IEEE Transactions on Nuclear Science
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
Inhaltsverzeichnis
- 0_1
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Table of Contents| 1998
- 1
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1998 Index IEEE Transactions on Nuclear Science Vol. 45 (Author Index)| 1998
- 26
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Subject index| 1998
- 2324
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[Copyright]| 1998
- 2327
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General Chairman's CommentsSchwank, Jim et al. | 1998
- 2328
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1998 Session Chairpersons| 1998
- 2328
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1998 Conference Committee| 1998
- 2329
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Radiation Effects Steering Committee| 1998
- 2330
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Awards Chairman's CommentsPease, Ronald L. et al. | 1998
- 2331
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Outstanding Conference Paper Awards| 1998
- 2331
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Outstanding Conference Paper Award| 1998
- 2333
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Nominated Papers| 1998
- 2334
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Guest Editor's CommentsSexton, Fred W. et al. | 1998
- 2335
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Reviewers For This Issue| 1998
- 2337
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In Memoriam| 1998
- 2339
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Space Charged Limited Degradation of Bipolar Oxides at Low Electric FieldsWitczak, S. C. / Lacoe, R. C. / Mayer, D. C. et al. | 1998
- 2339
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Session A: Basic Mechanisms of Radiation Effects - Space Charge Limited Degradation of Bipolar Oxides at Low Electric FieldsWitczak, S.C. et al. | 1998
- 2352
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Modeling Low-Dose-Rate Effects in Irradiated Bipolar-Base OxidesGraves, R. J. / Cirba, C. R. / Schrimpf, R. D. et al. | 1998
- 2352
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Session A: Basic Mechanisms of Radiation Effects - Modeling Low-Dose-Rate Effects in Irradiated Bipolar-Base OxidesGraves, R.J. et al. | 1998
- 2361
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Session A: Basic Mechanisms of Radiation Effects - Electrical Probing of Surface and Bulk Traps in Proton-Irradiated Gate-Assisted Lateral PNP TransistorsNiu, G. et al. | 1998
- 2361
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Electrical Probing of Surface and Bulk Traps in Proton-Irradiated Gate-Assisted Lateral PNP TransistorsNiu, G. / Banerjee, G. / Cressler, J. D. et al. | 1998
- 2366
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Effects of Ischronal Annealing and Irradiation Temperature on Radiation-Induced Trapped ChargeFleetwood, D. M. / Winokur, P. S. / Shaneyfelt, M. R. et al. | 1998
- 2366
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Session A: Basic Mechanisms of Radiation Effects - Effects of Isochronal Annealing and Irradiation Temperature on Radiation-Induced Trapped ChargeFleetwood, D.M. et al. | 1998
- 2375
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Session A: Basic Mechanisms of Radiation Effects - Radiation Induced Leakage Current and Stress Induced Leakage Current in Ultra-Thin Gate OxidesCeschia, M. et al. | 1998
- 2375
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Radiation Induced Leakage Current and Stress Induced Leakage Current in Ultra-Thin Gate OxidesCeschia, M. / Paccagnella, A. / Cester, A. et al. | 1998
- 2383
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Session A: Basic Mechanisms of Radiation Effects - Fowler-Nordheim Characteristics of Electron Irradiated MOS CapacitorsCandelori, A. et al. | 1998
- 2383
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Fowler-Nordheim Characteristics of Electron Irradiated MOS CapacitorsCandelori, A. / Paccagnella, A. / Cammarata, M. et al. | 1998
- 2391
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The Effects of Irradiation and Proton Implantation on the Density of Mobile Protons in SiO~2 Thin FilmsVanheusden, K. / Fleetwood, D. M. / Shaneyfelt, M. R. et al. | 1998
- 2391
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Session A: Basic Mechanisms of Radiation Effects - The Effects of Irradiation and Proton Implantation on the Density of Mobile Protons in SiO2 Thin FilmsVanheusden, K. et al. | 1998
- 2398
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H^+ Motion in SiO~2: Incompatible Results from Hydrogen-Annealing and Radiation ModelsStahlbush, R. E. / Lawrence, R. K. / Hughes, H. L. et al. | 1998
- 2398
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Session A: Basic Mechanisms of Radiation Effects - H+ Motion in SiO2: Incompatible Results from Hydrogen-Annealing and Radiation ModelsStahlbush, R.E. et al. | 1998
- 2408
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Session A: Basic Mechanisms of Radiation Effects - Microscopic Mechanisms of Radiation-Induced Proton Density Decay in SiO2 FilmsKarna, S.P. et al. | 1998
- 2408
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Microscopic Mechanisms of Radiation-Induced Proton Density in SiO~2 FilmsKarna, S. P. / Pugh, R. D. / Chavez, J. R. et al. | 1998
