IEEE transactions on electron devices
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
Inhaltsverzeichnis
- 583
-
EDITORIAL - What is in a Page Charge?Saha, S K et al. | 2011
- 583
-
What Is in a Page Charge?Saha, Samar K. et al. | 2011
- 584
-
Resistance and Threshold Switching Voltage Drift Behavior in Phase-Change Memory and Their Temperature Dependence at Microsecond Time Scales Studied Using a Micro-Thermal StageSangBum Kim, / Byoungil Lee, / Asheghi, Mehdi et al. | 2011
- 584
-
Silicon and Column IV Semiconductor Devices - Resistance and Threshold Switching Voltage Drift Behavior in Phase-Change Memory and Their Temperature Dependence at Microsecond Time Scales Studied Using a Micro-Thermal StageKim, S et al. | 2011
- 593
-
Interdigit 4H-SiC Vertical Schottky Diode for Betavoltaic ApplicationsSciuto, A / D'Arrigo, G / Roccaforte, F et al. | 2011
- 600
-
Simulation of “Ab Initio” Quantum Confinement Scattering in UTB MOSFETs Using Three-Dimensional Ensemble Monte CarloRiddet, C / Alexander, C / Brown, A R et al. | 2011
- 609
-
Comparison of 4T and 6T FinFET SRAM Cells for Subthreshold Operation Considering Variability—A Model-Based ApproachMing-Long Fan, / Yu-Sheng Wu, / Vita Pi-Ho Hu, et al. | 2011
- 617
-
Rare-Earth Scandate/TiN Gate Stacks in SOI MOSFETs Fabricated With a Full Replacement Gate ProcessÖzben, Eylem Durğun / Lopes, J M J / Nichau, A et al. | 2011
- 623
-
A Novel Random Telegraph Signal Method to Study Program/Erase Charge Lateral Spread and Retention Loss in a SONOS Flash MemoryHuan-Chi Ma, / You-Liang Chou, / Jung-Piao Chiu, et al. | 2011
- 631
-
Fast $V_{\rm TH}$ Transients After the Program/Erase of Flash Memory Stacks With High-$k$ DielectricsToledano-Luque, María / Degraeve, Robin / Zahid, Mohammed B et al. | 2011
- 631
-
Fast Vth Transients After the Program/Erase of Flash Memory Stacks With High-k DielectricsToledano-Luque, M et al. | 2011
- 631
-
Fast Formula Not Shown Transients After the Program/Erase of Flash Memory Stacks With High- Formula Not Shown DielectricsToledano-Luque, M. / Degraeve, R. / Zahid, M. B. et al. | 2011
- 641
-
Impacts of Multiple-Gated Configuration on the Characteristics of Poly-Si Nanowire SONOS DevicesHsing-Hui Hsu, / Horng-Chih Lin, / Cheng-Wei Luo, et al. | 2011
- 650
-
Completely Quantum–Mechanical Extraction of Equivalent Oxide Thickness of PMOS Gate InsulatorHiraiwa, A / Shima, A / Ishikawa, D et al. | 2011
- 658
-
Compact High-Precision Models for Silicon p-n Step Junction Avalanche-Breakdown VoltagesBauer, F D et al. | 2011
- 664
-
Driving Device Comparison for Phase-Change MemoryLin Li, / Kailiang Lu, / Rajendran, B et al. | 2011
- 672
-
A New Cost-Effective Metal–Insulator–Metal Capacitor Processed at 350 Formula Not Shown Using Formula Not Shown Fully Silicided Amorphous Silicon ElectrodesLee, J. H. / Lin, Y. C. / Chen, B. H. et al. | 2011
- 672
-
A New Cost-Effective Metal-Insulator-Metal Capacitor Processed at 350 °C Using Ni2Si Fully Silicided Amorphous Silicon ElectrodesLee, J-H et al. | 2011
- 672
-
