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  1.  

    3D-Kenngrößen zur Beschreibung von Feinblechoberflächen

    Pfestorf, M. / Engel, U. / Geiger, M. | Tema Archive | 1996
  2.  

    3D-Kennwerte zur Beschreibung technischer Oberflächen

    Geiger, M. / Pfestorf, M. / Engel, U. | Tema Archive | 1996
  3.  

    3D-Oberflächenanalyse zur Beurteilung des Glanzgrades an Blechen

    Geiger, M. / Engel, U. / Krauß, H.J. et al. | Tema Archive | 1998
  4.  

    3D-surface parameters and their application on deterministic textured metal sheets

    Pfestorf, M. / Engel, U. / Geiger, M. | Tema Archive | 1998
  5.  

    10 Jahre Diabetes-DMP – Ein medizinischer oder ökonomischer Nutzen ist nicht erkennbar

    Linder, R / Horenkamp-Sonntag, D / Engel, S et al. | Thieme Verlag | 2013
  6.  

    A 1-Mbit MRAM based on 1T1MTJ bit cell integrated with copper interconnects

    Durlam, M. / Naji, P.J. / Omair, A. et al. | Tema Archive | 2003
  7.  

    A 4-Mb toggle MRAM based on a novel bit and switching method

    Engel, B.N. / Akerman, J. / Butcher, B. et al. | Tema Archive | 2005
  8.  

    Additives to reduce coking in endothermic heat exchangers

    National licence
    Alptekin, G. / Engel, J. / Karpuk, M. et al. | AIAA | 1999
  9.  

    A FADC-based data acquisition system for the KASCADE-grande experiment

    Walkowiak, W. / Antoni, T. / Apel, W.D. et al. | Tema Archive | 2006
  10.  

    Aktuelle Gesundheitsziele zur Sekundärprävention von Brustkrebs in Deutschland

    Albert, U. S. / Altland, H. / Duda, V. F. et al. | Thieme Verlag | 2007
  11.  

    A low power 1 Mbit MRAM based on 1T1MTJ bit cell integrated with copper interconnects

    Durlam, M. / Naji, P. / Omair, A. et al. | Tema Archive | 2002
  12.  

    A model-based information system for simulation and monitoring of belt conveyor systems

    Jeinsch, T. / Sader, M. / Ding, S.X. et al. | Tema Archive | 2000
  13.  

    An experimental analysis of the onset of buckling in sheet metal forming

    Sobis, T. / Engel, U. / Geiger, M. | Tema Archive | 1992
  14.  

    A novel approach for in-situ observation of local deformation behaviour at micro scale

    Geißdörfer, S. / Engel, U. / Geiger, M. | Tema Archive | 2009
  15.  

    A novel approach to realistic worst-case simulations of CMOS circuits

    Bolt, M.J. / Engel, J. / Rocchi, M. et al. | Tema Archive | 1989

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