- 2413
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Session A: Basic Mechanisms of Radiation Effects - A Comprehensive Physically Based Predictive Model for Radiation Damage in MOS SystemsLenahan, M. et al. | 1998
- 2413
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A Comprehensive Physically Based Predictive Model for Radiation Damage in MOS SystemsLenahan, P. M. / Conley, J. F. et al. | 1998
- 2424
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An Investigation of the Spatial Location of Proton-Induced Traps in SiGe HBTsRoldan, J. M. / Niu, G. / Ansley, W. E. et al. | 1998
- 2424
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Session A: Basic Mechanisms of Radiation Effects - An Investigation of the Spatial Location of Proton-Induced Traps in SiGe HBTsRoldan, J.M. et al. | 1998
- 2430
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Session A: Basic Mechanisms of Radiation Effects - Effects of 3 MeV Proton Irradiation on the Excitonic Lifetime in Gallium ArsenideKhanna, S.M. et al. | 1998
- 2430
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Effects of 3 MeV Proton Irradiation on the Excitonic Lifetime in Gallium ArsenideKhanna, S. M. / Charbonneau, S. / Piva, P. G. et al. | 1998
- 2436
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Development of a Radiation Tolerant 1M SRAM on Fully-Depleted SOIBrady, F. T. / Brown, R. / Rockett, L. et al. | 1998
- 2436
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Session B: Isolation Technologies - Development of a Radiation Tolerant 1M SRAM on Fully-Depleted SOIBrady, T. et al. | 1998
- 2442
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Total Dose Radiation Hard 1.35 m SOI CMOS TechnologyLiu, S. T. / Jenkins, W. C. / Hughes, H. L. et al. | 1998
- 2442
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Session B: Isolation Technologies - Total Dose Radiation Hard 0.35 mm SOI CMOS TechnologyLiu, S.T. et al. | 1998
- 2450
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A Study of the Radiation Sensitivity of Non-Crystalline SiO~2 Films Using Spectroscopic EllipsometryMrstik, B. J. / McMarr, P. J. / Lawrence, R. K. et al. | 1998
- 2450
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Session B: Isolation Technologies - A Study of the Radiation Sensitivity of Non-Crystalline SiO2 Films Using Spectroscopic EllipsometryMrstik, B.J. et al. | 1998
- 2458
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Total Dose Induced Latch in Short Channel NMOS/SOI TransistorsFerlet-Cavrois, V. / Quoizola, S. / Musseau, O. et al. | 1998
- 2458
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Session B: Isolation Technologies - Total Dose Induced Latch in Short Channel NMOS-SOI TransistorsFerlet-Cavrois, V. et al. | 1998
- 2467
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Internuclear Cascade-Evaporation Model for LET Spectra of 200 MeV Protons Used for Parts TestingO'Neill, P. M. / Badhwar, G. D. / Culpepper, W. X. et al. | 1998
- 2467
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Session C: Single-Event Mechanisms - Internuclear Cascade-Evaporation Model for LET Spectra of 200 MeV Protons Used for Parts TestingO'Neill, M. et al. | 1998
- 2475
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Comparative SEU Sensitivities to Relativistic Heavy IonsKoga, R. / Crain, S. H. / Crain, W. R. et al. | 1998
- 2475
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Session C: Single-Event Mechanisms - Comparative SEU Sensitivities to Relativistic Heavy IonsKoga, R. et al. | 1998
- 2483
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Impact of Ion Energy on Single-Event UpsetDodd, P. E. / Musseau, O. / Shaneyfelt, M. R. et al. | 1998
- 2483
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Session C: Single-Event Mechanisms - Impact of Ion Energy on Single-Event UpsetDodd, P.E. et al. | 1998
- 2492
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Effect of Ion Energy Upon Dielectric Breakdown of the Capacitor Response in Vertical Power MOSFETsTitus, J. L. / Wheatley, C. F. / Van Tyne, K. M. et al. | 1998
- 2492
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Session C: Single-Event Mechanisms - Effect of Ion Energy Upon Dielectric Breakdown of the Capacitor Response in Vertical Power MOSFETsTitus, J.L. et al. | 1998
- 2500
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Session C: Single-Event Mechanisms - Breakdown of Gate Oxides During Irradiation with Heavy IonsJohnston, A.H. et al. | 1998
- 2500
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Breakdown of Gate Oxides During Irradiation with Heavy IonsJohnston, A. H. / Swift, G. M. / Miyahira, T. et al. | 1998
- 2509
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Precursor Ion Damage and Angular Dependence of Single Event Gate Rupture in Thin OxidesSexton, F. W. / Fleetwood, D. M. / Shaneyfelt, M. R. et al. | 1998
- 2509
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Session C: Single-Event Mechanisms - Precursor Ion Damage and Angular Dependence of Single Event Gate Rupture in Thin OxidesSexton, F.W. et al. | 1998
- 2519
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Energy-Resolved Neutron SEU Measurements from 22 to 160 MeVJohansson, K. / Dyreklev, P. / Granbom, B. et al. | 1998
- 2519