A New Cost-Effective Metal–Insulator–Metal Capacitor Processed at 350 $^{\circ}\hbox{C}$ Using $ \hbox{Ni}_{2}\hbox{Si}$ Fully Silicided Amorphous Silicon ElectrodesJung-Hsiang Lee, / Yi-Chang Lin, / Bo-Han Chen, et al. | 2011
- 677
-
Impact of a Spacer Dielectric and a Gate Overlap/Underlap on the Device Performance of a Tunnel Field-Effect TransistorChattopadhyay, A / Mallik, A et al. | 2011
- 684
-
Comprehensive Study on Negative Capacitance Effect Observed in MOS(n) Capacitors With Ultrathin Gate OxidesShu-Jau Chang, / Jenn-Gwo Hwu, et al. | 2011
- 691
-
A Microscopically Accurate Model of Partially Ballistic NanoMOSFETs in Saturation Based on Channel BackscatteringGiusi, G / Iannaccone, G / Crupi, F et al. | 2011
- 698
-
Two-Dimensional Analysis of Field-Plate Effects on Surface-State-Related Current Transients and Power Slump in GaAs FETsHorio, K / Tanaka, T / Itagaki, K et al. | 2011
- 698
-
Compound Semiconductor Devices - Two-Dimensional Analysis of Field-Plate Effects on Surface-State-Related Current Transients and Power Slump in GaAs FETsHorio, K et al. | 2011
- 704
-
Simulation of Short-Channel Effects in N- and Ga-Polar AlGaN/GaN HEMTsPil Sung Park, / Rajan, S et al. | 2011
- 709
-
Coplanar Waveguides on High-Resistivity Silicon Substrates With Attenuation Constant Lower Than 1 dB/mm for Microwave and Millimeter-Wave BandsMakita, T / Tamai, I / Seki, S et al. | 2011
- 716
-
Tunneling Processes in a Triangular Multibarrier Semiconductor HeterostructureLeite, T N / de Oliveira, H P et al. | 2011
- 720
-
Proposal of High-Electron Mobility Transistors With Strained InN ChannelKuzmik, J / Georgakilas, A et al. | 2011
- 725
-
A Novel Transparent AZO-Gated Al0.2Ga0.8As/In0.2Ga0.8As pHEMT and Photosensing Characteristics ThereofLee, C-S et al. | 2011
- 725
-
A Novel Transparent AZO-Gated Formula Not Shown pHEMT and Photosensing Characteristics ThereofLee, C. S. / Chou, B. Y. / Hsu, W. C. et al. | 2011
- 725
-
A Novel Transparent AZO-Gated $\hbox{Al}_{0.2} \hbox{Ga}_{0.8}\hbox{As/In}_{0.2}\hbox{Ga}_{0.8}\hbox{As}$ pHEMT and Photosensing Characteristics ThereofChing-Sung Lee, / Bo-Yi Chou, / Wei-Chou Hsu, et al. | 2011
- 732
-
Optoelectronics, Display, Imaging - Color Range Images Captured by a Four-Phase CMOS Image SensorLin, D-L et al. | 2011
- 732
-
Color Range Images Captured by a Four-Phase CMOS Image SensorDong-Long Lin, / Ching-Chun Wang, / Chia-Ling Wei, et al. | 2011
- 740
-
A Two-Stage Charge Transfer Active Pixel CMOS Image Sensor With Low-Noise Global Shuttering and a Dual-Shuttering ModeYasutomi, K / Itoh, S / Kawahito, S et al. | 2011
- 748
-
Three-Dimensional Hybrid Integration Technology of CMOS, MEMS, and Photonics Circuits for Optoelectronic Heterogeneous Integrated SystemsKang-Wook Lee, / Noriki, A / Kiyoyama, K et al. | 2011
- 758
-
High-Performance GaNAsSb/GaAs 1.55-$\mu\hbox{m}$ Waveguide PhotodetectorXu, Z / Saadsaoud, N / Loke, W K et al. | 2011
- 758
-
High-Performance GaNAsSb/GaAs 1.55-μm Waveguide PhotodetectorXu, Z et al. | 2011
- 758
-
High-Performance GaNAsSb/GaAs 1.55- Formula Not Shown Waveguide PhotodetectorXu, Z. / Saadsaoud, N. / Loke, W. K. et al. | 2011
- 764
-
