Superlattices and microstructures : a journal devoted to the science and technology of synthetic microstructures, microdevices, surfaces and interfaces
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
Inhaltsverzeichnis
- 143
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PrefacePiqueras, Javier / Cremades, Ana / Fernández, Paloma et al. | 2008
- 144
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BIAMS 08 COMMITTEES| 2009
- 145
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Structural and cathodoluminescence assessment of transition metal oxide nanostructures grown by thermal deposition methodsDíaz-Guerra, C. / Chioncel, M.F. / Piqueras, J. et al. | 2008
- 151
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Correlating composition and luminescence in AlInGaN epilayersEdwards, P.R. / Martin, R.W. / Bejtka, K. et al. | 2008
- 156
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Cathodoluminescence study of isoelectronic doping of gallium oxide nanowiresNogales, E. / Sánchez, B. / Méndez, B. et al. | 2008
- 161
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Evaluation of diffusion-recombination parameters in electrodeposited CuIn(S, Se)2 solar cells by means of electron beam induced current experiments and modellingSieber, B. / Ruiz, C.M. / Bermudez, V. et al. | 2008
- 168
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Synchrotron-based investigation of iron precipitation in multicrystalline siliconSeifert, W. / Vyvenko, O. / Arguirov, T. et al. | 2008
- 177
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Combined MEIS/TEM study of structural defects in Si implanted with a high dose of 100 keV Si ionsSobolev, N.A. / Sakharov, V.I. / Serenkov, I.T. et al. | 2008
- 182
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Defect induced non-ideal dark Formula Not Shown – Formula Not Shown characteristics of solar cellsBreitenstein, O. / Bauer, J. / Lotnyk, A. et al. | 2009
- 182
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Defect induced non-ideal dark – characteristics of solar cellsBreitenstein, O. / Bauer, J. / Lotnyk, A. et al. | 2008
- 182
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Defect induced non-ideal dark – characteristics of solar cellsBreitenstein, O. et al. | 2009
- 190
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Capacitance Transient X-ray Absorption Spectroscopy of semiconducting structuresBazlov, N. / Vyvenko, O. / Bondarenko, A. et al. | 2009
- 200
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Injection of charge nanostructures into insulatorsFitting, H.-J. / Cornet, N. / Touzin, M. et al. | 2008
- 206
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Nanoscale depth-resolved cathodoluminescence spectroscopy of ZnO surfaces and metal interfacesBrillson, L.J. / Mosbacker, H.L. / Doutt, D.L. et al. | 2008
- 214
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Spectral image cathodoluminescence, photoluminescence and Raman study of GaAs layers grown on Si substratesMartínez, O. / Angulo, H. / Avella, M. et al. | 2008
- 222
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Exciton related photoluminescence stimulation in SiC nanocrystalsTorchynska, T. / Polupan, G. et al. | 2008
- 228
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Sub-bandgap photoluminescence from as-grown and annealed layers of CdTeSochinskii, N.V. / Abellán, M. / Rodríguez-Fernández, J. et al. | 2009
- 234
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Surface passivation by silicon nitride in Laser Grooved Buried Contact (LGBC) silicon solar cellsClaudio, G. / Bass, K. / Heasman, K. et al. | 2008
- 240
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Scanning photoluminescent spectroscopy of bioconjugated quantum dotsChornokur, G. / Ostapenko, S. / Oleynik, E. et al. | 2008
- 249
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Scanning electron and laser beams induced current (SELBIC) method for observing failures in GaAs high electron mobility transistorsSueyoshi, Haruki / Takasu, Shin-ichi / Choi, Woon et al. | 2008
- 256
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Pulsed photo-conductivity and carrier recombination lifetime spectroscopy of metal doped germaniumGaubas, E. / Uleckas, A. / Vanhellemont, J. et al. | 2008
- 267
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Emission of Si nanoclusters of different phases in amorphous hydrogenated siliconTorchynska, T.V. et al. | 2008
- 271
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Synthesis and optical spectroscopy of ZnO nanowiresGüell, F. / Ossó, J.O. / Goñi, A.R. et al. | 2008
- 277
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Compositional analysis and evolution of defects formed on GaInP epilayers grown on GermaniumGaliana, Beatriz / Barrigón, Enrique / Rey-Stolle, Ignacio et al. | 2009
- 285
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Mapping strains at the nanoscale using electron back scatter diffractionWilkinson, Angus J. / Meaden, Graham / Dingley, David J. et al. | 2008
- 295
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Electrical activities of stacking faults and partial dislocations in 4H-SiC homoepitaxial filmsChen, Bin / Chen, Jun / Sekiguchi, Takashi et al. | 2008
- 301
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Nonradiative recombination dynamics in InGaN/GaN LED defect systemChernyakov, A.E. / Sobolev, M.M. / Ratnikov, V.V. et al. | 2008
- 308
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EBIC and CL studies of ELOG GaN filmsYakimov, E.B. / Vergeles, P.S. / Govorkov, A.V. et al. | 2008
- 314
