5. A high resolution add-on lens for scanning electron microscopes

    Khursheed, A. / Karuppiah, N. / Koh, S. H. et al. | British Library Conference Proceedings | 2000

  6. Possibilities of measurement of magnetic field distributions by photoemission electron microscopy

    Nepijko, S. A. / Sedov, N. N. / Marx, G. K. L. et al. | British Library Conference Proceedings | 2000

  7. Wavelet analysis of extended energy-loss fine structure

    Muto, S. / Czechoslovak Society for Electron Microscopy | British Library Conference Proceedings | 2000

  8. Energy filtering transmission electron microscopy: fundamentals and applications

    Kohl, H. / Czechoslovak Society for Electron Microscopy | British Library Conference Proceedings | 2000

  9. Quantitative electron microprobe analyses of subsurface micro-inclusions in diamonds

    Gutkin, V. / Izraeli, E. / Navon, O. et al. | British Library Conference Proceedings | 2000

  10. Correction of peak overlap in EDX-maps by digital image processing

    von Bradke, M. / Ruckdaeschel, R. / Czechoslovak Society for Electron Microscopy | British Library Conference Proceedings | 2000

  11. Force microscopy experiments in ultrahigh vacuum

    Meyer, E. / Guggisberg, M. / Bennewitz, R. et al. | British Library Conference Proceedings | 2000

  12. An anomalous contrast effect in scanning electron microscopy of insulators: the pseudo-mirror effect

    Belhaj, M. / Jbara, O. / Odof, S. et al. | British Library Conference Proceedings | 2000

  13. Studies of biological specimens by environmental scanning electron microscopy

    Autrata, R. / Horky, D. / Ilkovics, L. et al. | British Library Conference Proceedings | 2000

  14. Dimension measurement in a cathode lens equipped low-energy SEM

    Hutar, O. / Oral, M. / Mullerova, I. et al. | British Library Conference Proceedings | 2000

  15. X-ray photoemission and low energy electron microscope

    Kolarik, V. / Vasina, R. / Mynar, M. et al. | British Library Conference Proceedings | 2000

  16. Scanning low and very low energy electron microscopy

    Mullerova, I. / Frank, L. / Czechoslovak Society for Electron Microscopy | British Library Conference Proceedings | 2000

  17. The Triebenberg laboratory - designed for highest resolution electron microscopy and holography

    Lichte, H. / Schulze, D. / Lehmann, M. et al. | British Library Conference Proceedings | 2000

  18. Performance of the mirror corrector for an ultrahigh-resolution spectromicroscope

    Hartel, P. / Preikszas, D. / Spehr, R. et al. | British Library Conference Proceedings | 2000

  19. Correction of chromatic and spherical aberration using a Wien filter

    Steffen, T. / Tiemeijer, P. C. / Krijn, M. P. C. M. et al. | British Library Conference Proceedings | 2000

  20. Direct object data retrieval: an inversion of electron diffraction

    Scheerschmidt, K. / Czechoslovak Society for Electron Microscopy | British Library Conference Proceedings | 2000

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