Low-Voltage Transparent Indium–Zinc–Oxide Coplanar Homojunction TFTs Self-Assembled on Inorganic Proton ConductorsJia Sun, / Jie Jiang, / Aixia Lu, et al. | 2011
- 769
-
The Soft Formula Not Shown Superjunction Insulated Gate Bipolar Transistor: A High Speed Structure With Enhanced Electron InjectionAntoniou, M. / Udrea, F. / Bauer, F. et al. | 2011
- 769
-
Solid-State Power and High Voltage Devices - The Soft Punchthrough+ Superjunction Insulated Gate Bipolar Transistor: A High Speed Structure With Enhanced Electron InjectionAntoniou, M et al. | 2011
- 769
-
The Soft $\hbox{Punchthrough}+$ Superjunction Insulated Gate Bipolar Transistor: A High Speed Structure With Enhanced Electron InjectionAntoniou, M / Udrea, F / Bauer, F et al. | 2011
- 769
-
The Soft Punchthrough+ Superjunction Insulated Gate Bipolar Transistor: A High Speed Structure With Enhanced Electron InjectionAntoniou, M. / Udrea, F. / Bauer, F. et al. | 2011
- 776
-
The Mechanism of Enhanced Diffusion of Phosphorus in Silicon During Rapid Photothermal Processing of Solar CellsShishiyanu, S / Singh, R / Shishiyanu, T et al. | 2011
- 776
-
Materials, Processing and Packaging - The Mechanism of Enhanced Diffusion of Phosphorus in Silicon During Rapid Photothermal Processing of Solar CellsShishiyanu, S et al. | 2011
- 782
-
Solid-State Device Phenomena - Thermal Stress Analysis of Ge1Sb4Te7-Based Phase-Change Memory DevicesShin, S et al. | 2011
- 782
-
Thermal Stress Analysis of Formula Not Shown -Based Phase-Change Memory DevicesShin, S. / Kim, K. M. / Song, J. et al. | 2011
- 782
-
Thermal Stress Analysis of $\hbox{Ge}_{1}\hbox{Sb}_{4} \hbox{Te}_{7}$-Based Phase-Change Memory DevicesSangwoo Shin, / Kyung Min Kim, / Jiwoon Song, et al. | 2011
- 792
-
Integrated Batteryless Electron TimerWatanabe, H / Ushijima, T / Hagiwara, N et al. | 2011
- 798
-
Semiclassical and Quantum Transport in CNTFETs Using Monte Carlo SimulationHuu-Nha Nguyen, / Querlioz, D / Galdin-Retailleau, S et al. | 2011
- 805
-
FinFET SRAM Cell Optimization Considering Temporal Variability Due to NBTI/PBTI, Surface Orientation and Various Gate DielectricsVita Pi-Ho Hu, / Ming-Long Fan, / Chien-Yu Hsieh, et al. | 2011
- 812
-
Effect of Formula Not Shown Plasma Nitridation on Hot-Carrier Instability and Low-Frequency Noise in Gd-Doped High- Formula Not Shown Dielectric nMOSFETsChen, Y. T. / Chen, K. M. / Lin, C. L. et al. | 2011
- 812
-
Effect of $\hbox{NH}_{3}$ Plasma Nitridation on Hot-Carrier Instability and Low-Frequency Noise in Gd-Doped High-$ \kappa$ Dielectric nMOSFETsYu-Ting Chen, / Kun-Ming Chen, / Cheng-Li Lin, et al. | 2011
- 812
-
Effect of NH3 Plasma Nitridation on Hot-Carrier Instability and Low-Frequency Noise in Gd-Doped High-k Dielectric nMOSFETsChen, Y-T et al. | 2011
- 819
-
Gate-Side and Substrate-Side Oxide Trap and Interface State Generation in Conventional and Nitrided Tunnel Oxides of Floating Gate CellsBeug, M F / Tempel, G / Hofmann, K R et al. | 2011
- 826
-
Integration of Self-Assembled Redox Molecules in Flash Memory DevicesShaw, J / Yu-Wu Zhong, / Hughes, K J et al. | 2011
- 826
-
