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  1. Very low energy scanning electron microscopy

    Frank, Luděk | Online Contents | 2011

  2. Noise in secondary electron emission: the low yield case

    Frank, Ludek | Oxford University Press | 2005

  3. Special Issue on New Developments and Analysis for Fabrication of Functional Nanostructures - Cathode Lens Mode of the SEM in Materials Science Applications

    Frank, Ludek | Online Contents | 2007

  4. Special Issue on New Developments and Analysis for Fabrication of Functional Nanostructures - Dopant Contrast in Semiconductors as Interpretation Challenge at Imaging by Electrons

    Frank, Ludek | Online Contents | 2007

  5. Noise in secondary electron emission: the low yield case

    Frank, Ludek | Online Contents | 2005

  6. A method of imaging ultrathin foils with very low energy electrons

    Müllerová, Ilona / Hovorka, Miloš / Frank, Luděk | Elsevier | 2012

  7. Counting graphene layers with very slow electrons

    Frank, Ludĕk / Mikmeková, Eliška / Müllerová, Ilona et al. | American Institute of Physics | 2015

  8. To the Backscattering Contrast in Scanning Auger Microscopy

    Frank, Luděk | Springer Verlag | 1992

  9. Automated recognition of Auger electron spectra

    National licence
    Frank, Luděk | Elsevier | 1986

  10. Quantification of the electron beam damage of thin films

    Frank, Luděk | Online Contents | 1994

  11. Quantification of the electron beam damage of thin films

    National licence
    Frank, Luděk | Springer Verlag | 1994

  12. Collection of Auger electron spectra with a microcomputer

    National licence
    Frank, Luděk / Vašina, Petr | Elsevier | 1982

  13. The cutting of ultrathin sections with the thickness less than 20 nm from biological specimens embedded in resin blocks

    Nebesářová, Jana / Hozák, Pavel / Frank, Luděk et al. | Wiley | 2016

  14. Enhancement of SEM to scanning LEEM

    Müllerová, Ilona / Matsuda, Kenji / Hrnčiřík, Petr et al. | Elsevier | 2007

  15. Very low energy scanning electron microscopy

    Frank, Luděk / Hovorka, Miloš / Konvalina, Ivo et al. | Elsevier | 2011

  16. Correction of the Edge Effect in Auger Electron Microscopy

    Frank, Luděk / Matějka, František | Springer Verlag | 1996

  17. Use of cathode lens in scanning electron microscope for low voltage applications

    Müllerová, Ilona / Frank, Luděk | Online Contents | 1994

  18. Use of cathode lens in scanning electron microscope for low voltage applications

    National licence
    Müllerová, Ilona / Frank, Luděk | Springer Verlag | 1994

  19. Profiling N-type dopants in silicon

    Hovorka, Milos / Mika, Filip / Mikulik, Petr et al. | Tema Archive | 2010

  20. The potential of the scanning low energy electron microscopy for the examination of aluminum based alloys and composites

    Matsuda, Kenji / Ikeno, Susumu / Müllerová, Ilona et al. | Oxford University Press | 2005

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