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Session C: Single-Event Mechanisms - Energy-Resolved Neutron SEU Measurements from 22 to 160 MeVJohansson, K. et al. | 1998
- 2527
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Session C: Single-Event Mechanisms - Single-Event Burnout of Epitaxial Bipolar TransistorsKuboyama, S. et al. | 1998
- 2527
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Single-Event Burnout of Epitaxial Bipolar TransistorsKuboyama, S. / Sugimoto, K. / Shugyo, S. et al. | 1998
- 2534
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SEU Response of an Entire SRAM Cell Simulated as One Contiguous Three Dimensional Device DomainRoche, P. / Palau, J. M. / Belhaddad, K. et al. | 1998
- 2534
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Session C: Single-Event Mechanisms - SEU Response of an Entire SRAM Cell Simulated as One Contiguous Three Dimensional Device DomainRoche, Ph et al. | 1998
- 2544
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Time-Resolved Ion Beam Induced Charge Collection (TRIBICC) in MicroelectronicsSchoene, H. / Walsh, D. S. / Sexton, F. W. et al. | 1998
- 2544
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Session C: Single-Event Mechanisms - Time-Resolved Ion Beam Induced Charge Collection (TRIBICC) in MicroelectronicsSchöne, H. et al. | 1998
- 2550
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Session C: Single-Event Mechanisms - The SEU Figure of Merit and Proton Upset Rate CalculationsPetersen, E.L. et al. | 1998
- 2550
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The SEU Figure of Merit and Proton Upset Rate CalculationsPetersen, E. L. et al. | 1998
- 2563
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Technique to Measure an Ion Track ProfileMusseau, O. / Ferlet-Cavrois, V. / Campbell, A. B. et al. | 1998
- 2563
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Session C: Single-Event Mechanisms - Technique to Measure an Ion Track ProfileMusseau, O. et al. | 1998
- 2571
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Enhanced Low-Dose-Rate Sensitivity of a Low-Dropout Voltage RegulatorPease, R. L. / McClure, S. / Gorelick, J. et al. | 1998
- 2571
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Session D: Radiation Effects in Devices and Integrated Circuits - Enhanced Low-Dose-Rate Sensitivity of a Low-Dropout Voltage RegulatorPease, R.L. et al. | 1998
- 2577
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Session D: Radiation Effects in Devices and Integrated Circuits - Total Dose Effects on Gate Controlled Lateral PNP Bipolar Junction TransistorsCazenave, Ph et al. | 1998
- 2577
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Total Dose Effects on Gate Controlled Lateral PNP Bipolar Junction TransistorsCazenave, P. / Fouillat, P. / Montagner, X. et al. | 1998
- 2584
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Session D: Radiation Effects in Devices and Integrated Circuits - Challenges in Hardening Technologies Using Shallow-Trench IsolationShaneyfelt, M.R. et al. | 1998
- 2584
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Challenges in Hardening Technologies Using Shallow-Trench IsolationShaneyfelt, M. R. / Dodd, P. E. / Draper, B. L. et al. | 1998
- 2593
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TCAD-Assisted Analysis of Back-Channel Leakage in Irradiated Mesa SOI nMOSFETsMilanowski, R. J. / Pagey, M. P. / Massengill, L. W. et al. | 1998
- 2593
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Session D: Radiation Effects in Devices and Integrated Circuits - TCAD-Assisted Analysis of Back-Channel Leakage in Irradiated Mesa SOI nMOSFETsMilanowski, R.J. et al. | 1998
- 2600
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Session D: Radiation Effects in Devices and Integrated Circuits - Current Radiation Issues for Programmable Elements and DevicesKatz, R. et al. | 1998
- 2600
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Current Radiation Issues for Programmable Elements and DevicesKatz, R. / Wang, J. J. / Koga, R. et al. | 1998
- 2611
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Integrating Analog-to-Digital Converter Radiation Hardness Test Technique and ResultsKalashnikov, O. A. / Demidov, A. A. / Figurov, V. S. et al. | 1998
- 2611
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Session D: Radiation Effects in Devices and Integrated Circuits - Integrating Analog-to-Digital Converter Radiation Hardness Test Technique and ResultsKalashnikov, O.A. et al. | 1998
- 2616
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Session D: Radiation Effects in Devices and Integrated Circuits - Dose Rate and Total Dose Dependence of Low Frequency Noise Performance, I-V Curves and Sidegating for GaAs MESFETsHiemstra, D.M. et al. | 1998
- 2616
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Dose Rate and Total Dose Dependence of Low Frequency Noise Performance, I-V Curves and Sidegating for GaAs MESFETsHiemstra, D. M. / Kizeevi, A. A. / Hou, L. Z. et al. | 1998
- 2624
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Session D: Radiation Effects in Devices and Integrated Circuits - Damage Mechanisms in Radiation-Tolerant Amorphous Silicon Solar CellsSrour, J.R. et al. | 1998
- 2624
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Damage Mechanisms in Radiation-Tolerant Amorphous Silicon Solar CellsSrour, J. R. / Vendura, G. J. / Lo, D. H. et al. | 1998
