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Quantitative total reflection x‐ray fluorescence analysis of directly collected aerosol samples
British Library Online Contents | 2017| -
SPECTRAL CORRECTION FOR TRANSMISSION X-RAY TUBES FOR USE IN THE QUANTIFICATION SOFTWARE ATI-QUANT
British Library Conference Proceedings | 2021| -
Comparison of different excitation modes for the analysis of light elements with a TXRF vacuum chamber
British Library Conference Proceedings | 2015| -
Combination of grazing incidence x-ray fluorescence with x-ray reflectivity in one table-top spectrometer for improved characterization of thin layer and implants on/in silicon wafers
Free accessAmerican Institute of Physics | 2014| -
COMPARISON OF DIFFERENT EXCITATION MODES FOR THE ANALYSIS OF LIGHT ELEMENTS WITH A TXRF VACUUM CHAMBER
British Library Conference Proceedings | 2015| -
Comparison of SiLi detector and silicon drift detector for the determination of low Z elements in total reflection X-ray fluorescence
Online Contents | 2004|Contributors: Wobrauschek, P. -
A new total reflection X-ray fluorescence vacuum chamber with sample changer analysis using a silicon drift detector for chemical analysis
Online Contents | 2004|Contributors: Wobrauschek, P. -
Recent results of synchrotron radiation induced total reflection X-ray fluorescence analysis at HASYLAB, beamline L
Online Contents | 2006|Contributors: Wobrauschek, P. -
Analysis of low Z elements on Si wafer surfaces with synchrotron radiation induced total reflection X-ray fluorescence at SSRL, Beamline 3-3: comparison of droplets with spin coated wafers
Online Contents | 2003|Contributors: Wobrauschek, P., Pianetta, P. -
Synchrotron radiation induced total reflection X-ray fluorescence of low Z elements on Si wafer surfaces at SSRL - comparison of excitation geometries and conditions
Online Contents | 2001|Contributors: Wobrauschek, P., Kregsamer, P., Pianetta, P. -
A new total reflection X-ray fluorescence vacuum chamber with sample changer analysis using a silicon drift detector for chemical analysis
Online Contents | 2004|Contributors: Wobrauschek, P. -
Comparison of SiLi detector and silicon drift detector for the determination of low Z elements in total reflection X-ray fluorescence
Online Contents | 2004|Contributors: Wobrauschek, P.
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