Quality and Reliability Engineering International
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
Inhaltsverzeichnis
- 1085
-
Is designed data collection still relevant in the big data era?Anderson‐Cook, Christine M. / Lu, Lu et al. | 2023
- 1102
-
Review: Is design data collection still relevant in the big data era? With extensions to machine learningFreeman, Laura et al. | 2023
- 1107
-
Is designed data collection still relevant in the big data era? – A discussionStevens, Nathaniel T. et al. | 2023
- 1110
-
Discussion of ‘Is designed data collection still relevant in the Big Data era?'King, Caleb / Jones, Bradley et al. | 2023
- 1117
-
Rejoinder for “Is Designed Data Collection Still Relevant in the Big Data Era?”Anderson‐Cook, Christine M. / Lu, Lu et al. | 2023
- 1120
-
Multivariate auto‐correlated process control by a residual‐based mixed CUSUM‐EWMA modelWang, Kung‐Jeng / Asrini, Luh Juni et al. | 2023
- 1143
-
On the robustness of central composite designs when missing two observationsAlanazi, Kareem / Georgiou, Stelios D. / Stylianou, Stella et al. | 2023
- 1172
-
A bivariate CUSUM control chart based on exceedance statisticsErem, Aysegul / Mahmood, Tahir et al. | 2023
- 1192
-
Robust inference for nondestructive one‐shot device testing under step‐stress model with exponential lifetimesBalakrishnan, Narayanaswamy / Castilla, Elena / Jaenada, María et al. | 2023
- 1223
-
Three‐stage feature selection approach for deep learning‐based RUL prediction methodsWang, Youdao / Zhao, Yifan et al. | 2023
- 1248
-
Reliability analysis of mechanisms with mixed uncertainties using polynomial chaos expansionFang, Yi‐Chuan / Wang, Yong‐Juan / Sha, Jin‐Long et al. | 2023
- 1269
-
A critique of the use of modified and moving average‐based EWMA control chartsHaq, Abdul / Woodall, William H. et al. | 2023
- 1277
-
An adaptive EWMA control chart based on Hampel function to monitor the process location parameterZaman, Babar / Mahfooz, Syed Zeeshan / Mehmood, Rashid et al. | 2023
- 1299
-
E‐Bayesian estimation for the parameters and hazard function of Gompertz distribution based on progressively type‐II right censoring with applicationMohie El‐Din, Marwa M. / Sharawy, Ali / Abu‐Moussa, Mahmoud H. et al. | 2023
- 1318
-
Optimal design of reliability acceptance sampling plan based on constant‐stress accelerated life testing considering the uncertainty of accelerated factorLou, Yifan / Zheng, Huiling / Yang, Jun et al. | 2023
- 1334
-
Remaining useful life evaluation for accelerated Wiener degradation process model with mixed random effects and measurement errorsDuan, Fengjun / Wang, Guanjun / Wei, Wanmeng et al. | 2023
- 1352
-
Estimation of stress‐strength reliability for beta log Weibull distribution using progressive first failure censored samplesShi, Xiaolin / Shi, Yimin et al. | 2023
- 1376
-
Reliability analysis based on the Wiener process integrated with historical degradation dataKang, Wenda / Tian, Yubin / Xu, Houbao et al. | 2023
- 1396
-
An improved adaptive EWMA control chart for monitoring time between events with application in health sectorAslam, Muhammad / Khan, Majid / Rasheed, Zahid et al. | 2023
- 1413
-
A bibliography of the literature on process capability indices (PCIs): 2010–2021, Part I: Books, review/overview papers, and univariate PCI‐related papersYum, Bong‐Jin et al. | 2023
- 1439
-
A bibliography of the literature on process capability indices (PCIs): 2010–2021, Part II: Multivariate PCI‐ and functional PCI‐related papers, special applications, software packages, and omitted papersYum, Bong‐Jin et al. | 2023
- 1465
-
A review of ranked set sampling and modified methods in designing control chartsMohammadkhani, Atieh / Amiri, Amirhossein / Khoo, Michael B. C. et al. | 2023
- 1494
-
Reliability modeling of competing failure processes with multi‐stage degradationLi, Long / Yu, Tianxiang / Shang, Bolin et al. | 2023
- 1518
-
A cumulative exposure model for remaining useful life prediction of pitot tube based on dynamic operating dataWang, Bowen / Sun, Jianzhong / Chen, Dan et al. | 2023
- 1532
-
CORRIGENDUM| 2023
-
Issue Information| 2023