- 2632
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Session E: Hardness Assurance and Testing Techniques - Proton Damage Effects in Linear Integrated CircuitsRax, B.G. et al. | 1998
- 2632
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Proton Damage Effects in Linear Integrated CircuitsRax, B. G. / Johnston, A. H. / Lee, C. I. et al. | 1998
- 2638
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Effects of Reliability Screening Tests on Bipolar Integrated Circuits During Total Dose IrradiationBarillot, C. / Serres, O. / Marec, R. et al. | 1998
- 2638
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Session E: Hardness Assurance and Testing Techniques - Effects of Reliability Screening Tests on Bipolar Integrated Circuits During Total Dose IrradiationBarillot, C. et al. | 1998
- 2644
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Session E: Hardness Assurance and Testing Techniques - Moderated Degradation Enhancement of Lateral pnp Transistors Due to Measurement BiasWitczak, S.C. et al. | 1998
- 2644
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Moderated Degradation Enhancement of Lateral pnp Transitors Due to Measurement BiasWitczak, S. C. / Schrimpf, R. D. / Barnaby, H. J. et al. | 1998
- 2649
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Session E: Hardness Assurance and Testing Techniques - Study of Low-Dose-Rate Radiation Effects on Commercial Linear Bipolar ICsFreitag, R.K. et al. | 1998
- 2649
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Study of Low-Dose-Rate Radiation Effects on Commercial Linear Bipolar ICsFreitag, R. K. / Brown, D. B. et al. | 1998
- 2659
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A Way to Improve Dose Rate Laser Simulation AdequacySkorobogatov, P. K. / Nikiforov, A. Y. / Demidov, A. A. et al. | 1998
- 2659
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Session E: Hardness Assurance and Testing Techniques - A Way to Improve Dose Rate Laser Simulation AdequacySkorobogatov, P.K. et al. | 1998
- 2665
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Session E: Hardness Assurance and Testing Techniques - Evaluation of Proposed Hardness Assurance Method for Bipolar Linear Circuits with Enhanced Low Dose Rate Sensitivity (ELDRS)Pease, R.L. et al. | 1998
- 2665
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Evaluation of Proposed Hardness Assurance Method for Bipolar Linear Circuits with Enhanced Low Dose Rate Sensitivity (ELDRS)Pease, R. L. / Gehlhausen, M. / Krieg, J. et al. | 1998
- 2673
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First Observations of Enhanced Low Dose Rate Sensitivity (ELDRS) in Space: One Part of the MPTB ExperimentTitus, J. L. / Combs, W. E. / Turflinger, T. L. et al. | 1998
- 2673
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Session E: Hardness Assurance and Testing Techniques - First Observations of Enhanced Low Dose Rate Sensitivity (ELDRS) in Space: One Part of the MPTB ExperimentTitus, J.L. et al. | 1998
- 2681
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Session F: Radiation Dosimetry - Dosimetry Based on the Erasure of Floating Gates in the Natural Radiation Environments in SpaceScheick, L.Z. et al. | 1998
- 2681
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Dosimetry Based on the Erasure of Floating Gates in the Natural Radiation Environments in SpaceScheick, L. Z. / McNulty, P. J. / Roth, D. R. et al. | 1998
- 2689
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Session F: Radiation Dosimetry - Electrical Performance and Radiation Sensitivity of Stacked PMOS Dosimeters Under Bulkbias ControlO'Connell, B. et al. | 1998
- 2689
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Electrical Performance and Radiation Sensitivity of Stacked PMOS Dosimeters Under Bulkbias ControlO'Connell, B. / Conneely, C. / McCarthy, C. et al. | 1998
- 2695
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Session F: Radiation Dosimetry - Irradiated Integrated Circuits Dose-Attenuation Mapping Using Optically Stimulated Phosphors for Packaging DosimetryDusseau, L. et al. | 1998
- 2695
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Irradiated Integrated Circuits Dose-Attenuation Mapping Using Optically Stimulated Phosphors for Packaging DosimetryDusseau, L. / Polge, G. / Albert, L. et al. | 1998
- 2700
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Session F: Radiation Dosimetry - Charge Collection and Radiation Hardness of a SOI Microdosimeter for Medical and Space ApplicationsBradley, P.D. et al. | 1998
- 2700
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Charge Collection and Radiation Hardness of a SOI Microdosimeter for Medical and Space ApplicationsBradley, P. D. / Rosenfeld, A. B. / Lee, K. K. et al. | 1998
- 2711
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Validation of a Comprehensive Space Radiation Transport CodeShinn, J. L. / Cucinotta, F. A. / Simonsen, L. C. et al. | 1998
- 2711
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Session F: Radiation Dosimetry - Validation of a Comprehensive Space Radiation Transport CodeShinn, J.L. et al. | 1998
- 2720
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Spectrum Determination and Modification of the AFRL Co-60 CellTurinetti, J. R. / Kemp, W. T. / Chavez, J. R. et al. | 1998
- 2720
