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TIB reading rooms collection
Synonyms were used for: Halbleiterbauelement
Search without synonyms: keywords:(Halbleiterbauelement)
Used synonyms:
- halbleiterbauteil
- semiconductor component
- semiconductor device
- semiconductors
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Noise power normalisation: extension of gm/ID technique for noise analysis
IET | 2012|Keywords: semiconductor device models, semiconductor device noise -
Circuit model for single-energy-level trap centers in FETs
Elsevier | 2016|Keywords: Semiconductor device measurement, Semiconductor device modeling -
Unified Quantum and Reliability Model for Ultra-Thin Double-Gate MOSFETs
Online Contents | 2020|Keywords: Semiconductor device reliability, Semiconductor device modeling -
Cyclostationary noise modeling of radio frequency devices
Wiley | 2015|Keywords: semiconductor device modeling, semiconductor device noise -
Investigation of the temperature dependence of random telegraph noise fluctuations in nanoscale polysilicon-channel 3-D Flash cells
Elsevier | 2018|Keywords: Semiconductor device modeling, Semiconductor device reliability -
SJ-LDMOS with high breakdown voltage and ultra-low on-resistance
IET | 2006|Keywords: semiconductor device reliability, semiconductor device breakdown -
Mixing Integrator for Compact Electrochemical Impedance Spectroscopy
Free accessBASE | 2022|Keywords: Semiconductor device modeling, Semiconductor device measurement -
Analytic and explicit current model of undoped double-gate MOSFETs
IET | 2007|Keywords: semiconductor device models, semiconductor device measurement -
Comparative study of Al metallization degradation in power diodes under passive and active thermal cycling
Free accessBASE | 2018|Keywords: Semiconductor device metallization, semiconductor device reliability -
Self-mixing model of terahertz rectification in a metal oxide semiconductor capacitance
Free accessBASE | 2020|Keywords: semiconductor device modeling -
Design applications of compact MOSFET model for extended temperature range (60–400K)
IET | 2011|Keywords: semiconductor device models -
New insight on terahertz rectification in a metal–oxide–semiconductor field-effect transistor structure
Free accessBASE | 2020|Keywords: semiconductor device modeling -
Scalable model for predicting the effect of negative bias temperature instability for reliable design
IET | 2008|Keywords: semiconductor device reliability -
Phase noise calculation and variability analysis of RFCMOS LC oscillator based on physics-based mixed-mode simulation
Elsevier | 2012|Keywords: Semiconductor device modeling, Semiconductor device noise -
Bootstrapped inverter using a pentacene thin-film transistor with a poly(methyl methacrylate) gate dielectric
IET | 2009|Keywords: semiconductor device manufacture, semiconductor device models, semiconductor device testing -
Spatio-temporal evolution of carrier densities in oxide-confined p-n-diodes.: p-i-n-design
Research DataTIB AV-Portal | 2017|Keywords: Semiconductor device simulation -
Spatio-temporal evolution of carrier densities in oxide-confined p-n-diodes.: p-p-n-design
Research DataTIB AV-Portal | 2017|Keywords: Semiconductor device simulation -
1/f noise and analogue performance study of short-channel cylindrical surrounding gate MOSFET using a new subthreshold analytical pseudo-two-dimensional model
IET | 2012|Keywords: semiconductor device models, semiconductor device noise -
Effects of substrate temperature on resistive switching behavior of planar ZnO resistive random access memories
Elsevier | 2016|Keywords: Semiconductor device -
Direct experimental verification of shot noise in short channel MOS transistors
IET | 2005|Keywords: semiconductor device models, semiconductor device noise
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