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EBIC/PL investigations of dislocation network produced by silicon wafer direct bondingJia, G. / Seifert, W. / Mchedlidze, T. et al. | 2009
- 321
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Hydrogen desorption effect on cathodoluminescence of ZnODierre, B. / Yuan, X.L. / Ishigaki, T. et al. | 2008
- 326
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Micro-scale modification of diamond-like carbon and copper electroplating by scanning probe field emission current methodHayashi, Shigehiro / Antoku, Yuki / Han, Younggun et al. | 2009
- 332
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Surface monitoring of HEMT structuresBaranov, E.I. / Ber, B.Y. / Vasil’ev, A.P. et al. | 2008
- 337
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Properties of orientation-patterned GaAs crystals studied by cathodoluminescence spectroscopyMartínez, O. / Avella, M. / Angulo, H. et al. | 2008
- 343
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Formation of Ge nanocrystals and evolution of the oxide matrix in as-deposited and annealed LPCVD SiGeO filmsRodríguez, A. / Morana, B. / Sangrador, J. et al. | 2008
- 349
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Exciton capture and thermal escape in InAs dot-in-a-well laser structuresTorchynska, T.V. et al. | 2008
- 356
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Monte Carlo simulation of low energy electron injection and scattering in insulating layersFitting, H.-J. / Schreiber, E. / Zvonarev, S. et al. | 2008
- 362
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Ion implantation and cluster formation in silicaSalh, Roushdey / Fitting Kourkoutis, L. / Zamoryanskaya, M.V. et al. | 2008
- 369
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Study of ion diffusion in superionic crystals by EPMA and local CLKolesnikova, Ekaterina V. / Akopyan, Irina Kh. / Domracheva, Yana V. et al. | 2009
- 376
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GaAs quantum well structures investigation by local cathodoluminescenceShakhmin, A.A. / Zamoryanskaya, M.V. / Arsentyev, I.N. et al. | 2009
- 383
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Comparison between cathodoluminescence spectroscopy and capacitance transient spectroscopy on Al+ ion implanted 4H-SiC p+/n diodesFabbri, F. / Natalini, D. / Cavallini, A. et al. | 2008
- 388
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Yttrium silicide films into Si(111) — Fabrication and propertiesAyache, R. / Bouabellou, A. / Eichhorn, F. et al. | 2008
- 393
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Determination of diffusion length in photovoltaic crystalline silicon by modelisation of light beam induced currentSayad, Y. / Kaminski, A. / Blanc, D. et al. | 2008
- 402
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Effect of electron irradiation on defect structure of 6H–SiC grown by PVT methodKozubal, M. / Kamiński, P. / Kozłowski, R. et al. | 2008
- 407
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Cathodoluminescence mapping and spectroscopy of Te-doped grown by the vertical Bridgman method under an alternating magnetic fieldDíaz-Guerra, C. et al. | 2009
- 407
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Cathodoluminescence mapping and spectroscopy of Te-doped grown by the vertical Bridgman method under an alternating magnetic fieldDíaz-Guerra, C. / Mitric, A. / Piqueras, J. et al. | 2008
- 407
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Cathodoluminescence mapping and spectroscopy of Te-doped Formula Not Shown grown by the vertical Bridgman method under an alternating magnetic fieldDí / az-Guerra, C. / Mitric, A. et al. | 2009
- 413
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Effects of Ga doping on optical and structural properties of ZnO epilayersBuyanova, I.A. / Wang, X.J. / Wang, W.M. et al. | 2008
- 421
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CL study of yellow emission in ZnO nanostructures annealed in Ar and O2 atmospheresGonzález, A. / Herrera-Zaldívar, M. / Valenzuela, J. et al. | 2008
- 429
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Study of microstructured indium oxide by cathodoluminescence and XPS microscopyMagdas, D.A. / Maestre, D. / Cremades, A. et al. | 2008
- 435
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Electrical properties of pinholes in GaN:Mn epitaxial films characterized by conductive AFMHerrera, M. / Cremades, A. / Stutzmann, M. et al. | 2008
- 444
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Monte Carlo simulation of the EBIC collection efficiency of a Schottky nanocontactLedra, M. / Tabet, N. et al. | 2008
- 451
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Evaluation of the composition of the interlayer at the inverted interface in InGaP/GaAs heterojunctionsFrigeri, C. / Attolini, G. / Bosi, M. et al. | 2008
- 458
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The influence of roughness on the mechanical spectroscopy of SiO2 nanorods grown by e-beam irradiationBetancourt, Jesuan / Zypman, Fredy / Solá, Francisco et al. | 2009
- 469
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Recombination at the interface between a metallic precipitate and a semiconductor matrix: Application to the electron-beam-induced-current contrastDebez, M. / Tarento, R.-J. / Mekki, D.E. et al. | 2009
- 475
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AFM and TEM study of hydrogenated sputtered Si/Ge multilayersFrigeri, C. / Nasi, L. / Serényi, M. et al. | 2008
- 482
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Infrared photoluminescence and Raman spectra in the Y2O3–ZrO2 systemTorres, D.I. / Llopis, J. et al. | 2008