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Session F: Radiation Dosimetry - Spectrum Determination and Modification of the AFRL Co-60 CellTurinetti, J.R. et al. | 1998
- 2727
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Emerging Radiation Hardness Assurance (RHA) Issues: A NASA Approach for Spaceflight ProgramsLaBel, K. A. / Johnston, A. H. / Barth, J. L. et al. | 1998
- 2727
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Session G: Radiation Effects in Commercial Electronics and Space Systems - Emerging Radiation Hardness Assurance (RHA) Issues: A NASA Approach for Spaceflight ProgramsLaBel, K.A. et al. | 1998
- 2737
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Observed Radiation-Induced Degradation of Commercial-Off-The-Shelf (COTS) Devices Operating in Low-Earth OrbitUnderwood, C. I. / Oldfield, M. K. et al. | 1998
- 2737
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Session G: Radiation Effects in Commercial Electronics and Space Systems - Observed Radiation-Induced Degradation of Commercial-Off-The-Shelf (COTS) Devices Operating in Low-Earth OrbitUnderwood, C.I. et al. | 1998
- 2745
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Possible Role for Secondary Particles in Proton-Induced Single Event Upsets of Modern DevicesSavage, M. W. / McNulty, P. J. / Roth, D. R. et al. | 1998
- 2745
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Session G: Radiation Effects in Commercial Electronics and Space Systems - Possible Role for Secondary Particles in Proton-Induced Single Event Upsets of Modern DevicesSavage, M.W. et al. | 1998
- 2752
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Shielding Electronics Behind Composite StructuresSpieth, B. D. / Qassim, K. S. / Pittman, R. N. et al. | 1998
- 2752
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Session G: Radiation Effects in Commercial Electronics and Space Systems - Shielding Electronics Behind Composite StructuresSpieth, B.D. et al. | 1998
- 2758
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Session G: Radiation Effects in Commercial Electronics and Space Systems - Compact Environmental Anomaly Sensor (CEASE): A Novel Spacecraft Instrument for In Situ Measurements of Environmental ConditionsDichter, B.K. et al. | 1998
- 2758
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Compact Environmental Anomaly Sensor (CEASE): A Novel Spacecraft Instrument for In Situ MeasurementsDichter, B. K. / McGarity, J. O. / Oberhardt, M. R. et al. | 1998
- 2765
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Dose-Depth and SEU Monitors for the STRV-1c SatelliteThomson, I. / Hartshorn, A. / Brown, M. et al. | 1998
- 2765
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Session G: Radiation Effects in Commercial Electronics and Space Systems - Dose-Depth and SEU Monitors for the STRV-1c SatelliteThomson, I. et al. | 1998
- 2771
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Session G: Radiation Effects in Commercial Electronics and Space Systems - SEE Flight Data from Japanese SatellitesGoka, T. et al. | 1998
- 2771
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SEE Flight Data from Japanese SatellitesGoka, T. / Matsumoto, H. / Nemoto, N. et al. | 1998
- 2779
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Radiation Response of a MEMS Accelerometer: An Electrostatic ForceEdmonds, L. D. / Swift, G. M. / Lee, C. I. et al. | 1998
- 2779
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Session H: Radiation Effects in Emerging Technologies and Photonics - Radiation Response of a MEMS Accelerometer: An Electrostatic ForceEdmonds, L.D. et al. | 1998
- 2789
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Session H: Radiation Effects in Emerging Technologies and Photonics - Radiation Effects on Surface Micromachined Comb Drives and MicroenginesSchanwald, L.P. et al. | 1998
- 2789
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Radiation Effects on Surface Micromachined Comb Drives and MicroenginesSchanwald, L. P. / Schwank, J. R. / Sniegowski, J. J. et al. | 1998
- 2799
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Total-Dose Radiation-Hard Diamond-Based Hydrogen SensorKerns, D. V. / Kang, W. P. / Davidson, J. L. et al. | 1998
- 2799
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Session H: Radiation Effects in Emerging Technologies and Photonics - Total-Dose Radiation-Hard Diamond-Based Hydrogen SensorKerns Jr, D.V. et al. | 1998
- 2805
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Session H: Radiation Effects in Emerging Technologies and Photonics - Radiation Effects in Ultraviolet Sensors Based on Natural DiamondGromov, D.V. et al. | 1998
- 2805
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Radiation Effects in Ultraviolet Sensors Based on Natural DiamondGromov, D. V. / Figurov, V. S. / Kraskov, V. B. et al. | 1998
- 2808
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Proton Induced Damage in SiC Light Emitting DiodesHinrichsen, P. F. / Houdayer, A. J. / Barry, A. L. et al. | 1998
- 2808
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Session H: Radiation Effects in Emerging Technologies and Photonics - Proton Induced Damage in SiC Light Emitting DiodesHinrichsen, P.F. et al. | 1998
- 2813
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Session H: Radiation Effects in Emerging Technologies and Photonics - The Effects of 3 MeV Proton and Cobalt 60 Gamma Irradiations on Light Emission in Silicon Emitter-Base Bipolar JunctionsAboujja, S. et al. | 1998
