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    Improved method for extracting the equivalent circuit elements of a CRLH-TL unit cell

    Obiala-Ezenwa, E. / Maya-Sanchez, M.C. / Reynoso-Hernandez, J.A. | British Library Online Contents | 2015
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    Calibration of a real-time load-pull system using the generalized theory of the TRM technique

    Pulido-Gaytan, M.A / Reynoso-Hernandez, J.A. / Maya-Sanchez, M.C. et al. | IEEE | 2016
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    An improved two-tier L-L method for characterizing symmetrical microwave test fixtures

    Zúñiga-Juárez, J.E. / Reynoso-Hernández, J.A. / Loo-Yau, J.R. et al. | Online Contents | 2011
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    An improved two-tier L-L method for characterizing symmetrical microwave test fixtures

    Zúñiga-Juárez, J.E. / Reynoso-Hernández, J.A. / Loo-Yau, J.R. et al. | Elsevier | 2011
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    An improved two-tier L-L method for characterizing symmetrical microwave test fixtures

    Zuniga-Juarez, J.E. / Reynoso-Hernandez, J.A. / Loo-Yau, J.R. et al. | Tema Archive | 2011
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    Spurline structures and its application on microwave coupled line filter

    Loo-Yau, J.R. / Gomez-Pichardo, O.I. / Sandoval-Ibarra, F. et al. | British Library Online Contents | 2011
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    Proceso de grabado seco de silicio monocristalino para aplicaciones en guias de onda coplanares

    Leal-Romero, R. / Zaldivar-Huerta, I.E. / Reynoso-Hernandez, J.A. et al. | British Library Online Contents | 2010
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    A New and Better Method for Extracting the Parasitic Elements of On-Wafer GaN Transistors

    Landa, Andres Zarate-de / Zuniga-Juarez, J.E / Reynoso-Hernandez, J.A. et al. | IEEE | 2007
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    A new and better method for extracting the parasitic elements of on-wafer GaN transistors

    Zarate-de Landa, A. de / Zuniga-Juarez, J.E. / Reynoso-Hernandez, J.A. et al. | Tema Archive | 2007
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    Line-attenuator-line: an alternative method for in-fixture calibration

    Reynoso-Hernandez, J.A. / Loo-Yau, J.R. / Ascencio-Ramirez, H. et al. | Tema Archive | 2005
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    Improved Envelope Load Pull system for high power transistors characterization

    Malfavaun-Gonzalez, E. J. / Pulido-Gaytan, M.A. / Urbina-Martinez, J. et al. | IEEE | 2016
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    A new method for extracting Ri and Rgd of the intrinsic transistor model of GaN HEMT based on extrema points of intrinsic Y-parameters

    Reynoso-Hernandez, J. A. / Estrada-Mendoza, Jaqueline / Maya-Sanchez, M.C. et al. | IEEE | 2015
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