Molecular and Organic Devices - Integration of Self-Assembled Redox Molecules in Flash Memory DevicesShaw, J et al. | 2011
- 835
-
Effects of Cathode Confinement on the Performance of Polymer/Fullerene Photovoltaic Cells in the Thermal TreatmentChunfu Zhang, / Yue Hao, / Shi-Wun Tong, et al. | 2011
- 843
-
High-Frequency Behavior of Graphene-Based Interconnects—Part I: Impedance ModelingSarkar, Deblina / Chuan Xu, / Hong Li, et al. | 2011
- 853
-
High-Frequency Behavior of Graphene-Based Interconnects—Part II: Impedance Analysis and Implications for Inductor DesignSarkar, D / Chuan Xu, / Hong Li, et al. | 2011
- 860
-
Plasmonic Organic Photovoltaic Devices on Transparent Carbon Nanotube FilmsKymakis, E / Stratakis, E / Koudoumas, E et al. | 2011
- 865
-
Mixed-Signal Organic Integrated Circuits in a Fully Photolithographic Dual Threshold Voltage TechnologyNausieda, I / Ryu, K K / He, D D et al. | 2011
- 874
-
Physical Foundation of a Recently Proposed Schottky-Contact ModelSchroeder, D et al. | 2011
- 874
-
Correspondence - Physical Foundation of a Recently Proposed Schottky-Contact ModelSehroeder, D et al. | 2011
- 876
-
Vacuum Electron Devices - Analysis of Multipactor RF Breakdown Thresholds in Elliptical WaveguidesFrotanpour, A et al. | 2011
- 876
-
Analysis of Multipactor RF Breakdown Thresholds in Elliptical WaveguidesFrotanpour, A / Dadashzadeh, G / Shahabadi, M et al. | 2011
- 882
-
Pierce-Type One-Dimensional Eulerian Hydrodynamic Analysis of a Plasma-Filled Helix Traveling-Wave TubeDatta, S K / Kumar, L / Basu, B et al. | 2011
- 891
-
BRIEFS - Embedded Memory Capability of Four-Terminal Relay TechnologyJeon, J et al. | 2011
- 891
-
Embedded Memory Capability of Four-Terminal Relay TechnologyJaeseok Jeon, / Wookhyun Kwon, / Tsu-Jae King Liu, et al. | 2011
- 895
-
Investigation of High-Frequency Noise Characteristics in Tensile-Strained nMOSFETsSheng-Chun Wang, / Pin Su, / Kun-Ming Chen, et al. | 2011
- 901
-
A Novel Method to Improve Laser Anneal Worsened Negative Bias Temperature Instability in 40-nm CMOS TechnologyMing-Shing Chen, / Yean-Kuen Fang, / Feng-Renn Juang, et al. | 2011
- 906
-
Heterogeneous Chip Integration Process for Flexible Wireless Microsystem ApplicationTzu-Yuan Chao, / Chia-Wei Liang, / Cheng, Y T et al. | 2011
- 910
-
A Locally Amplified Strain Sensor Based on a Piezoelectric Polymer and Organic Field-Effect TransistorsYu-Jen Hsu, / Zhang Jia, / Kymissis, I et al. | 2011
- 918
-
ANNOUNCEMENTS - Call for Papers — Special Issue of IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY on Materials, Processing, and Reliability of 3D Interconnects| 2011
- 918
-
Special issue on materials, processing and reliability of 3D interconnects| 2011
- 919
-
2011 Bipolar/BiCMOS Circuits and Technology Meeting| 2011
- 919
-
Call for Papers — 2011 Bipolar/BiCMOS Circuits and Technology Meeting| 2011
- 920
-
37th IEEE Photovoltaic Specialists Conference| 2011
- 920
-
37th IEEE Photovoltaic Specialists Conference (PVSC)| 2011
- C1
-
Table of contents| 2011
- C2
-
IEEE Transactions on Electron Devices publication information| 2011
- C3
-
IEEE Transactions on Electron Devices information for authors| 2011