- 2813
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The Effects of 3 MeV Proton and Cobalt 60 Gamma Irradiations on Light Emission in Silicon Emitter-Base Bipolar JunctionsAboujja, S. / Carlone, C. / Charles, J.-P. et al. | 1998
- 2820
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Session H: Radiation Effects in Emerging Technologies and Photonics - Damage Induced in 100% Internal Carrier Collection Efficiency Silicon Photodiodes by 10-60 keV Ion IrradiationRitzau, S.M. et al. | 1998
- 2820
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Damage Induced in 100% Internal Carrier Collection Efficiency Silicon Photodiodes by 10-60 keV Ion IrradiationRitzau, S. M. / Funsten, H. O. / Harper, R. W. et al. | 1998
- 2826
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Session H: Radiation Effects in Emerging Technologies and Photonics - Annealing Effects on Multi-Quantum Well Laser Diodes After Proton IrradiationZhao, Y.F. et al. | 1998
- 2826
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Annealing Effects on Multi-Quantum Well Laser Diodes After Proton IrradiationZhao, Y. F. / Schrimpf, R. D. / Patwary, A. R. et al. | 1998
- 2833
-
Session H: Radiation Effects in Emerging Technologies and Photonics - Emerging Optocoupler Issues with Energetic Particle-Induced Transients and Permanent Radiation DegradationReed, R.A. et al. | 1998
- 2833
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Emerging Optocoupler Issues with Energetic Particle-Induced Transients and Permanent Radiation DegradationReed, R. A. / Marshall, P. W. / Johnston, A. H. et al. | 1998
- 2842
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Session H: Radiation Effects in Emerging Technologies and Photonics - Proton-Induced Transient Effects in a Metal-Semiconductor-Metal (MSM) Photodetector for Optical-Based Data TransferMarshall, C.J. et al. | 1998
- 2842
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Proton-Induced Transient Effects in a Metal-Semiconductor-Metal (MSM) Photodetector for Optical-Based Data TransferMarshall, C. J. / Marshall, P. W. / Carts, M. A. et al. | 1998
- 2849
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Session H: Radiation Effects in Emerging Technologies and Photonics - Alpha Particle, Proton, and X-ray Damage in Fully Depleted PN-Junction CCD Detectors for X-ray Imaging and SpectroscopyMeidinger, N. et al. | 1998
- 2849
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Alpha Particle, Proton, and X-ray Damage in Fully Depleted PN-Junction CCD Detectors for X-ray Imaging and SpectroscopyMeidinger, N. / Schmalhofer, B. / Struder, L. et al. | 1998
- 2857
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Session H: Radiation Effects in Emerging Technologies and Photonics - Carrier Removal in p-Type InPMessenger, S.R. et al. | 1998
- 2857
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Carrier Removal in p-Type InPMessenger, S. R. / Walters, R. J. / Xapsos, M. A. et al. | 1998
- 2861
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Session H: Radiation Effects in Emerging Technologies and Photonics - Impact of High Energy Particles on InGaP-InGaAs Pseudomorphic HEMTsOhyama, H. et al. | 1998
- 2861
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Impact of High Energy Particles on InGaP/InGaAs Pseudomorphic HEMTsOhyama, H. / Simoen, E. / Kuroda, S. et al. | 1998
- 2867
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Single-Event Upset Effects in OptocouplersJohnston, A. H. / Swift, G. M. / Miyahira, T. et al. | 1998
- 2867
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Session I: Single Event Effects in Integrated Circuits - Single-Event Upset Effects in OptocouplersJohnston, A.H. et al. | 1998
- 2876
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Session I: Single Event Effects in Integrated Circuits - SEU Induced Errors Observed in Microprocessor SystemsAsenek, V. et al. | 1998
- 2876
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SEU Induced Errors Observed in Microprocessor SystemsAsenek, V. / Underwood, C. / Velazco, R. et al. | 1998
- 2884
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A Simple Approach to SEU Cross Section EvaluationMiroshkin, V. V. / Tverskoy, M. G. et al. | 1998
- 2884
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Session I: Single Event Effects in Integrated Circuits - A Simple Approach to SEU Cross Section EvaluationMiroshkin, V.V. et al. | 1998
- 2891
-
Session I: Single Event Effects in Integrated Circuits - Proton-Induced Dielectric Breakdown of Power MOSFETsTitus, J.L. et al. | 1998
- 2891
-
Proton-Induced Dielectric Breakdown of Power MOSFETsTitus, J. L. / Wheatley, C. F. et al. | 1998
- 2898
-
Anatomy of an In-Flight Anomaly: Investigation of Proton-Induced SEE Test Results for Stacked IBM DRAMsLaBel, K. A. / Marshall, P. W. / Barth, J. L. et al. | 1998
- 2898
-
Session I: Single Event Effects in Integrated Circuits - Anatomy of an In-Flight Anomaly: Investigation of Proton-Induced SEE Test Results for Stacked IBM DRAMsLaBel, K.A. et al. | 1998
- 2904
-
Extensions of the Burst Generation Rate Method for Wider Application to Proton/Neutron-Induced Single Event EffectsNormand, E. et al. | 1998
- 2904
-
