Electron inelastic mean free paths: influence of the modelling energy-loss function (English)
- New search for: de la Cruz, W.
- New search for: Yubero, F.
- New search for: de la Cruz, W.
- New search for: Yubero, F.
In:
SURFACE AND INTERFACE ANALYSIS
;
39
, 5
;
460-463
;
2007
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ISSN:
- Article (Journal) / Print
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Title:Electron inelastic mean free paths: influence of the modelling energy-loss function
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Contributors:de la Cruz, W. ( author ) / Yubero, F. ( author )
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Published in:SURFACE AND INTERFACE ANALYSIS ; 39, 5 ; 460-463
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Publisher:
- New search for: John Wiley & Sons, Ltd
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Publication date:2007-01-01
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Size:4 pages
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ISSN:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 660.293
- Further information on Dewey Decimal Classification
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Classification:
DDC: 660.293 -
Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents – Volume 39, Issue 5
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 375
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Surface pressure‐area curves compression isotherm of sericin Langmuir monolayerJianbin, Yang / Puxing, Zhu / Dacheng, Wu et al. | 2007
- 377
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Positron backscattering from an Al target: analytical calculation and Monte Carlo simulationBentabet, A. / Bouarissa, N. et al. | 2007
- 381
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Product or sum: comparative tests of Voigt, and product or sum of Gaussian and Lorentzian functions in the fitting of synthetic Voigt‐based X‐ray photoelectron spectraHesse, R. / Streubel, P. / Szargan, R. et al. | 2007
- 392
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Chemical etching of hot‐pressed p‐type polycrystalline SiC surfaces by HF/K2S2O8 solutionsBourenane, K. / Keffous, A. / Nezzal, G. / Boukezzata, A. / Naama, S. et al. | 2007
- 397
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Surface transient effects in ultralow‐energy Cs+ sputtering of SiChanbasha, A. R. / Wee, A. T. S. et al. | 2007
- 405
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XPS characterization of the corrosion film formed on the electroless nickel deposit prepared using different stabilizers in NaCl solutionCheong, Woo‐Jae / Luan, Ben L. / McIntyre, N. S. / Shoesmith, David W. et al. | 2007
- 415
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X‐ray diffraction study of low‐energy carbon‐ion implanted Si(001)Markwitz, A. / Barry, B. / Eichhorn, F. et al. | 2007
- 419
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Adsorption of genetically engineered proteins studied by time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS). Part A: data acquisition and principal component analysis (PCA)Suzuki, Noriaki / Gamble, Lara / Tamerler, Candan / Sarikaya, Mehmet / Castner, David G. / Ohuchi, Fumio S. et al. | 2007
- 427
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Adsorption of genetically engineered proteins studied by time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS). Part B: hierarchical cluster analysis (HCA)Suzuki, Noriaki / Sarikaya, Mehmet / Ohuchi, Fumio S. et al. | 2007
- 434
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Reaction of imidazole in gas phase at very low pressure with Cu foil and Cu oxides studied by X‐ray photoelectron spectroscopyHernández, M. P. / Fernández‐Bertrán, J. F. / Farías, M. H. / Díaz, J. A. et al. | 2007
- 438
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Oxide and nitride protective layers on stainless steel studied by AES, WDS and XPSMandrino, Djordje / Lamut, Martin / Godec, Matjaž / Torkar, Matjaž / Jenko, Monika et al. | 2007
- 445
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ARXPS investigation of diffusion as a limiting process in the incorporation of adatoms into polystyrene surfaces treated by nitrogen plasmasPaynter, R. W. / Roy‐Guay, D. / Parent, G. / Ménard, M. et al. | 2007
- 452
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Polycrystalline iron and mild steel surfaces in caustic solutionCostine, Allan / Thurgate, Stephen / Thornber, Mike / Vernon, Chris et al. | 2007
- 460
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Electron inelastic mean free paths: influence of the modelling energy‐loss functionde la Cruz, W. / Yubero, F. et al. | 2007
- 464
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Summary of ISO/TC 201 Standard: XXIX. ISO 20903: 2006—Surface chemical analysis—Auger electron spectroscopy and X‐ray photoelectron spectroscopy—methods used to determine peak intensities and information required when reporting resultsPowell, C. J. et al. | 2007
- 464
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Summary of ISO-TC 201 Standard: XXIX. ISO 20903: 2006-Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-methods used to determine peak intensities and information required when reporting resultsFNR HREF="fn1">FN ID="fn1">This article is a US Government work and is in the public domain in the USA.Powell, C.J. et al. | 2007