Session I: Single Event Effects in Integrated Circuits - Extensions of the Burst Generation Rate Method for Wider Application to Proton-Neutron-Induced Single Event EffectsNormand, E. et al. | 1998
- 2915
-
Session I: Single Event Effects in Integrated Circuits - A New Approach for the Prediction of the Neutron-Induced SEU RateVial, C. et al. | 1998
- 2915
-
A New Approach for the Prediction of the Neutron-Induced SEU RateVial, C. / Palau, J. M. / Gasiot, J. et al. | 1998
- 2921
-
Session I: Single Event Effects in Integrated Circuits - Neutron Induced Soft Errors in CMOS Memories Under Reduced BiasHazucha, P. et al. | 1998
- 2921
-
Neutron Induced Soft Errors in CMOS Memories Under Reduced BiasHazucha, P. / Johansson, K. / Svensson, C. et al. | 1998
- 2929
-
Single Event Upsets in Implantable Cardioverter DefibrillatorsBradley, P. D. / Normand, E. et al. | 1998
- 2929
-
Session I: Single Event Effects in Integrated Circuits - Single Event Upsets in Implantable Cardioverter DefibrillatorsBradley, P.D. et al. | 1998
- 2941
-
Digital Fuzzy Control A Robust Alternative Suitable for Space ApplicationCheynet, P. / Velazco, R. / Rezgui, S. et al. | 1998
- 2941
-
Session I: Single Event Effects in Integrated Circuits - Digital Fuzzy Control: A Robust Alternative Suitable for Space ApplicationCheynet, Ph et al. | 1998
- 2948
-
Probability Model for Peak Fluxes of Solar Proton EventsXapsos, M. A. / Summers, G. P. / Burke, E. A. et al. | 1998
- 2948
-
Session J: Radiation Environments - Probability Model for Peak Fluxes of Solar Proton EventsXapsos, M.A. et al. | 1998
- 2954
-
Session J: Radiation Environments - SEE Relative Probability Maps for Space OperationsMullen, E.G. et al. | 1998
- 2954
-
SEE Relative Probability Maps for Space OperationsMullen, E. G. / Ginet, G. / Gussenhoven, M. S. et al. | 1998
- 2964
-
The GEO Total Ionizing DoseSolin, J. R. et al. | 1998
- 2964
-
Session J: Radiation Environments - The GEO Total Ionizing DoseSolin, J.R. et al. | 1998
- 2972
-
A New Model for the Low Altitude Trapped Proton EnvironmentHuston, S. L. / Pfitzer, K. A. et al. | 1998
- 2972
-
Session J: Radiation Environments - A New Model for the Low Altitude Trapped Proton EnvironmentHuston, S.L. et al. | 1998
- 2978
-
Conference Author Index| 1998
- 2988
-
Foreword| 1998
- 2988
-
SELECTED PAPERS FROM THE 1997 MEDICAL IMAGING CONFERENCE - Albuquerque, New Mexico, November 13-15, 1997 Foreword| 1998
- 2989
-
Announcement: 1999 Nuclear Science Symposium and Medical Imaging Conference| 1998
- 2990
-
Committee Lists| 1998
- 2993
-
INSTRUMENTATION DETECTORS - First Results with High-Resolution PET Detector Modules Using Wavelength-Shifting FibersWorstell, W. et al. | 1998
- 2993
-
First Results with High-Resolution PET Detector Modules Using Wavelength-Shifting FibersWorstell, W. / Johnson, O. / Kudrolli, H. et al. | 1998
- 3000
-
INSTRUMENTATION DETECTORS - Performance Results of a New DOI Detector Block for a High Resolution PET-LSO Research Tomograph HRRTSchmand, M. et al. | 1998
- 3000
-
Performance Results of a New DOI Detector Block for a High Resolution PET-LSO Research Tomograph HRRTSchmand, M. / Eriksson, L. / Casey, M. E. et al. | 1998
- 3007
-
MRI, CT, ULTRASOUND - Kinetic Parameter Estimation from Attenuated SPECT Projection MeasurementsReutter, B.W. et al. | 1998
- 3007
-
Kinetic Parameter Estimation from Attenuated SPECT Projection MeasurementsReutter, B. W. / Gullberg, G. T. / Huesman, R. H. et al. | 1998
- 3014
-
IMAGE RECONSTRUCTION II - Properties of Minimum Cross-Entropy Reconstruction of Emission Tomography with Anatomically Based PriorSom, S. et al. | 1998
- 3014
-
Properties of Minimum Cross-Entropy Reconstruction of Emission Tomography with Anatomically Based PriorSom, S. / Hutton, B. F. / Braun, M. et al. | 1998
- 3022
-
POSTER SESSIONS - Kalman Sinogram Restoration for Fast and Accurate PET Image ReconstructionKao, C.-M. et al. | 1998
- 3022
-
Kalman Sinogram Restoration for Fast and Accurate PET Image ReconstructionKao, C.-M. / Wernick, M. N. / Chen, C.-T. et al. | 1998
- 3030
-
POSTER SESSIONS - Segmented LSO Crystals for Depth-of-Interaction Encoding in PETMoisan, C. et al. | 1998
- 3030
-
Segmented LSO Crystals for Depth-of-Interaction Encoding in PETMoisan, C. / Andreaco, M. S. / Rogers, J. G. et al. | 1998
- 3036
-
POSTER SESSIONS - Limited Sinogram Completion for Transmission SPECT ImagingRiddell, C. et al. | 1998
- 3036
-
Limited Sinogram Completion for Transmission SPECT ImagingRiddell, C. / Barker, W. C. / Bacharach, S. L. et al. | 1998
- 3045
-
POSTER SESSIONS - Bayesian SPECT Lung Imaging for Visualization and Quantification of Pulmonary PerfusionScarfone, C. et al. | 1998
- 3045
-
Bayesian SPECT Lung Imaging for Visualization and Quantification of Pulmonary PerfusionScarfone, C. / Jaszczak, R. J. / Gilland, D. R. et al. | 1998
- 3053
-
POSTER SESSIONS - Design Features and Performance of a CsI(Na) Array Based Gamma Camera for Small Animal Gene ResearchWeisenberger, A.G. et al. | 1998
- 3053
-
Design Features and Performance of a CsI(Na) Array Based Gamma Camera for Small Animal Gene ResearchWeisenberger, A. G. / Kross, B. / Majewski, S. et al. | 1998
- 3059
-
POSTER SESSIONS - High Resolution X-ray Imaging Using a Silicon Strip DetectorBeuville, E. et al. | 1998
- 3059
-
High Resolution X-ray Imaging Using a Silicon Strip DetectorBeuville, E. / Cahn, R. / Cederstroem, B. et al. | 1998
- 3064
-
Coherent Scatter Implementation for SimSETKaplan, M. S. / Harrison, R. L. / Vannoy, S. D. et al. | 1998
- 3064
-
POSTER SESSIONS - Coherent Scatter Implementation for SimSETKaplan, M.S. et al. | 1998
- 3069
-
POSTER SESSIONS - Computer-Aided Diagnostic System for Diffuse Liver Diseases with Ultrasonography by Neural NetworksOgawa, K. et al. | 1998
- 3069
-
Computer-Aided Diagnostic System for Diffuse Liver Diseases with Ultrasonography by Neural NetworksOgawa, K. / Fukushima, M. / Kubota, K. et al. | 1998
- 3075
-
Pulmonary Organs Analysis for Differential Diagnosis Based on Thoracic Thin-Section CT ImagesTozaki, T. / Kawata, Y. / Niki, N. et al. | 1998
- 3075
-
POSTER SESSIONS - Pulmonary Organs Analysis for Differential Diagnosis Based on Thoracic Thin-Section CT ImagesTozaki, T. et al. | 1998
- 3083
-
A Coronary Calcification Diagnosis System Based on Helical CT ImagesUkai, Y. / Niki, N. / Satoh, H. et al. | 1998
- 3083
-
POSTER SESSIONS - A Coronary Calcification Diagnosis System Based on Helical CT ImagesUkai, Y. et al. | 1998
- 3089
-
A Bayesian Approach for Edge Detection in Medical Ultrasound ImagesKao, C.-M. / Pan, X. / Hiller, E. et al. | 1998
- 3089
-
POSTER SESSIONS - A Bayesian Approach for Edge Detection in Medical Ultrasound ImagesKao, C.-M. et al. | 1998
- 3097
-
Using Local Median as the Location of the Prior Distribution in Iterative Emission Tomography Image ReconstructionAlenius, S. / Ruotsalainen, U. / Astola, J. et al. | 1998
- 3097
-
POSTER SESSIONS - Using Local Median as the Location of the Prior Distribution in Iterative Emission Tomography Image ReconstructionAlenius, S. et al. | 1998
- 3105
-
YAP-PET: First Results of a Small Animal Positron Emission Tomograph Based on YAP:Ce Finger CrystalsDel Guerra, A. / Di Domenico, G. / Scandola, M. et al. | 1998
- 3105
-
POSTER SESSIONS - YAP-PET: First Results of a Small Animal Positron Emission Tomograph Based on YAP:Ce Finger CrystalsGuerra, A.Del et al. | 1998
- 3109
-
POSTER SESSIONS - Quantitative 131I SPECT with Triple Energy Window Compton Scatter CorrectionDewaraja, Y. et al. | 1998
- 3109
-
Quantitative ^1^3^1I SPECT with Triple Energy Window Compton Scatter CorrectionDewaraja, Y. / Li, J. / Koral, K. et al. | 1998
- 3115
-
POSTER SESSIONS - Attenuation Effects in Gamma-Camera Coincidence ImagingLaymon, C.M. et al. | 1998
- 3115
-
Attenuation Effects in Gamma-Camera Coincidence ImagingLaymon, C. M. / Turkington, T. G. / Coleman, R. E. et al. | 1998
- 3122
-
POSTER SESSIONS - Ultra High Resolution Pinhole SPECT for Small Animal StudyOgawa, K. et al. | 1998
- 3122
-
Ultra High Resolution Pinhole SPECT for Small Animal StudyOgawa, K. / Kawade, T. / Nakamura, K. et al. | 1998
- 3127
-
Dedicated Gamma Camera for Single Photon Emission Mammography (SPEM)Pani, R. / Vincentis, G. D. E. / Scopinaro, F. et al. | 1998
- 3127
-
POSTER SESSIONS - Dedicated Gamma Camera for Single Photon Emission Mammography (SPEM)Pani, R. et al. | 1998
- 3134
-
Attenuation Correction in PET Using Consistency InformationWelch, A. / Campbell, C. / Clackdoyle, R. et al. | 1998
- 3134
-
POSTER SESSIONS - Attenuation Correction in PET Using Consistency InformationWelch, A. et al. | 1998
- 3142
-
Effects of Non-Optimal Acquisiton Geometry in Myocardial Perfusion Imaging Using EctomographyPersson, M. / Dale, S. et al. | 1998
- 3142
-
POSTER SESSIONS - Effects of Non-Optimal Acquisition Geometry in Myocardial Perfusion Imaging Using EctomographyPersson, M. et al. | 1998
- 3149
-
Author index| 1998
- 3153
-
Electric Currents Through Ion Tracks in Silicon DevicesEdmonds, L. D. et al. | 1998
- 3153
-
REGULAR PAPERS - Electric Currents Through Ion Tracks in Silicon DevicesEdmonds, L.D. et al. | 1998
- 3165
-
REGULAR PAPERS - An Information Theory-Based Approach for Quantitative Evaluation of User Interface ComplexityKang, I.H.G. et al. | 1998
- 3165
-
An Information Theory-Based Approach for Quantitative Evaluation of User Interface ComplexityKang, H. G. / Seong, P. H. et al. | 1998
- 3175
-
Threshold Voltage Stabilization in Radiation EnvironmentsKerns, D. V. / Barnaby, H. J. / Kerns, S. E. et al. | 1998
- 3175
-
REGULAR PAPERS - Threshold Voltage Stabilization in Radiation EnvironmentsKerns Jr, D.V. et al. | 1998
- 3179
-
ROTOR: The VLSI Switched Current Amplifier for High-Rate High-Resolution Spectroscopy with Asynchronous Event OccurrencePullia, A. / Fiorini, C. / Gatti, E. et al. | 1998
- 3179
-
REGULAR PAPERS - ROTOR: The VLSI Switched Current Amplifier for High-Rate High-Resolution Spectroscopy with Asynchronous Event OccurrencePullia, A. et al. | 1998
- 3184
-
REGULAR PAPERS - Application of Fault Detection and Identification (FDI) Techniques in Power Regulating Systems of Nuclear ReactorsRoy, K. et al. | 1998
- 3184
-
Application of Fault Detection and Identification (FDI) Techniques in Power Regulating Systems of Nuclear ReactorsRoy, K. / Banavar, R. N. / Thangasamy, S. et al. | 1998
- 3202
-
Analytical Calculation of Photon Distributions in SPECT ProjectionsWells, R. G. / Celler, A. / Harrop, R. et al. | 1998
- 3202
-
REGULAR PAPERS - Analytical Calculation of Photon Distributions in SPECT ProjectionsWells, R.G. et al. | 1998
- 3214
-
1998 INDEX| 1998
- c1
-
[Front Cover]| 1998
- c2
-
IEEE Transactions on Nuclear Science information for authors| 1998
- c3
-
Information for Authors| 1998
- c4
-
Affiliate plan of the IEEE Nuclear and Plasma Sciences Society| 1998